Lead-Orientation-Dependent Wave Function Scarring in Open Quantum Dots

作     者：J. P. Bird R. Akis D. K. Ferry D. Vasileska J. Cooper Y. Aoyagi T. Sugano 

作者机构：Center for Solid State Electronics Research & Department of Electrical Engineering Arizona State University Tempe Arizona 85287-5706 Nanoelectronic Materials Laboratory Frontier Research Program RIKEN 2-1 Hirosawa Wako-shi Saitama 351-01 Japan 

出 版 物：《Physical Review Letters》 (Phys Rev Lett)

年 卷 期：1999年第82卷第23期

页      面：4691-4691页

核心收录：

学科分类：07[理学] 0702[理学-物理学] 

摘      要：Experimental studies of the conductance of open quantum dots show a series of highly regular oscillations at low temperatures as the voltage applied to their defining gates is varied. Simulations of quantum transport through these dots reveal the oscillations to be correlated to the recurrence of specific groups of wave function scars. We furthermore find that nominally identical dots, differing only in the orientation of their input and output contacts, may be used to excite different families of scars, giving rise in turn to measurable transport results.