Three-dimensional surface profile measurement of a moving object by a spatial-offset phase stepping method

作     者：Yoneyama, S Morimoto, Y Fujigaki, M Ikeda, Y 

作者机构：Wakayama Univ Dept Optomechatron Wakayama 6408510 Japan 

出 版 物：《OPTICAL ENGINEERING》 (光学工程)

年 卷 期：2003年第42卷第1期

页      面：137-142页

核心收录：

学科分类：08[工学] 080401[工学-精密仪器及机械] 0804[工学-仪器科学与技术] 081102[工学-检测技术与自动化装置] 0811[工学-控制科学与工程] 0702[理学-物理学] 

基　　金：Wakayama University 

主　　题：optical measurement image processing relative shape measurement phase stepping method linear array sensor moving object 

摘      要：This study proposes a new method for measuring the 3-D surface profile of an object moving at constant speed. A sinusoidal grating pattern is projected on a moving object. Then, grating patterns that are deformed according to the profile of the object are acquired by three linear array sensors. Since a linear array sensor records light intensity along an original grating line, the resultant image forms a fringe pattern that represents the profile of the object. Using three images obtained by the three linear array sensors, the phase distribution of the fringe pattern is calculated by a phase stepping method without any phase stepping devices. Consequently, the profile of the moving object can be evaluated from the phase of the fringes, since the value of the phase is simply proportional to the height of the object. Experimentation demonstrates that the accuracy is about 4.3% for the wrapped phase range of 2pi rad with a speckle pattern present. The proposed method can be used for inspection of moving objects such as products on an assembly line. (C) 2003 Society of Photo-Optical Instrumentation Engineers.