A Combination System of a Thin Atomic Force Microscope and an Upright Raman Microscope for Position-Controllable Surface-Enhanced Raman Scattering

作     者：Lu, Nianhang Wang, Yilin Xiao, Shasha Zhang, Rui Xue, Tao Hu, Xiaodong Wu, Sen 

作者机构：State Key Lab of Precision Measurement Technology and Instruments Tianjin University Tianjin 300072 China Analysis and Testing Centre Tianjin University Tianjin 300072 China 

出 版 物：《Microscopy and Microanalysis》 (Microsc. Microanal.)

年 卷 期：2023年第29卷第1期

页      面：180-188页

学科分类：07[理学] 08[工学] 0804[工学-仪器科学与技术] 0703[理学-化学] 

基　　金：National Natural Science Foundation of China  NSFC  (61973233) 

主　　题：AFM AFM-Raman nano-manipulation pattern assembly SERS 

摘      要：In this study, we propose a novel atomic force microscope (AFM) combined with a Raman microscope for fabricating position-controllable surface-enhanced Raman scattering substrates. The head of the AFM is designed with an effective thickness of 7.3 mm and reserved an open space above the cantilever probe for the objective with high NA. Benefitti from the thin head, the homemade AFM can be easily integrated with the upright Raman microscope. The Raman microscope and AFM share the same XY piezo scanner and allow to a complimentary mapping of Raman mapping images. The new combination system is equipped with automated nano-manipulation functions which help to precisely assemble one-dimensional (1D) materials such as noble metal nanowires into the desired patterns. The experimental results demonstrate that our developed AFM-Raman system can be applied to fabricating and investigating position-controllable SERS substrates. The optical geometry of this new system also shows potential in other combinational applications. © 2023 The Author(s).