Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs

作     者：Ayadi, R. M. Masmoudi, M. 

作者机构：Natl Engn Sch Sfax ENIS Elect Microtechnol & Commun Reach Grp Sfax Tunisia 

出 版 物：《JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS》 (电子测试杂志；理论与应用)

年 卷 期：2010年第26卷第1期

页      面：37-45页

核心收录：

学科分类：0808[工学-电气工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

主　　题：Built-in self test (BIST) Low noise amplifiers (LNA) Fault model Fault coverage 

摘      要：Analog and mixed-signal testing is becoming an important issue that affects both the time-to-market and the product cost of many SoCs. In order to provide an efficient testing method for 865-870 MHz low noise amplifiers (LNAs), which constitute a mixed-signal circuit, a novel BIST method is developed. This BIST can be easily implemented with a RF peak detector and two comparators. The circuit used in the test and the LNA are designed using 0.35 mu m CMOS technology. The simulation results show higher fault coverage than that of previous test methods. A total of twenty eight short and open (catastrophic) faults and eleven variation parameters have been introduced into the LNA, giving fault coverage of 100% for catastrophic faults and parametric variation. Thus, it provides an efficient structural test, which is suitable for a production test in terms of an area overhead, a test accessibility, and test time.