Identification and Distance Measures of Measurement Apparatus

作     者：Zhengfeng Ji Yuan Feng Runyao Duan Mingsheng Ying 

作者机构：State Key Laboratory of Intelligent Technology and Systems Department of Computer Science and Technology Tsinghua University Beijing 100084 Chin 

出 版 物：《Physical Review Letters》 (Phys Rev Lett)

年 卷 期：2006年第96卷第20期

页      面：200401-200401页

核心收录：

学科分类：07[理学] 0702[理学-物理学] 

主　　题：Quantum theory 

摘      要：We propose simple schemes that can perfectly identify projective measurement apparatuses secretly chosen from a finite set. Entanglement is used in these schemes both to make possible the perfect identification and to improve the efficiency significantly. Based on these results, a brief discussion on the problem of how to appropriately define distance measures of measurements is also provided.