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检索条件"任意字段=2013 ACM/SIGDA International Symposium on Field Programmable Gate Arrays, FPGA 2013"
809 条 记 录,以下是221-230 订阅
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Embedded Reconfigurable Augmented DC-DC Boost Converter for Fast Transient Recovery
Embedded Reconfigurable Augmented DC-DC Boost Converter for ...
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26th international Conference on VLSI Design Held Concurrently with 12th international Conference on Embedded Systems Design
作者: Mishra, Neeraj Jha, Niraj Kapat, Santanu Patra, Amit Indian Inst Technol Dept Elect Engn Kharagpur 721302 W Bengal India
A DC-DC boost converter is widely used for power management applications. However, the right-half-plane zero effect still remains a bottleneck for fast transient recovery. This paper is intended to propose an embedded... 详细信息
来源: 评论
Intellectual Property Protection for fpga Designs with Soft Physical Hash Functions: First Experimental Results
Intellectual Property Protection for FPGA Designs with Soft ...
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IEEE international symposium on Hardware-Oriented Security and Trust (HOST)
作者: Kerckhof, Stephanie Durvaux, Francois Standaert, Francois-Xavier Gerard, Benoit Catholic Univ Louvain ICTEAM ELEN Crypto Grp Louvain Belgium
The use of Soft Physical Hash (SPH) functions has been recently introduced as a flexible and efficient way to detect Intellectual Property (IP) cores in microelectronic systems. Previous works have mainly investigated... 详细信息
来源: 评论
A High Speed Configurable fpga Architecture For K-mean Clustering
A High Speed Configurable FPGA Architecture For K-mean Clust...
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IEEE international symposium on Circuits and Systems (ISCAS)
作者: Kutty, Jithin Sankar Sankaran Boussaid, Farid Amira, Abbes Univ Western Australia Sch Elect & Comp Engn Perth WA 6009 Australia W Scotland Univ Sch Comp Paisley England
This paper presents a high speed configurable fpga architecture for k-means clustering. The proposed architecture is highly pipelined, parallel and fully configurable. It can achieve an operating frequency of 400 MHz,... 详细信息
来源: 评论
An fpga-Based Test Platform for Analyzing Data Retention Time Distribution of DRAMs
An FPGA-Based Test Platform for Analyzing Data Retention Tim...
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international symposium on VLSI Design, Automation, and Test (VLSI-DAT)
作者: Hou, Chih-Sheng Li, Jin-Fu Lo, Chih-Yen Kwai, Ding-Ming Chou, Yung-Fa Wu, Cheng-Wen Natl Cent Univ Dept Elect Engn Jhongli 320 Taiwan Ind Technol Res Inst Informat & Commun Res Labs Hsinchu 310 Taiwan
Data retention time distribution of a dynamic random access memory (DRAM) has a heavy impact on its yield, power, and performance. Accurate and detailed information of data retention time distribution thus is very imp... 详细信息
来源: 评论
IEEE 1588 Transparent Clock Architecture for fpga-based Network Devices
IEEE 1588 Transparent Clock Architecture for FPGA-based Netw...
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IEEE international symposium on Industrial Electronics (ISIE)
作者: Moreira, Naiara Astarloa, Armando Lazaro, Jesus Garcia, Alain Ormaetxea, Enekoitz Univ Basque Country UPV EHU Bilbao 48013 Spain
Apart from traditional test and measurement systems where clock synchronization is required, new emerging application areas like SmartGrids and 4G cellular mobile backhaul networks present strong timing constraints in... 详细信息
来源: 评论
An Improved Method of fpga-based TDC for Time-of-Flight PET
An Improved Method of FPGA-based TDC for Time-of-Flight PET
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60th IEEE Nuclear Science symposium (NSS) / Medical Imaging Conference (MIC) / 20th international Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors
作者: Kim, Daehoon Choi, Yong Lee, Sangwon Sogang Univ Dept Elect Engn Mol Imaging Res & Educ MiRe Lab Seoul South Korea
Time-to-digital converter (TDC) implemented in field-programmable-gate arrays (fpgas) with the use of tapped delay line (TDL) methods using dedicated carry chain structures has been utilized to obtain precise timing i... 详细信息
来源: 评论
Evaluating a low cost robustness improvement in SRAM-based fpgas
Evaluating a low cost robustness improvement in SRAM-based F...
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2013 IEEE 19th international On-Line Testing symposium, IOLTS 2013
作者: Jrad, M.Ben Leveugle, R. 46 Avenue Félix Viallet 38031 Grenoble Cedex France
Soft errors in the configuration memory of SRAM-based fpgas cause significant application disturbances. We demonstrate on Xilinx and Altera fpgas the feasibility of a very low cost and automated mitigation approach an... 详细信息
来源: 评论
A study of the partitioned dynamic programming algorithm for genome comparison in fpga
A study of the partitioned dynamic programming algorithm for...
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IEEE international symposium on Circuits and Systems (ISCAS)
作者: Hu, Yuanqi Georgiou, Pantelis Univ London Imperial Coll Sci Technol & Med Dept Elect & Elect Engn Ctr Bioinspired Technol Inst Biomed Engn London SW7 2AZ England
This paper explores the potential of partitioning the dynamic programming algorithm to utilise the capabilities of fpga platforms for parallel genome sequence comparison and assembly. We use this to solve the prefix-s... 详细信息
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Enabling Difference-Based Dynamic Partial Self Reconfiguration for Large Differences
Enabling Difference-Based Dynamic Partial Self Reconfigurati...
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8th IEEE international Design and Test symposium (IDT)
作者: Goren, Sezer Ozkurt, Ozgur Turk, Yusuf Yildiz, Abdullah Ugurdag, H. Fatih Yeditepe Univ Dept Comp Engn Istanbul Turkey Vestek R&D Istanbul Turkey Ozyegin Univ Dept Elect & Elect Engn Istanbul Turkey
This paper presents a new Dynamic Partial Self Reconfiguration (DPSR) flow for Xilinx fpgas. Leveraging the Xilinx fpga Editor and Plan Ahead tools, we provide two implementation approaches that enable partial reconfi... 详细信息
来源: 评论
Built-in Self-Repair in a 3D Die Stack Using programmable Logic
Built-in Self-Repair in a 3D Die Stack Using Programmable Lo...
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IEEE international symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
作者: Nepal, Kundan Shen, Xi Dworak, Jennifer Manikas, Theodore Bahar, R. Iris Univ St Thomas Sch Engn St Paul MN 55105 USA Southern Methodist Univ Dept Comp Sci & Engn Dallas TX USA Brown Univ Sch Engn Providence RI 02912 USA
3D stacked integrated circuits hold great promise for increasing system performance, but difficulties in testing dies and assembling a 3D stack are leading to yield issues and slowing the large scale manufacture of th... 详细信息
来源: 评论