The Development and Optimization of a Textile Image Processing Algorithm (TIPA) for Defect Detection in Conductive Textiles

作     者：Kim, Sang-Un Kim, Joo-Yong 

作者机构：Soongsil Univ Dept Smart Wearable Engn Seoul 06978 South Korea Soongsil Univ Dept Mat Sci & Engn Seoul 06978 South Korea 

出 版 物：《PROCESSES》 (Process.)

年 卷 期：2025年第13卷第2期

页      面：486-486页

核心收录：

基　　金：Technology Innovation Program (or Industrial Strategic Technology Development Program-Materials/Parts Package Type) Ministry of Trade, Industry & Energy (MOTIE, Korea) [P0012770] 

主　　题：conductive textiles textile image processing algorithm (TIPA) defect detection dip-coating process image filtering algorithm optimization 

摘      要：This study introduces a Textile Image Processing Algorithm (TIPA) designed to detect defects in conductive textiles, a crucial element of wearable technology. TIPAs employ image preprocessing, filtering, and classification to identify issues like uneven distribution of conductive particles. When applied to fabrics produced via dip-coating, our TIPA was optimized using a threshold ratio, achieving over 85% accuracy, with a maximum of 100% under ideal conditions. However, detection challenges were noted in fabrics with large, diffuse stains, particularly at extreme threshold ratios. This TIPA proves to be a valuable tool for improving quality control in smart textiles, with potential for further optimization.