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作者机构:Department of Physical Electronics Faculty of Engineering and Hiroshima-Branch of Research Projects for Core Research for Evolutional Science and Technology (CREST) JST Hiroshima University 1-4-1 Kagamiyama Higashi-Hiroshima 739-8527 Japan
出 版 物:《Physical Review B》 (物理学评论B辑:凝聚态物质与材料物理学)
年 卷 期:1999年第60卷第24期
页 面:16686-16686页
核心收录:
摘 要:Physical mechanisms which limit the squeezing bandwidth in a heterojunction light-emitting diode (LED) have been extensively studied both theoretically and experimentally. It is proven that our experimental results of pump-current dependence of the squeezing bandwidth in the constant-current-driven heterojunction LED at room temperature cannot be explained by previous theoretical predictions. We present a theoretical framework, including the effects of a microscopic backward-pump (BP) process, generally applicable to a heterojunction LED. Parameters describing the relative significance of the BP process are determined by the measurements of current-versus-voltage characteristic and differential resistance of the LED, independent of the noise measurements. As a consequence, the experimental results can be explained by our model in a unified manner over a whole range of injection current, and it is clarified that the pump situation of the LED moves continuously from thermionic emission to diffusion limits with increasing pump current.