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作者机构:State Key Laboratory of ASIC and System Department of Microelectronics Fudan University Shanghai 200433 China
出 版 物:《Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors》 (Pan Tao Ti Hsueh Pao)
年 卷 期:2005年第26卷第5期
页 面:984-989页
核心收录:
主 题:Capacitors
摘 要:A new model is developed for describing the electrical behavior of ferroelectric capacitors. By modeling the ferroelectric capacitor as a switching capacitor (dipole capacitor) in series with a non-switching capacitor (linear capacitor) and this dipole capacitor as a collection of dipoles with a top electrode and a bottom electrode, and by assuming the probability density functions of dipoles coercive voltages (positive and negative) as t-distribution according to experiment results of ferroelectric capacitors C-V characteristic, the C-V, I-V, and Q-V expressions of ferroelectric capacitors are derived, and these expressions are described with only six parameters. The simulated results from these expressions are quite fitted with experiment results.