Fidelity decay and error accumulation in random quantum circuits

作     者：de Buruaga, Nadir Samos Sáenz Bistron, Rafal Rudziński, Marcin Pereira, Rodrigo M.C. Życzkowski, Karol Ribeiro, Pedro 

作者机构：CeFEMA LaPMET Instituto Superior Técnico Universidade de Lisboa Av. Rovisco Pais Lisboa1049-001 Portugal Faculty of Physics Astronomy and Applied Computer Science Jagiellonian University ul. Lojasiewicza 11 Kraków30-348 Poland Doctoral School of Exact and Natural Sciences Jagiellonian University ul. Lojasiewicza 11 Kraków30-348 Poland Center for Theoretical Physics Polish Academy of Sciences Al. Lotników 32/46 Warszawa02-668 Poland 

出 版 物：《arXiv》 (arXiv)

年 卷 期：2024年

核心收录：

主　　题：Qubits 

摘      要：Fidelity decay captures the inevitable state degradation in any practical implementation of a quantum process. We devise bounds for the decay of fidelity for a generic evolution given by a random quantum circuit model that encompasses errors arising from the implementation of two-qubit gates and qubit permutations. We show that fidelity decays exponentially with both circuit depth and the number of qubits raised to an architecture-dependent power and we determine the decay rates as a function of the amplitude of the aforementioned errors. Furthermore, we demonstrate the utility of our results in benchmarking quantum processors using the quantum volume figure of merit and provide insights into strategies for improving processor performance. These findings pave the way for understanding how states evolving under generic quantum dynamics degrade due to the accumulation of different kinds of perturbations. Copyright © 2024, The Authors. All rights reserved.