版权所有:内蒙古大学图书馆 技术提供:维普资讯• 智图
内蒙古自治区呼和浩特市赛罕区大学西街235号 邮编: 010021
作者机构:Univ Michigan Ctr Ultrafast Opt Sci Ann Arbor MI 48109 USA Univ Tokyo Inst Solid State Phys Minato Ku Tokyo 106 Japan Alliage Inc F-75005 Paris France Medox Electroopt Inc Ann Arbor MI 48108 USA
出 版 物:《IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS》 (IEEE J Sel Top Quantum Electron)
年 卷 期:1998年第4卷第2期
页 面:449-458页
核心收录:
学科分类:0808[工学-电气工程] 08[工学] 0702[理学-物理学]
基 金:America Inc Center for Ultrafast Optical Science, (STC PHY 8 920 108) IMRA National Science Foundation, NSF U.S. Department of Energy, USDOE, (DE-FG02-96ER14685) U.S. Department of Energy, USDOE Foundation for Community Association Research, FCAR U.S. Air Force, USAF, (F49620-95-1-0474) U.S. Air Force, USAF
主 题:amplified spontaneous emission chirped-pulse amplification intensity contrast ratio pulse cleaning terawatt lasers
摘 要:As ultrafast lasers achieve ever higher focused intensities on target, the problem of ensuring a clean laser-solid interaction becomes more pressing. In this paper, we give concrete examples of the deleterious effects of low-contrast interactions, and address the problem of subpicosecond laser intensity contrast ratio on both characterization and control fronts, We present the new technique of high-dynamic-range plasma-shuttered streak camera contrast measurement, as well as two efficient and relatively inexpensive ways of improving the contrast of short pulse lasers without sacrificing on the output energy: a double-pass Pockels cell (PC), and clean high-energy-pulse seeding of the regenerative amplifier.