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检索条件"任意字段=13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems"
683 条 记 录,以下是161-170 订阅
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Comparing Proton and Neutron Induced SEU Cross Section in FPGA  19
Comparing Proton and Neutron Induced SEU Cross Section in FP...
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ieee 19th International symposium on design and diagnostics of electronic circuits & systems (DDECS)
作者: Vanat, Tomas Krizek, Filip Ferencei, Jozef Kubatova, Hana Czech Tech Univ Fac Informat Technol Dept Digital Design Prague Czech Republic Acad Sci Czech Republ Inst Nucl Phys Dept Nucl Spect Rez Czech Republic
Single event upsets (SEU) are induced by an electric charge deposited in the material of the chip. the origin of the charge can be either from outside of the chip or it can be generated inside as a result of a nuclear... 详细信息
来源: 评论
Multi-Objective BDD Optimization for RRAM based Circuit design  19
Multi-Objective BDD Optimization for RRAM based Circuit Desi...
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ieee 19th International symposium on design and diagnostics of electronic circuits & systems (DDECS)
作者: Shirinzadeh, Saeideh Soeken, Mathias Drechsler, Rolf Univ Bremen Dept Math & Comp Sci D-28359 Bremen Germany Ecole Polytech Fed Lausanne Integrated Syst Lab Lausanne Switzerland DFKI GmbH Cyber Phys Syst Bremen Germany
Resistive switching property enables various promising applications such as design of non-volatile in-memory computing devices which has attracted high attention to Resistive Random Access Memories (RRAMs). In this wo... 详细信息
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Comparison of Gate-Driven and Bulk-Driven Current Mirror Topologies  19
Comparison of Gate-Driven and Bulk-Driven Current Mirror Top...
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ieee 19th International symposium on design and diagnostics of electronic circuits & systems (DDECS)
作者: Rakus, Matej Stopjakova, Viera Arbei, Daniel Slovak Univ Technol Bratislava Fac Elect Engn & Informat Technol Inst Elect & Photon Bratislava Slovakia
In this paper, different topologies of gate-driven and bulk-driven current mirrors designed in 90 nm CMOS technology are presented. Since the conventional MOS transistors can work as a bulk-driven device, there is no ... 详细信息
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Co-design of CML IO and Interposer Channel for Low Area and Power Signaling  19
Co-design of CML IO and Interposer Channel for Low Area and ...
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ieee 19th International symposium on design and diagnostics of electronic circuits & systems (DDECS)
作者: Chaudhary, Muhammad Waqas Heinig, Andy Fraunhofcr Inst Integrated Circuits IIS Design Automat Div EAS D-01069 Dresden Germany
In recent years, 2.5D integration of ICs on Inter-poser is becoming popular for highly integrated miniaturized systems. To combine two or more chips together, there is a lot of communication between the chips and this... 详细信息
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A Rule-Based Approach for Minimizing Power Dissipation of Digital circuits  19
A Rule-Based Approach for Minimizing Power Dissipation of Di...
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ieee 19th International symposium on design and diagnostics of electronic circuits & systems (DDECS)
作者: Das, Subrata Dasgupta, Parthasarathi Fiser, Petr Ghosh, Sudip Das, Dehesh Kumar Jadavpur Univ Dept Comp Sci & Engn Kolkata India Indian Inst Management Calcutta MIS Grp Kolkata India Czech Tech Univ Fac Informat Technol Prague Czech Republic IIEST Sch VLSI Technol Sibpur Howrah India
Minimization of power dissipation of VLSI circuits is one of the major concerns of recent digital circuit design primarily due to the ever decreasing feature sizes of circuits, higher clock frequencies and larger die ... 详细信息
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A New User-Friendly ATPG Platform for Digital circuits  19
A New User-Friendly ATPG Platform for Digital Circuits
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ieee 19th International symposium on design and diagnostics of electronic circuits & systems (DDECS)
作者: Lipovsky, M. Svarc, J. Gramatova, E. Fiser, P. Slovak Univ Technol Bratislava Fac Informat & Informat Technol Bratislava Slovakia Czech Tech Univ Fac Informat Technol Prague Czech Republic
the paper presents a new graphical platform for automatic test patterns generation and fault simulation for digital circuits. the platform integrates two existing academic tools for test pattern generation and fault s... 详细信息
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Precision Human Body Temperature Measurement Based on thermistor Sensor  19
Precision Human Body Temperature Measurement Based on Thermi...
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ieee 19th International symposium on design and diagnostics of electronic circuits & systems (DDECS)
作者: Narczyk, Pawel Siwiec, Krzysztof Pleskacz, Witold A. Warsaw Univ Technol Inst Microelect & Optoelect Ul Koszykowa 75 PL-00662 Warsaw Poland
An analog front-end, with a new temperature calibration method, for an accurate temperature measurement of a human body has been presented. the discussed AFE consists of a current reference, a precision current source... 详细信息
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Parity Waterfall Method  19
Parity Waterfall Method
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ieee 19th International symposium on design and diagnostics of electronic circuits & systems (DDECS)
作者: Borecky, Jaroslav Kohlik, Martin Kubatova, Hana Czech Tech Univ Dept Digital Design Fac Informat Technol Tech 9 Prague Czech Republic
this paper proposes a method for improvement of the fault-coverage capabilities of Field Programmable Gate Array (FPGA) designs. It utilizes Concurrent Error Detection (CED) techniques and the basic architectures of a... 详细信息
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Verification Approach Based on Emulation Technology  19
Verification Approach Based on Emulation Technology
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ieee 19th International symposium on design and diagnostics of electronic circuits & systems (DDECS)
作者: Koczor, Arkadiusz Matoga, Lukasz Penkala, Piotr Pawlak, Adam Evatronix SA Bielsko Biala Poland Silesian Tech Univ Inst Elect Gliwice Poland
the paper presents a scalable architecture for fast emulation of systems-on-Chip. It is implemented on a dedicated modular FPGA-based hardware platform. this verification ecosystem presents a new approach to improve e... 详细信息
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A Hybrid Power Modeling Approach to Enhance High-Level Power Models  19
A Hybrid Power Modeling Approach to Enhance High-Level Power...
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ieee 19th International symposium on design and diagnostics of electronic circuits & systems (DDECS)
作者: Nocua, Alejandro Virazel, Arnaud Bosio, Alberto Girard, Patrick Chevalier, Cyril Univ Montpellier CNRS LIRMM Montpellier France STMicroelectronics Grenoble France
Power management techniques are applied at high abstraction levels to reduce chip power consumption. Accurate and efficient power models are needed as early as possible in the design flow to ensure that correct saving... 详细信息
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