Novel Readout Circuit Architecture for CMOS Image Sensors Minimizing RTS Noise

作     者：Martin-Gonthier, Philippe Magnan, Pierre 

作者机构：Univ Toulouse Inst Super Aeronaut & Espace Integrated Image Sensor Lab F-31055 Toulouse France 

出 版 物：《IEEE ELECTRON DEVICE LETTERS》 (IEEE Electron Device Lett)

年 卷 期：2011年第32卷第6期

页      面：776-778页

核心收录：

学科分类：0808[工学-电气工程] 08[工学] 

主　　题：CMOS image sensor (CIS) correlated double sampling (CDS) low frequency noise (LFN) noisy pixel reduction random telegraph signal (RTS) noise 

摘      要：This letter presents a novel readout architecture and its associated readout sequence for complementary metal-oxide-semiconductor (CMOS) image sensors (CISs) based on switch biasing techniques in order to reduce noisy pixel numbers induced by in-pixel source-follower transistor random telegraph signal noise. Measurement results done on a test image sensor designed with 0.35-mu m CIS technology demonstrate an efficient reduction of noisy pixel numbers without a pixel performance decrease.