Efficient Static Compaction of Test Patterns Using Partial Maximum Satisfiability

作     者：Huisi Zhou Dantong Ouyang Liming Zhang Huisi Zhou;Dantong Ouyang;Liming Zhang

作者机构：the Laboratory of Symbol Computation and Knowledge EngineeringCollege of Computer Science and TechnologyJilin UniversityChangchun 130012China 

出 版 物：《Tsinghua Science and Technology》 (清华大学学报（自然科学版（英文版）)

年 卷 期：2021年第26卷第1期

页      面：1-8页

核心收录：

学科分类：080903[工学-微电子学与固体电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

基　　金：supported by the National Natural Science Foundation of China(Nos.61672261 and 61872159) 

主　　题：test compaction partial maximum satisfiability Automatic Test Pattern Generation(ATPG) 

摘      要：Static compaction methods aim at finding unnecessary test patterns to reduce the size of the test set as a post-process of test *** based on partial maximum satisfiability are often used to track many hard problems in various domains,including artificial intelligence,computational biology,data mining,and machine *** observe that part of the test patterns generated by the commercial Automatic Test Pattern Generation(ATPG)tool is redundant,and the relationship between test patterns and faults,as a significant information,can effectively induce the test patterns reduction *** a test pattern can detect one or more faults,we map the problem of static test compaction to a partial maximum satisfiability *** on ISCAS89,ISCAS85,and ITC99 benchmarks show that this approach can reduce the initial test set size generated by TetraMAX18 while maintaining fault coverage.