Refractive index measurements of planar chalcogenide thin film

作     者：Laniel, JM Ménard, JM Turcotte, K Villeneuve, A Vallée, R Lopez, C Richardson, KA 

作者机构：Univ Laval Ctr Opt Photon & Laser Dept Phys Geneie Phys & Opt Laval PQ G1K 7P4 Canada Univ Cent Florida CREOL Sch Opt Orlando FL 32816 USA 

出 版 物：《JOURNAL OF NON-CRYSTALLINE SOLIDS》 (非晶性固体杂志)

年 卷 期：2003年第328卷第1-3期

页      面：183-191页

核心收录：

学科分类：07[理学] 070205[理学-凝聚态物理] 08[工学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0703[理学-化学] 0702[理学-物理学] 

基　　金：Natural Sciences and Engineering Research Council of Canada  NSERC 

主　　题：Optical-properties Wave-guides Glasses 

摘      要：We report on the measurements of the refractive index of As-S-Se chalcogenide glasses near 1.55 mum. The measurements were made on annealed and non-annealed samples of thermally evaporated thin films. The data for two different series of glasses are presented: the compositions As40S60-xSex and the compositions AsxS(100-x)/2Se(100-x)/2 where the ratio of sulfur to selenium is kept constant (1:1). It has been found that replacing sulfur by selenium in the first series increases the refractive index from 2.4 to 2.8 and increasing the arsenic content in the second series increases the refractive index, In all cases, it has been found that annealing the samples increase the refractive index. The accuracy in the refractive index measurement is +/-0.2%. (C) 2003 Elsevier B.V. All rights reserved.