Sparse representation and modified density peak clustering-based state identification for multimode processes

作     者：Wang, Zhaojing Chen, Bin Zheng, Ying Wang, Yang Yan, Xiaoyun 

作者机构：Wuhan Text Univ Hubei Prov Engn Res Ctr Intelligent Text & Fash Sch Comp Sci & Artificial Intelligence Wuhan 430200 Peoples R China Huazhong Univ Sci & Technol Sch Artificial Intelligence & Automat Key Lab Image Proc & Intelligent Control Minist Educ Wuhan 430074 Peoples R China 

出 版 物：《MEASUREMENT SCIENCE AND TECHNOLOGY》 (测量科学与技术)

年 卷 期：2023年第34卷第2期

页      面：025016-025016页

核心收录：

学科分类：08[工学] 080401[工学-精密仪器及机械] 0804[工学-仪器科学与技术] 081102[工学-检测技术与自动化装置] 0811[工学-控制科学与工程] 

基　　金：National Natural Science Foundation of China [62203337, 61873102] Open Fund of Key Laboratory of Image Processing and Intelligent Control (Huazhong University of Science and Technology), Ministry of Education 

主　　题：multimode process state identification modified density peak clustering sparse representation 

摘      要：Industrial processes with high-dimensional data are generally operated with mixed normal/faulty states in different modes, making it difficult to automatically and accurately identify the faults. In this paper, a state identification framework is proposed for multimode processes. First, a key variable selection approach is presented based on sparse representation to eliminate redundant variables. Then, modified density peak clustering is proposed to identify different states, in which a distance measurement with a time factor is constructed to select all the possible cluster centers. Then, the sum of squared errors-based approach is developed to determine the optimal cluster centers automatically. Further, considering that the mode attributes may be mixed with the fault attributes, a two-step coarse-to-fine identification strategy is designed to precisely identify the modes and the faults in each mode. Finally, three cases including a numerical simulation, Tennessee Eastman benchmark process and an actual semiconductor manufacturing process are presented to show the feasibility of the proposed method.