A High-Temperature and Wide-Permittivity Range Measurement System Based on Ridge Waveguide

作     者：Xiong, Rui Hu, Yuanhang Xia, Anqi Huang, Kama Yan, Liping Chen, Qian 

作者机构：Sichuan Univ Sch Elect & Informat Engn Chengdu 610064 Peoples R China 

出 版 物：《SENSORS》 (Sensors)

年 卷 期：2025年第25卷第2期

页      面：541-541页

核心收录：

学科分类：0710[理学-生物学] 071010[理学-生物化学与分子生物学] 0808[工学-电气工程] 07[理学] 0804[工学-仪器科学与技术] 0703[理学-化学] 

基　　金：Sichuan Science and Technology Program 2024YFHZ0282 

主　　题：ridge waveguide complex relative permittivity artificial neural network scattering parameters microwave measurement 

摘      要：Potential applications of microwave energy, a developed form of clean energy, are diverse and extensive. To expand the applications of microwave heating in the metallurgical field, it is essential to obtain the permittivity of ores throughout the heating process. This paper presents the design of a 2.45 GHz ridge waveguide apparatus based on the transmission/reflection method to measure permittivity, which constitutes a system capable of measuring the complex relative permittivity of the material under test with a wide temperature range from room temperature up to 1100 degrees C. The experimental results indicate that the system is capable of performing rapid measurements during the heating process. Furthermore, the system is capable of accurately measuring dielectric properties when the real part of the permittivity and the loss tangent vary widely. This measurement system is suitable for high-temperature dielectric property measurements and has potential applications in microwave-assisted metallurgy.