DESIGN OF PSEUDOEXHAUSTIVE TESTABLE PLA WITH LOW OVERHEAD

作     者：SHEN, WZ HWANG, GH HSU, WJ JAN, YJ 

作者机构：ITRICOMP & COMMUN LABHSINCHUTAIWAN 

出 版 物：《IEEE TRANSACTIONS ON COMPUTERS》 (IEEE Trans Comput)

年 卷 期：1993年第42卷第7期

页      面：887-891页

核心收录：

学科分类：0808[工学-电气工程] 08[工学] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

基　　金：National Science Council  NSC  (NSC80-0404-E009-35) 

主　　题：BUILT-IN SELF-TEST DESIGN FOR TESTABILITY PROGRAMMABLE LOGIC ARRAY PSEUDOEXHAUSTIVE TESTING 

摘      要：The pseudoexhaustive testing (PET) scheme is a economic approach to test a large embedded programmable logic array (PIA). In this paper, we propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying our algorithm, both the area overhead and test length are reduced significantly.