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作者机构:Department of Electrical and Computer Engineering Division of Computer Science University of California at Davis Davis CA 95616 U.S.A.
出 版 物:《MICROELECTRONICS AND RELIABILITY》 (微电子学可靠性)
年 卷 期:1987年第27卷第3期
页 面:549-556页
核心收录:
学科分类:0808[工学-电气工程] 0809[工学-电子科学与技术(可授工学、理学学位)] 08[工学] 0805[工学-材料科学与工程(可授工学、理学学位)] 0702[理学-物理学]
主 题:RELIABILITY THEORY
摘 要:This paper presents a unified treatment of methods for distribution-free analysis of repairable fault-tolerant systems. Material from diverse sources is presented for the first time in an integrated, easily accessible unit. In addition, new results are derived which enable more detailed analysis than had carlier been possible. New, streamlined proofs based only on elementary techniques are developed, facilitating extensions of the theory to a wider range of applications.