Correlation between static and dynamic parameters of A-to-D converters:: In the view of a unique test procedure

作     者：Azaïs, F Bernard, S Bertrand, Y Comte, M Renovell, M 

作者机构：Univ Montpellier CNRS LIRMM F-34392 Montpellier 5 France 

出 版 物：《JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS》 (电子测试杂志；理论与应用)

年 卷 期：2004年第20卷第4期

页      面：375-387页

核心收录：

学科分类：0808[工学-电气工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

主　　题：analog and mixed-signal testing ADC test spectral analysis 

摘      要：ADCs are fully characterized by both static and dynamic parameters. Testing methods usually combine a histogram-based approach with a spectral analysis to determine the complete set of ADCs parameters. In the view of a unique test procedure, this paper investigates the correlation between both kinds of parameters. Experimental results demonstrate that under appropriate test conditions, the dynamic parameters extracted from a classical FFT exhibit significant variations against ADC offset, gain and non-linearity errors, opening the way of a low-cost test strategy in the frequency domain.