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检索条件"任意字段=2nd Conference on Technologies for Synthetic Environments - Hardware-in-the-Loop Testing"

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Now-term solutions to spatial, spectral, and temporal IR simulation with Wright Laboratory's Dynamic Infrared Missile Evaluator (DIME)

Now-term solutions to spatial, spectral, and temporal IR sim...

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2nd conference on technologies for synthetic environments - hardware-in-the-loop testing

作者： Courtney, RA Huber, EG Science Applications International Corp. (United States) Air Force Wright Lab. (United States)

ISBN: (纸本)0819424994

The introduction of spatial, spectral and temporal discrimination in IR seekers has greatly increased the level of sophistication required of hardware-in-the-loop test facilities. In the long term, LR scene projectors offer promise of meeting many of these requirements. However, Wright Laboratory's Dynamic Infrared Missile Evaluator (DIME) Facility has ongoing requirements to evaluate state-of-the-art IR seekers. This paper describes reliable and effective techniques integrated into the DIME to meet current requirements for testing seekers with spatial. spectral and temporal discrimination capabilities.

关键词： IR hardware-in-the-loop IR scene simulation spectral simulation flare temporal profile

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Optical signal injector system for HWIL testing of LADAR seekers

Optical signal injector system for HWIL testing of LADAR see...

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2nd conference on technologies for synthetic environments - hardware-in-the-loop testing

作者： Cornell, MC Naumann, CB Bergin, TP AEgis Research Corp. (United States) Air Force Wright Lab. (United States)

ISBN: (纸本)0819424994

An optical signal injector (OSI) system has been developed for use in the hardware-in-the-loop (HWIL) testing of laser radar (LADAR) seekers. The OSI, in conjunction with a scene generator, generates optical signals simulating the return signals of a LADAR seeker and delivers them to a Unit Under Test (UUT). The signals produced by the OSI represent range and intensity (reflectivity) data of a target scene from a given HWIL scenario. The OSI has a modular architecture to allow for easy modification (e.g., operating wavelength, number of optical channels) and is primarily composed of commercial off-the-shelf (COTS) components to improve reliability and reduce cost, Presented here is a description of the OSI and its capabilities.

关键词： laser radar scene projector laser radar LADAR hardware-in-the-loop simulation laser

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A simplified method for the hardware implementation of nonuniformity correction on a resistor array infrared scene projector

A simplified method for the hardware implementation of nonun...

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2nd conference on technologies for synthetic environments - hardware-in-the-loop testing

作者： Jones, LE Olson, EM Murrer, RL Andrews, AR Science Appl. International Corp. Shalimar FL 32579 60 2nd St. United States

ISBN: (纸本)0819424994

Ever increasing developments in imaging infrared (IR) seekers that are being designed for Ballistic Missile Defense Office (BMDO) guided interceptor programs have amplified the necessity for robust hardware-in-the loop (HWIL) testing to reduce program risk. Successful IR HWIL testing requires a high fidelity spatial, spectral, and temporal IR projector. Recent characterization measurements of a 512x512 metal-oxide semiconductor field-effect transistor (MOSFET) resistor array show that resistor array technology is a leading contender for the IR projector. As with any array device, nonuniform performance between individual elements of the array is a concern. This paper addresses a simplified approach to accomplishing the nonuniformity correction (NUC) of a resistor array in realtime. The first step in this process is to obtain a nominal output curve typical of the resistors' MOSFET output. The key feature of this simplified process is that all output curves specific to individual resistors can be related to this typical curve with a simple gain and offset correction. In practice, the inverse of the typical output curve is stored in a look-up table in order to obtain the required command for a desired output and then a correcting gain and offset are applied. Results from this process show great promise.

关键词： IR hardware-in-the-loop resistor array nonuniformity correction KHILS WISP GWEF

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Practical accuracy factors in resistor array infra-red scene projector systems

Practical accuracy factors in resistor array infra-red scene...

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2nd conference on technologies for synthetic environments - hardware-in-the-loop testing

作者： Pritchard, AP Venables, MA Lake, SP Gough, DW British Aerospace PLC (United Kingdom)

ISBN: (纸本)0819424994

This is the second in a series of papers describing an on-going investigation into the detailed performance of our resistor array infra-red scene projector devices and systems. The purpose is to extract understanding and information which will enable validation of simulations involving the systems, and design compromises to be resolved. Following last year's conclusions, the importance of Non Uniformity Correction is reinforced and the concept of Local Step Error and its importance is developed and investigated practically. A test methodology is developed, and the first steps in practical measurements are reported.

关键词： infra-red scene projectors resistor arrays hardware-in-the-loop simulation

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Spatial and sampling analysis for a sensor viewing a pixelized projector

Spatial and sampling analysis for a sensor viewing a pixeliz...

