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IEEJ Transactions on Electronics, Information and Systems

A Design Study on Integrated Complex Coefficient Filters with Peripheral Circuits for Accurate Frequency Response Measurement

周波数特性を精密測定するための周辺回路を集積化した複素係数フィルタの設計検討

作     者:Shouno, Kazuhiro Sato, Lina Fukagawa, Kanta Tanimoto, Hiroshi Muto, Cosy 庄野 和宏;佐藤 リナ;深川 寛太;谷本 洋;武藤 浩二

作者机构:Division of Information Engineering University of Tsukuba 1-1-1 Tennoudai Ibaraki Tsukuba305-8573 Japan Graduate School of Science and Technology Degree Programs in Systems and Information Engineering Master’s Program in Computer Science University of Tsukuba Japan Kitami Institute of Technology 165 Koen-cho Hokkaido Kitami090-8507 Japan Faculty of Education Nagasaki University 1-14 Bunkyo-machi Nagasaki852-8521 Japan 

出 版 物:《IEEJ Transactions on Electronics, Information and Systems》 (IEEJ Trans. Electron. Inf. Syst.)

年 卷 期:2025年第145卷第1期

页      面:16-24页

核心收录:

主  题:Capacitance 

摘      要:This paper proposes a measurement technique for an integrated complex filter. The proposed method is based on two measurement methods with integrated circuitry for calibration. It is accomplished by applying square waves to an FUT (Filter Under Test) instead of sinusoidal waves or by superposing transfer characteristics obtained by applying a single sinusoidal wave to an FUT. In both of the above methods, the output signal connected to the external measurement equipment via a 50 Ω coaxial cable and so on. In this case, the output signal of the FUT should be amplified by internal or external amplifiers, which degrades the response. However, it is cancelled out by the proposed calibration circuitry with some analog switches. In addition to the above, for the RC polyphase filter, the source resistance and the load capacitance degrade the measurement results and their effect is discussed. The validity of the proposal is confirmed through computer simulation for a third-order RCPF whose passband is 8–40 MHz fabricated by Phenitec 0.6 µm CMOS process. It is shown that the measurement error is −1.10 dB for the square-wave method and −1.00 dB and −0.43 degrees for the superposition method at 40 MHz. © 2025 The Institute of Electrical Engineers of Japan.

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