版权所有:内蒙古大学图书馆 技术提供:维普资讯• 智图
内蒙古自治区呼和浩特市赛罕区大学西街235号 邮编: 010021
作者机构:Department of Civil Engineering and Architecture University of Pavia via Ferrata 3 Pavia27100 Italy Department of Electrical Computer and Biomedical Engineering University of Pavia via Ferrata 5 Pavia27100 Italy Department of Mechanics Mathematics and Management Polytechnic University of Bari Via Re David 200 Bari70125 Italy Institute of Engineering Mechanics and Structural Analysis Bundeswehr University Munich Werner-Heisenberg-Weg 39 Neubiberg85577 Germany
出 版 物:《SSRN》
年 卷 期:2024年
核心收录:
摘 要:We propose an isogeometric approach to model the deformation of active thin films using layered, nonlinear, Kirchhoff-Love shells. Isogeometric Collocation and Galerkin formulations are employed to discretize the electrophysiological and mechanical sub-problems, respectively, with the possibility to adopt differ- ent element and time-step sizes. Numerical tests illustrate the capabilities of the active-stress-based approach to effectively simulate the contraction of thin films in both quasi-static and dynamic conditions. © 2024, The Authors. All rights reserved.