咨询与建议

看过本文的还看了

相关文献

该作者的其他文献

文献详情 >Correction to "Automatic Age E... 收藏

Correction to "Automatic Age Estimation Based on Facial Aging Patterns"

作     者:Xin Geng Zhi-Hua Zhou Kate Smith-Miles 

作者机构:School of Engineering and Information Technology Deakin University VIC Australia National Key Lab for Novel Software Technology Nanjing University Nanjing China 

出 版 物:《IEEE Transactions on Pattern Analysis and Machine Intelligence》 

年 卷 期:2008年第30卷第2期

页      面:368-368页

学科分类:0808[工学-电气工程] 08[工学] 

主  题:Aging Databases Senior members Pattern analysis Machine intelligence Information technology 

摘      要:Author(s) Xin Geng Zhi-Hua Zhou ; Smith-Miles, K. IEEE TERMS Aging Databases Information technology Machine intelligence Pattern analysis Senior members Referenced Items are not available for this document. No versions found for this document. Standards Dictionary Terms are available to subscribers only. type=text/javascript ***(function() { ***(/3890430/xplore_third_party, [160, 600], div-gpt-ad-1365533275104-0).addService(***()); ***().setTargeting(usertype, anonymous); ***().setTargeting(sub_type, ); ***().setTargeting(cust_type, ); ***().setTargeting(geoip, 14.106.124.232); ***().setTargeting(userid, ); ***().setTargeting(isinst, ); ***().setTargeting(search, ); ***().setTargeting(pu_number, 34); ***().setTargeting(content_ID, Journals & Magazines); ***().collapseEmptyDivs(); ***(); }); type=text/javascript ***(function() { ***(div-gpt-ad-1365533275104-0); }); Personal Sign In Create Account IEEE Account Change Username/Password Update Address Purchase Details Payment Options Order History Access Purchased Documents Profile Information Communications Preferences Profession and Education Technical Interests Need Help? US & Canada: +1 800 678 4333 Worldwide: +1 732 981 0060 Contact & Support About IEEE Xplore Contact Us Help Terms of Use Nondiscrimination Policy Sitemap Privacy & Opting Out of Cookies A not-for-profit organization, IEEE is the worlds largest professional association for the advancement of technology. © Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.

读者评论 与其他读者分享你的观点

用户名:未登录
我的评分