Advancements in data processing for echelle spectrometers: a review

作     者：Han, Longfei Yin, Lu Sun, Yanan Chen, Jianjun Xu, Yueshu Zhou, Yangdong Wang, Le 

作者机构：China Jiliang Univ Coll Opt & Elect Technol Hangzhou Peoples R China Qingdao Univ Technol Sch Informat & Control Engn Qingdao Peoples R China Zhejiang Univ Coll Opt Sci & Engn State Key Lab Extreme Photon & Instrumentat Hangzhou Peoples R China ZJU Hangzhou Global Sci & Technol Innovat Ctr State Key Lab Extreme Photon & Instrumentat Hangzhou Peoples R China 

出 版 物：《APPLIED SPECTROSCOPY REVIEWS》 (Appl Spectrosc Rev)

年 卷 期：2025年第60卷第5期

页      面：404-430页

核心收录：

学科分类：070207[理学-光学] 07[理学] 08[工学] 0804[工学-仪器科学与技术] 0703[理学-化学] 0803[工学-光学工程] 0702[理学-物理学] 

基　　金：the Key R&D Plan of Zhejiang Province [2022C01127, 2021C05005] Key R&D Plan of Zhejiang Province [2021YFC3340400] National Key RD Plan [62305320, 51832005, 62075203, 1210042018] National Natural Science Foundation of China [LR19F050001] Preeminence Youth Science Funds of Zhejiang Province [ZR2021QF113, ZR2021MF081] Natural Science Foundation of Shandong Province [2022KJ162] Outstanding Youth Innovation Team in Shandong Higher Education Institutions [2023YFB2805301] National Key Research and Development Program of China [LDT23F05013F05] Basic Public Welfare Research Program of Zhejiang Province Open Research Fund of the State Key Laboratory of Extreme Photonics and Instrumentation Zhejiang University 

主　　题：Echelle spectrometer spectral model optimization data processing techniques 

摘      要：The echelle spectrometer is a sophisticated instrument used for high-resolution spectral analysis, with key applications in ICP, LIBS, and astronomy. Its accuracy in measuring wavelengths largely depends on the data processing methods employed, which have been continuously refined since the instrument s inception. This review provides an overview of the data processing workflow for echelle spectrometers, organized into three main steps: spectral model construction, spectral model optimization, and wavelength extraction. Each step is systematically reviewed, highlighting common methods and principles, along with their respective advantages and limitations. Additionally, the review explores anticipated trends in spectral model construction and optimization techniques. Efficient and precise data processing is essential, as it directly impacts the performance of echelle spectrometers and expands their range of applications.