Adaptive specular reflection removal in light field microscopy using multi-polarization hybrid illumination and deep learning

作     者：Shi, Wenqi Quan, Hongda Kong, Lingbao 

作者机构：Fudan Univ Shanghai Engn Res Ctr Ultraprecis Opt Mfg Sch Informat Sci & Technol Shanghai 200433 Peoples R China 

出 版 物：《OPTICS AND LASERS IN ENGINEERING》 (Opt Lasers Eng)

年 卷 期：2025年第186卷

核心收录：

学科分类：070207[理学-光学] 07[理学] 08[工学] 0803[工学-光学工程] 0702[理学-物理学] 

基　　金：Shanghai Science and Technology Committee Innovation Grant [23ZR1404200] National Natural Science Foundation of China 

主　　题：Specular reflection removal Multi-polarization Adaptive hybrid modulated illumination Deep learning Light field microscopy Three-dimensional reconstruction 

摘      要：Specular highlights pose a significant challenge in light field microscopy (LFM), leading to information loss and inaccurate observations, especially on reflective surfaces. Existing methods for specular highlight removal often suffer from high computational complexity, limited applicability and extended processing times. To address these limitations, this paper introduces an adaptive hybrid illumination scheme that combines multiple polarized light sources with a deep learning-based control system to dynamically modulate illumination and eliminate specular highlights. This method effectively removes highlight reflections and provides uniform illumination without complex optical setups or mechanical components. By leveraging various polarization angles and utilizing precise electronic control through a neural network, the system dynamically adjusts lighting in real-time, achieving uniform illumination and superior image quality. Experimental results show that the proposed method effectively eliminates specular highlights, significantly improves 3D reconstruction accuracy and reduces processing time to 0.4 s (at least twice as fast as traditional approaches). This system offers a promising solution for applications requiring high-speed, high-precision imaging, such as biological analysis, industrial inspection, and materials research, providing an efficient and effective alternative for specular reflection removal in LFM.