Enhancing Power Grid Stability: Design and Integration of a Fast Bus Tripping System in Protection Relays

作     者：Ghiasi, Mohammad Wang, Zhanle Mehrandezh, Mehran Alhelou, Hassan Haes Ghadimi, Noradin 

作者机构：University of Regina Faculty of Engineering and Applied Science ReginaSKS4S 0A2 Canada  School of Engineering CambridgeMA United States Monash University Department of Electrical and Computer System Engineering Australia Islamic Azad University Young Researchers and Elite Club Ardabil Branch Ardabil Iran 

出 版 物：《IEEE Transactions on Consumer Electronics》 (IEEE Trans Consum Electron)

年 卷 期：2024年第71卷第1期

页      面：561-570页

核心收录：

学科分类：0808[工学-电气工程] 080802[工学-电力系统及其自动化] 08[工学] 0837[工学-安全科学与工程] 0811[工学-控制科学与工程] 

主　　题：Relay protection 

摘      要：This article introduces a novel method for efficiently and promptly operating protection relays within a power system, with a specific emphasis on adaptive overcurrent (OC) protection in a power grid. The approach utilizes SEL751 and SEL751A relays that communicate through the IEC-61850 GOOSE protocol, establishing connections using intelligent electronic devices (IED) at several locations in the system. The power system, consisting of transformers, bus bars, and feeders, employs protection relays to identify OC faults based on time and current parameters. Relay configurations are tested in a case study at the Omicron Lab involving a 138/25kV substation. The test encompasses various fault scenarios on the low-voltage (LV) and high-voltage (HV) sides, incorporating different current values and fault times, utilizing the chosen time-overcurrent U3 (very inverse) curve. The proposed approach exhibits the ability to promptly remove faults in transformers and substations at both the HV and the LV levels. Furthermore, the experimental results closely match the theoretical calculations, validating the effectiveness of the proposed approach in the protection of AC grids. Additionally, built-in cybersecurity measures in SEL relays ensure secure and reliable operation, mitigating the risks of cyber-related relay failures. © 1975-2011 IEEE.