A wide-dynamic-range CMOS image sensor based on multiple short exposure-time readout with multiple-resolution column-parallel ADC

作     者：Sasaki, Masaaki Mase, Mitsuhito Kawahito, Shoji Tadokoro, Yoshiaki 

作者机构：Sendai Natl Coll Technol Dept Informat & Commun Engn Sendai Miyagi 9893128 Japan Hamamatsu Photon KK Hamamatsu Shizuoka 4358558 Japan Shizuoka Univ Res Inst Elect Hamamatsu Shizuoka 4328011 Japan Toyohashi Univ Technol Dept Comp & Informat Sci Toyohashi Aichi 4418580 Japan 

出 版 物：《IEEE SENSORS JOURNAL》 (IEEE Sensors J.)

年 卷 期：2007年第7卷第1-2期

页      面：151-158页

核心收录：

学科分类：0808[工学-电气工程] 08[工学] 0804[工学-仪器科学与技术] 0702[理学-物理学] 

基　　金：Ministry of Education  Culture  Sports  Science and Technology  MEXT 

主　　题：CMOS image sensor multiple-exposure multiresolution analog-to-digital converter (ADC) wide dynamic range 

摘      要：A wide-dynamic-range CMOS image sensor based on synthesis of one long and multiple short exposure-time signals is proposed. A high-speed, high-resolution column-parallel integration type analog-to-digital converter (ADC) with a nonlinear slope is crucial for this purpose. A prototype wide-dynamic-range CMOS image sensor that captures one long and three short exposure-time signals has been developed using 0.25-mu m 1-poly 4-metal CMOS image sensor technology. The dynamic range of the prototype sensor is expanded by a factor of 121.5, compared with the case of a single long exposure time. The maximum DNL of the ADC is 0.3 least significant,bits (LSB) for the single-resolution mode and 0.7 LSB for the multiresolution mode.