集成电路.150kHz～1GHz电磁抗扰度的测量.第1部分:一般条件和定义

标准编号：IEC 62132-1-2006

提出单位：IEC/SC 47A

起草单位：IEC/SC 47A

发布日期：2006年

实施日期：10000000

主      题：电路 定义 电气工程 电磁的 电磁兼容性 频率范围 一般条件 总论 影响量 集成电路 干扰抑制 磁电效应 测量 测量条件 测量结果 测量技术 

中国标准分类号：L56

国际标准分类号：31_200

摘      要：This part of IEC 62132 provides general information and definitions on measurement ofconducted and radiated electromagnetic immunity of integrated circuits (ICs) to conductedand radiated disturbances. It also provides a description of measurement conditions, testequipment and set-up, as well as the test procedures and content of the test reports. A testmethod comparison table is included in Annex A to assist in selecting the appropriatemeasurement method(s).This standard describes general conditions required to obtain a quantitative measure ofimmunity of ICs in a uniform testing environment. Critical parameters that are expected toinfluence the test results are described. Deviations from this standard are noted explicitly inthe individual test report. The measurement results can be used for comparison or *** of the injected voltages and currents, together with the responses of the ICstested at controlled conditions, yields information about the potential immunity of the IC toconducted and radiated RF disturbances in a given application.