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检索条件"任意字段=29th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2023"

共 12 条记录，以下是1-10 订阅

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Proceedings - 2023 ieee 29th international symposium on On-line testing and robust system design, iolts 2023

Proceedings - 2023 IEEE 29th International Symposium on On-L...

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29th ieee international symposium on on-line testing and robust system design, iolts 2023

ISBN: (纸本)9798350341355

the proceedings contain 34 papers. the topics discussed include: on-chip SRAM disclosure attack prevention technique for SoC;towards dependable RISC-V cores for edge computing devices;ERrOR: improving performance and fault tolerance using early execution;ML-based online design error localization for RISC-V implementations;TREFU: an online error detecting and correcting fault tolerant GPGPU architecture;SafeLS: an open source implementation of a lockstep NOEL-V RISC-V core;microarchitecture-aware timing error prediction via deep neural networks;a learning-based approach for single event transient analysis in pass transistor logic;and about the correlation between logical identified faulty gates and their layout characteristics.

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Proceedings 2023 ieee 29th international symposium on On-line testing and robust system design (iolts)

Proceedings 2023 IEEE 29th International Symposium on On-Lin...

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ieee symposium on On-line testing (iolts)

Proceedings 2023 ieee 29th international symposium on On-line testing and robust system design (iolts).

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Radiation-Induced Errors in the Software Level of Real-Time Soft Processing system 29

Radiation-Induced Errors in the Software Level of Real-Time ...

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29th ieee international symposium on on-line testing and robust system design (iolts)

作者： De Sio, Corrado Rizzieri, Daniele Portaluri, Andrea La Greca, Salvatore G. Azimi, Sarah Politecn Torino Dipartimento Automat & Informat DAUIN Turin Italy

ISBN: (纸本)9798350341355

FPGAs' and programmable hardware's high performance and flexibility have made them a reasonable choice for space-oriented applications, although susceptible to soft errors. this paper proposes a comprehensive analysis of the effects of microarchitectural faults on soft processors due to radiations, identifying the hardware sources of errors and how they propagate to software-level.

关键词： Fault Injection FreeRTOS FPGA Microblaze RTOS SEUs Software Exceptions Soft Processors

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SLM ISA and Hardware Extensions for RISC-V Processors 29

SLM ISA and Hardware Extensions for RISC-V Processors

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29th ieee international symposium on on-line testing and robust system design (iolts)

作者： Ghasemi, S. Maryam Meschkov, Sergej Krautter, Jonas Gnad, Dennis R. E. Tahoori, Mehdi B. Karlsruhe Inst Technol KIT Inst Comp Engn Karlsruhe Germany

ISBN: (纸本)9798350341355

Nowadays, RISC-V processors have attracted much attention due to their extendability, for targeting high performance applications with strict demands on functional safety. Silicon Lifecycle Management (SLM) is a new emerging concept aiming at functional safety among other features such as availability, maintainability, and lifetime extension. this concept helps to monitor the system health during its lifecycle, in the various timespans, to ensure that safety margins while running critical applications are not exceeded. Hence, enabling both the collection of chip parametrics as well as in-field testing will provide the means to fulfill this concept. In this work, we propose instruction set extensions for enabling SLM in a RISC-V based system. For this purpose, we introduce Path Transient Monitors (PTM) and Voltage Fluctuations Monitors (VFM) for monitoring path delay and voltage fluctuations. Using power wasters as a mean to inject voltage fluctuations in the FPGA system, we evaluate the abilities of this system to monitor chip degradation in early stages before system failure.

关键词： Silicon Lifecycle Management design-forTestability FPGA parametric testing in-field testing

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Safety-Relevant AI-Based system robustification with Neural Network Ensembles 30

Safety-Relevant AI-Based System Robustification with Neural ...

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30th ieee international symposium on On-line testing and robust system design (iolts)

作者： Aldoma, Adria Brando, Axel Cazorla, Francisco J. Abella, Jaume Barcelona Supercomp Ctr BSC Barcelona Spain Univ Politecn Catalunya UPC Barcelona Spain

Functional safety requirements of AI-based safety-critical applications challenge AI models, whose accuracy can be limited. In this paper, we show how using several cooperative deep learning (DL) models helps to raise... 详细信息

ISBN: (纸本)9798350370560;9798350370553

关键词： Neural network models

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On the Development of Prognostics and system Health Management (PHM) Techniques for ReRAM Applications 29

On the Development of Prognostics and System Health Manageme...

