Automatic test system development for digital beam position monitor of HEPS and BEPCII

作     者：Xuhui Tang Yaoyao Du Jianshe Cao Shujun Wei Zhi Liu Qiang Ye Huizhou Ma Jing Yang Guodong Gao Yukun Li Yanfeng Sui Junhui Yue 

作者机构：University of Chinese Academy of ScienceBeijing 100049China Institute of High Energy PhysicsChinese Academy of ScienceBeijing 100049China 

出 版 物：《Radiation Detection Technology and Methods》 (辐射探测技术与方法（英文）)

年 卷 期：2022年第6卷第3期

页      面：330-338页

核心收录：

学科分类：07[理学] 070202[理学-粒子物理与原子核物理] 0702[理学-物理学] 

基　　金：funded by the Foundation ofYouth Innovation Promotion Association,CAS(No.Y202005) the Major achievements cultivation project of major scientific and technological infrastructure,CAS(No.NE01G74Y2) the National Natural Science Foundation of China(No.11805221) 

主　　题：Automatic test system Digital beam position monitor processor Program control Experimental physics and industrial control system Analog-to-digital converter 

摘      要：Purpose Hundreds of digital beam position monitor processors(DBPM)are required to be produced during the construction of projects such as High Energy Photon Source(HEPS)and the upgrade project of the Beijing Electron Positron Collider(BEPCII),which brings great challenges to the test *** order to achieve accurate,fast,and complete mass production tests of DBPMs,an automatic test system(ATS)has been developed in this *** According to the test items of DBPM,the standardized testing softwareflow is designed based on virtual instru-ment program control technology and experimental physics and industrial control system(EPICS),which realize automatic adjustment of test parameters and automatic acquisition of test result *** and conclusions The ATS can realize one-button testing of channel coefficients,channel linearity,attenuator linearity,beam current dependence(BCD)and sampling signal-to-noise ratio(SNR),and generate test *** total test time is less than 3 minutes,which is significantly more efficient compared to manual *** than 90 BEPCII DBPMs has been tested by this ATS in the *** test results proved that such a system could automatically recognize defective products and satisfy the requirements of mass testing.