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作者机构:Department of Electrical and Computer Engineering Texas A&M University College Station Texas 77843-2128 USA Department of Technical Informatics University of Szeged Árpád tér 2 Szeged H-6701 Hungary Department of Engineering Sciences The Ångström Laboratory Uppsala University P.O. Box 534 SE-75121 Uppsala Sweden
出 版 物:《International Journal of Modern Physics: Conference Series》
年 卷 期:2014年第ijmpcs卷第33期
主 题:Information theoretic security secure key distribution via wire KLJN bit errors
摘 要:We classify and analyze bit errors in the voltage and current measurement modes of the Kirchhoff-law–Johnson-noise (KLJN) secure key distribution system. In both measurement modes, the error probability decays exponentially with increasing duration of the bit sharing period (BSP) at fixed bandwidth. We also present an error mitigation strategy based on the combination of voltage-based and current-based schemes. The combination method has superior fidelity, with drastically reduced error probability compared to the former schemes, and it also shows an exponential dependence on the duration of the BSP.