STRUCTURED HIGHLIGHT INSPECTION OF SPECULAR SURFACES

作     者：SANDERSON, AC WEISS, LE NAYAR, SK 

作者机构：CARNEGIE MELLON UNIVDEPT ELECT & COMP ENGNINST ROBOTPITTSBURGHPA 15213 

出 版 物：《IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE》 (IEEE Trans Pattern Anal Mach Intell)

年 卷 期：1988年第10卷第1期

页      面：44-55页

核心收录：

学科分类：0808[工学-电气工程] 08[工学] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

基　　金：Westinghouse Electric Corporation Carnegie Mellon University, CMU 

主　　题：Inspection Shape Soldering Cameras Brightness Light sources Robot vision systems Optical reflection Service robots Optical imaging INSPEC: Controlled Indexing computerised picture processing computer vision INSPEC: Non-Controlled Indexing stereo structured highlight structured light computer vision surface orientation specular surfaces illumination imaging three-dimensional shape information scanned array local surface height SHINY distant-source assumption 

摘      要：An approach to illumination and imaging of specular surfaces that yields three-dimensional shape information is described. The structured highlight approach uses a scanned array of point sources and images of the resulting reflected highlights to compute local surface height and orientation. A prototype structured highlight inspection system, called SHINY, has been implemented. SHINY demonstrates the determination of surface shape for several test objects including solder joints. The current SHINY system makes the distant-source assumption and requires only one camera. A stereo structured highlight system using two cameras is proposed to determine surface-element orientation for objects in a much larger field of view. Analysis and description of the algorithms are included. The proposed structured highlight techniques are promising for many industrial tasks.