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作者机构:[a1 ]Department of Electrical and Computer Engineering Texas A&M University College Station Texas 77843-3128[a2 ]Electrochemical Energy Laboratory and Materials Science and Engineering Program University of Texas at Austin Austin Texas 78712[a3 ]Department of Mechanical Engineering Texas A&M University College Station Texas 77843-3123[a4 ]Electrochemical Energy Laboratory and Materials Science and Engineering Program University of Texas at Austin Austin Texas 78712[a5 ]Department of Electrical and Computer Engineering Texas A&M University College Station Texas 77843-3128
出 版 物:《JOURNAL OF MATERIALS RESEARCH》 (材料研究杂志)
年 卷 期:2011年第26卷第11期
页 面:854-859页
核心收录:
学科分类:08[工学] 0805[工学-材料科学与工程(可授工学、理学学位)] 080502[工学-材料学]
基 金:National Science Foundation [NSF 0709831, NSF 1007969] United States Air Force Office of Scientific Research [FA9550-07-1-0108, FA9550-09-1-0114] DOE Center for Integrated Nanotechnologies (CINT) Welch Foundation [F-1254] Direct For Mathematical & Physical Scien Division Of Materials Research Funding Source: National Science Foundation Direct For Mathematical & Physical Scien Division Of Materials Research Funding Source: National Science Foundation
主 题:Thin Film Electrical Properties Physical Vapor Deposition (PVD)
摘 要:Microstructural and electrical properties of Gd-doped CeO2 (GDC; Ce0.9Gd0.1O1.95) thin films prepared by pulsed laser deposition as an electrolyte in solid-oxide fuel cells (SOFCs) were investigated. The GDC thin films were prepared on various substrates including single-crystal yttria-stabilized zirconia (YSZ) and magnesium oxide (MgO) substrates. The GDC thin-film electrolytes with different grain sizes and grain morphologies were prepared by varying the deposition parameters, such as substrate temperature, oxygen partial pressure, target repetition rate, and laser ablation energy. The microstructural properties of these films were examined using X-ray diffraction (XRD), transmission electron microscopy (TEM), and atomic force microscopy (AFM). Alternating-current (AC) and direct-current (DC) electrical measurements through in-plane method show that the electrical property of the GDC thin film strongly depends on grain size, e.g., the total conductivity of the films deposited at 700 C (7.3 103 S/cm) is about 20 times higher than the ones deposited at room temperature (3.6 104 S/cm) at the measurement temperature of 600 C.