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29th ieee international symposium on on-line testing and robust system design (iolts)

作者： Cayo, Jose Melivilu, Matias Rubio, Antonio Vourkas, Ioannis Univ Tecn Federico Santa Maria Dept Elect Engn Valparaiso Chile

ISBN: (纸本)9798350341355

the resistive switching (RS) technology has many promising applications, but the inherent variability of RS devices has been an important obstacle for the progress towards mass production. Nonidealities of device switching performance have been widely modeled so far, and device degradation has been addressed through testing for fault diagnosis. However, online soft-error "prognosis" concerning both the progressive degradation and transition faults, has been given little consideration. In this direction, we present preliminary results towards the development of prognostics and system health management (PHM) techniques for resistive memory (ReRAM) applications. We propose addressing soft errors through a rich in context scheme used to encode binary information in form of resistance. In out simulations we assumed a ReRAM driver with multi-level READ capability and developed an enhanced progressive feedback-WRITE scheme to ensure not only successful WRITE and reliable READ operations, but also to permit the early online prognosis of potential device failure. Preliminary system-level simulation results validate the expected functionality and represent a reasonable approach towards the design of robust ReRAM controllers.

关键词： ARCOne memristor resistive switching resistive RAM ReRAM memory controller Knowm SDC Variability

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Artificial Neural Network Accelerator for Classification of In-Field Conducted Noise in Integrated Circuits' DC Power lines 29

Artificial Neural Network Accelerator for Classification of ...

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29th ieee international symposium on on-line testing and robust system design (iolts)

作者： Vargas, Fabian Borba, Douglas Benfica, Juliano D'ornelas Syed, Rizwan Tariq IHP Leibniz Inst High Performance Microelect Frankfurt Germany LABELO Specialized Elect Elect Labs Porto Alegre Brazil

ISBN: (纸本)9798350341355

With the growing use of embedded systems in our daily lives and the increasing electromagnetic noise level in the environment in which these systems are exposed, the need for reliable operation is paramount. In this scenario, this work presents a study on the use of Artificial Neural Networks (ANNs) to perform in-field identification and classification of different types of noise conducted in the integrated circuit (IC) DC power lines according to a specific set of IEC standards. After identification, proactive actions can be taken to guarantee the expected IC robustness. Such actions can be, for instance, slow down IC clock frequency, increasing power supply voltage and/or activating error detection & correction (EDAC) functions during the period the system is operating under such noise exposition. Experimental results demonstrate that the ANN was able to identify and classify different types of conducted noise in power supply lines with a success rate ranging from 70 to 100% within a latency in the order of 995 ns.

关键词： Conducted noise Electromagnetic interference (EMI) Transient fault Machine learning Signal integrity Artificial neural networks robust embedded system

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Silent Data Corruptions: the Stealthy Saboteurs of Digital Integrity 29

Silent Data Corruptions: The Stealthy Saboteurs of Digital I...

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29th ieee international symposium on on-line testing and robust system design (iolts)

作者： Papadimitriou, George Gizopoulos, Dimitris Dixit, Harish Dattatraya Sankar, Sriram Univ Athens Athens Greece Meta Platforms Inc Menlo Pk CA USA

ISBN: (纸本)9798350341355

Silent Data Corruptions (SDCs) pose a significant threat to the integrity of digital systems. these stealthy saboteurs silently corrupt data, remaining undetected by traditional error handling mechanisms. the silent nature of SDCs makes them challenging to trace at the hardware level, as they evade error reporting systems. Instead, their effects manifest at the application level, potentially causing data loss and system-wide issues. Detecting and measuring SDCs present unique challenges. their low occurrence rates, dependence on hardware structure and software workloads, and correlation to environmental factors make accurate measurement complex. Addressing SDCs requires proactive measures to prevent data corruption and ensure digital integrity. Software redundancy methods provide a means to tolerate SDCs by introducing duplication or triplication of application resources. However, these methods come with their own limitations, including increased code size, altered execution patterns, and potential vulnerability to other types of failures. Understanding the nature of SDCs and developing effective mitigation strategies are crucial for maintaining digital integrity in large-scale infrastructure services. this paper sheds light on the stealthy saboteurs that silently corrupt data, emphasizes the need for comprehensive measurement techniques, and explores the limitations of existing mitigation approaches. By addressing the challenges posed by SDCs, we can fortify digital systems against these hidden threats and ensure the reliability and integrity of our digital infrastructure.

关键词： Silent data corruptions system reliability microprocessors hardware reliability large scale infrastructure microarchitectural simulation and modeling fault injection failure rates

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iolts 2023 Foreword

Proceedings - 2023 IEEE 29th International Symposium on On-L...

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Proceedings - 2023 ieee 29th international symposium on On-line testing and robust system design, iolts 2023 2023年

作者： Gizopoulos, Dimitris Maniatakos, Michail Di Carlo, S. Savino, Alessandro University of Athens Greece NYU Abu Dhabi United States Politecnico di Torino Italy

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Radiation-Induced Errors in the Software Level of Real-Time Soft Processing system

Radiation-Induced Errors in the Software Level of Real-Time ...

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ieee symposium on On-line testing (iolts)

作者： Corrado De Sio Daniele Rizzieri Andrea Portaluri Salvatore G. La Greca Sarah Azimi Dipartimento di Automatica e Informatica (DAUIN) Politecnico di Torino Turin Italy

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