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检索条件"任意字段=28th International Conference on Logic Programming, ICLP 2012"
106 条 记 录,以下是101-110 订阅
排序:
Efficient threshold Monitoring for Distributed Probabilistic Data
Efficient Threshold Monitoring for Distributed Probabilistic...
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international conference on Data Engineering
作者: Mingwang Tang Feifei Li Jeff M. Phillips Jeffrey Jestes School of Computing University of Utah Salt Lake USA
In distributed data management, a primary concern is monitoring the distributed data and generating an alarm when a user specified constraint is violated. A particular useful instance is the threshold based constraint... 详细信息
来源: 评论
Charge trapping properties in Ti-doped Ta2O5 films on nitrided Si
Charge trapping properties in Ti-doped Ta2O5 films on nitrid...
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international conference on Microelectronics, MIEL
作者: A. Skeparovski N. Novkovski A. Paskaleva Institute of Physics Faculty of Natural Sciences and Mathematics Ss Cyril and Methodius University Skopje Macedonia Institute of Solid State Physics Bulgarian Academy of Sciences Sofia Bulgaria
the trapping of charge carriers in Ti-doped Ta 2 O 5 (6 nm) stacks on nitrided Si during constant current stress of metal-insulator-semiconductor capacitors has been investigated. Both, the charge buildup on pre-exis... 详细信息
来源: 评论
Discrete Stochastic Search and Its Application to Feature-Selection for Deep Relational Machines  28th
Discrete Stochastic Search and Its Application to Feature-Se...
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28th international conference on Artificial Neural Networks (ICANN)
作者: Dash, Tirtharaj Srinivasan, Ashwin Joshi, Ramprasad S. Baskar, A. BITS Pilani Dept Comp Sci & Informat Syst KK Birla Goa Campus Pilani 403726 Goa India
We use a model for discrete stochastic search in which one or more objects ("targets") are to be found by a search over n locations ("boxes"), where n is infinitely large. Each box has some probabi... 详细信息
来源: 评论
Device characteristics research according to the array EEPROM cell's active pattern difference
Device characteristics research according to the array EEPRO...
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international conference on Microelectronics, MIEL
作者: Young-sik Choi Yong-han Roh Sang-bae Yi Sun-hyun Kim Sung-hoon You Semiconductor LSI TD2 Team System LSI Division Samsung Electronics Company Limited Yongin si Kyunggi South Korea School of Information and Communication Engineering Sungkyunkwan University Suwon South Korea
In the product development of our company's Deep Sub Micron Display Driver IC(DDI), we found that inner cell's and outer cell's characteristic are significantly different. this problem leads to device yiel... 详细信息
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Charge trapping at low injection currents in (TiN, Mo, Pt)/Ta2O5:Hf/SiO2/Si structures
Charge trapping at low injection currents in (TiN, Mo, Pt)/T...
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international conference on Microelectronics, MIEL
作者: L. S. Georgievska N. Novkovski E. Atanassova Institute of Mathematics and Physics Faculty of Electrical Engineering and Information Technologies University St Cyril and Methodius Skopje Macedonia Institute of Physics Faculty of Natural Sciences and Mathematics University St Cyril and Methodius Skopje Macedonia Institute of Solid State Physics Bulgarian Academy of Sciences Sofia Bulgaria
Samples investigated in this work contain Hf-doped layers of Ta 2 O 5 , i.e. the mixture of two most favorable high-k materials, which proved appropriate characteristics for application in DRAMs and MOSFETs. the influ... 详细信息
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Investigation of failure mechanisms in low-voltage power VDMOSFETs linked with gate oxide process quality
Investigation of failure mechanisms in low-voltage power VDM...
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international conference on Microelectronics, MIEL
作者: E. Pomès J.-M. Reynès P. Tounsi J.-M. Dorkel CNRS-LAAS UPS INSA INP ISAE Université de Toulouse Toulouse France Freescale Semiconductor Company Toulouse France
Devices dedicated to automotive applications have to reach exacting specifications especially in terms of reliability. the burn-in HTGB test is dedicated to evaluate gate oxide integrity with gate biased under high te... 详细信息
来源: 评论