Application of light diffraction theory to qualify the downstream light field modulation property of mitigated KDP crystals

作     者：Yang, Hao Cheng, Jian Liu, Zhichao Liu, Qi Zhao, Linjie Tan, Chao Wang, Jian Chen, Mingjun 

作者机构：State Key Laboratory of Robotics and System Harbin Institute of Technology Harbin150001 China Research Center of Laser Fusion China Academy of Engineering Physics Mianyang621900 China 

出 版 物：《arXiv》 (arXiv)

年 卷 期：2020年

核心收录：

主　　题：Diffraction 

摘      要：Micro-milling can effectively remove laser damage sites on a KDP (potassium dihydrogen phosphate) surface and then improve the laser damage resistance of the components. However, the repaired KDP surface could cause light propagating turbulence and downstream light intensification with the potential risk to damage downstream optics. In order to analyze the downstream light field modulation caused by Gaussian mitigation pits on KDP crystals, a computational model of the downstream light diffraction based on the angular spectrum theory and the Gaussian repair contour is established. The results show that the phase offset caused by the repaired surface produces a large light field modulation near the rear KDP surface. The modulation generated in the whole downstream light field is greater than that caused by the amplitude change. Therefore, the phase characteristics of the outgoing light could be suggested as a vital research topic for future research on the downstream light field modulation caused by mitigation contours. Significantly, the experimental results on the downstream light intensity distribution have good agreement with the simulation ones, which proves the validity of the established downstream light diffraction model. The phase characterization of the outgoing light is proposed as an evaluation tool in the repair of KDP crystals. The developed analytical method and numerical discrete algorithm could be also applicable in qualifying the repair quality of other optical components applied in high-power laser systems. Copyright © 2020, The Authors. All rights reserved.