Noise-induced threshold shift and pattern formation in electroconvection by controlling characteristic time scales

作     者：Jong-Hoon Huh 

作者机构：Department of Mechanical Information Science and Technology Faculty of Computer Science and Systems Engineering Kyushu Institute of Technology Fukuoka 820-8502 Japan 

出 版 物：《Physical Review E》 (物理学评论E辑：统计、非线性和软体物理学)

年 卷 期：2011年第84卷第2期

页      面：025302(R)-025302(R)页

核心收录：

学科分类：07[理学] 070203[理学-原子与分子物理] 0702[理学-物理学] 

基　　金：Ministry of Education, Culture, Sports, Science, and Technology of Japan Japan Society for the Promotion of Science Grants-in-Aid for Scientific Research Funding Source: KAKEN 

主　　题：Nematic liquid crystals 

摘      要：We report external noise-induced threshold shift and pattern formation in ac-driven electroconvection (EC) in nematic liquid crystals. We investigate the noise intensity dependence of the threshold and determine the relationship fc*=hfcda (α ∼ 1.4, h ∼ 0.1) between the characteristic cutoff frequency (fc*) of the noise and the characteristic ac frequency (fcd) of EC. For fcfc*, the noise contributes to stabilizing EC (i.e., upward threshold shift), whereas for fcfc*, it contributes to destabilizing EC (i.e., downward threshold shift). For fc=fc*, the noise makes no contribution to the threshold shift. However, the characteristic wavelength of EC strongly depends on the noise intensity but not on fc.