Matching misaligned two-resolution metrology data

作     者：Wang, Yaping 

作者单位：Texas A&M University 

学位级别：Ph.D.

导师姓名：Moreno-Centeno, Erick

授予年度：2016年

主      题：Coordinate measuring machine correspondences iterative closest point (ICP) coherent point drift (CPD) two-stage matching framework quadratic integer programming rigid point set registration Thesis 

摘      要：Multi-resolution metrology devices co-exist in today s manufacturing environment, producing coordinate measurements complementing each other. Typically, the high-resolution device produces a scarce but accurate dataset, whereas the low-resolution one produces a dense but less accurate dataset. Research has shown that combining the two datasets of different resolutions makes better predictions of the geometric features of a manufactured part. A challenge, however, is how to effectively match each high-resolution data point to a low-resolution point that measures approximately the same physical location. A solution to this matching problem appears a prerequisite to a good final prediction. This dissertation solves this metrology matching problem by formulating it as a quadratic integer programming, aiming at minimizing the maximum inter-point-distance difference (maxIPDdiff) among all potential correspondences. Due to the combinatorial nature of the optimization model, solving it to optimality is computationally prohibitive even for a small problem size. In order to solve real-life sized problems within a reasonable amount of time, a two-stage matching framework (TSMF) is proposed. The TSMF approach follows a coarse-to-fine search strategy and consists of down-sampling the full size problem, solving the down-sampled problem to optimality, extending the solution of the down-sampled problem to the full size problem, and refining the solution using iterative local search. Many manufactured parts are designed with symmetric features; that is, many part surfaces are invariant (are mapped to themselves) to certain intrinsic reflections and/or rotations. Dealing with parts surfaces with symmetric features makes the metrology matching problem even more challenging. The new challenge is that, due to this symmetry, alignment performance metrics such as maxIPDdiff and root mean square error are not able to differentiate between (a) correct solutions/correspondences that are orie