Optimal design of accelerated degradation tests for estimating mean lifetime at the use condition

作     者：Park, JI Yum, BJ 

作者机构：Department of Industrial Engineering Korea Adv. Inst. Sci. and Technol. Yusong-Gu Taejon 305-701 373-1 Kusong-Dong South Korea 

出 版 物：《ENGINEERING OPTIMIZATION》 (工程优选)

年 卷 期：1997年第28卷第3期

页      面：199-230页

核心收录：

学科分类：1201[管理学-管理科学与工程(可授管理学、工学学位)] 08[工学] 

主　　题：reliability accelerated degradation tests optimal test plans simple constant rate model maximum likelihood estimation constrained nonlinear programming 

摘      要：In an accelerated degradation test, higher-than-normal stress levels are employed to hasten the degradation of product performance, and then the observed degradation data are used to estimate various reliability-related quantities at the use (normal) condition. In this paper, optimal accelerated degradation test plans are developed under the assumptions of destructive testing and the simple constant rate relationship between the stress and the product performance. Specifically, the paper determines the stress levels, the proportion of test units allocated to each stress level, and the measurement times such that the asymptotic variance of the maximum likelihood estimator of the mean lifetime at the use condition is minimized. The optimization problem is formulated as a constrained nonlinear program, and exact optimal solutions are obtained for various cases. Sensitivity analysis and sample size determination procedures are also illustrated with an example.