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2nd conference on technologies for synthetic environments - hardware-in-the-loop testing

作者： Sieglinger, B Flynn, DS Coker, CF Seeker Technologies Inc. (United States) Air Force Wright Lab. (United States)

ISBN: (纸本)0819424994

This paper presents an analysis of spatial blurring and sampling effects for a sensor viewing a pixelized scene projector. ft addresses the ability of a projector to simulate an arbitrary continuous radiance scene using a field of discrete elements. The spatial fidelity of the projector as seen by an imaging sensor is shown to depend critically on the width of the sensor MTF or spatial response function, and the angular spacing between projector pixels. Quantitative results are presented based on a simulation that compares the output of a sensor viewing a reference scene to the output of the sensor viewing a projector display of the reference scene. Dependence on the blur of the sensor and projector, the seem content, and alignment both of features in the scene and sensor samples with the projector pixel locations are addressed. We attempt to determine the projector characteristics required to perform hardware-in-the-loop testing with adequate spatial realism to evaluate seeker functions like autonomous detection, measuring radiant intensities and angular positions or unresolved objects, or performing autonomous recognition and aimpoint selection far resolved objects.

关键词： scene projector spatial effects aliasing hardware-in-the-loop prefiltering

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hardware-in-the-loop sensor emulation using a universal programmable interface

Hardware-in-the-loop sensor emulation using a universal prog...

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2nd conference on technologies for synthetic environments - hardware-in-the-loop testing

作者： Howe, DB Acevedo, PA Nuwer, ME Amherst Systems Inc. (United States)

ISBN: (纸本)0819424994

hardware-in-the-loop testing of IR/EO sensor systems requires the application of real-time IR/EO simulation/stimulation technology. Stimulation of the IR/EO system under test (SUT) can be achieved by either scene projection or by direct signal injection. Although less intrusive, projection technologies are (to date) somewhat immature, thus requiring the use of direct-injection approaches for many sensor test applications. Even where projection can be applied, direct-injection testing provides additional flexibility and test capabilities which can augment the projection-based testing. The development of multiple, system-specific sensor interfaces provides one solution, however it is a very costly approach in terms of bath time and money. What is needed is a reconfigurable, universal programmable interface (UPI), which can be utilized with minimal changes to stimulate a wide variety of IR/EO sensor systems. A UPI can also be utilized during the sensor development phase to evaluate and refine sensor designs. An opportunity now exists to leverage emerging trends in technology to develop such an interface, given a clear understanding of the processing and interface requirements. This paper discusses the development of processing and interface requirements for the UPI, as well as the resulting system design concept which will be used for its implementation.

关键词： infrared/electro-optic sensors simulation sensor emulation sensor modeling direct injection stimulation test and evaluation hardware-in-the-loop

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Recent progress in large dynamic resistor arrays

Recent progress in large dynamic resistor arrays

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2nd conference on technologies for synthetic environments - hardware-in-the-loop testing

作者： Cole, B Higashi, R Ridley, J Holmen, J Benser, E Stockbridge, R Murer, L Jones, L Burroughs, E Honeywell Inc. (United States) Air Force Wright Lab. (United States) Science Applications International Corp. (United States) U.S. Army Test and Evaluation Command (United States)

ISBN: (纸本)0819424994

An addressable mosaic array of resistively heated microbridges offers the potential to project accurate dynamic infrared (IR) imagery. The main purpose of this imagery is to be used in the evaluation of IR instruments from seekers to FLIRs. With the growing development of lower cost uncooled IR imagers, scene projectors also offer the potential for dynamic testing of these new instruments. In past years we have described developments in. variety of LR projectors systems designed for different purposes;In this paper we will describe recent developments in these technologies aimed at improving or understanding temporal and radiative performance.

关键词： IR hardware-in-the-loop 512x512 resistor array emitter pixel apparent temperature rise and fall rime

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Integrated three tiered approach to hardware-in-the-loop testing

Integrated three tiered approach to hardware-in-the-loop tes...

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2nd conference on technologies for synthetic environments - hardware-in-the-loop testing

作者： DeCesaris, C Millner, P Ballistic Missile Defense Organization (United States) SRS Technologies (United States)

ISBN: (纸本)0819424994

Flight testing of ballistic missile interceptors is limited by the complexity and costs of the test exercises, and inherent test limitations. While flight testing remains an essential part of ballistic missile weapon systems test programs, alternate test methods, such as hardware-in-the-loop (HWIL) testing, are used to fully characterize system operational characteristics. An integrated test approach that spans all levels of testing has been developed by the Ballistic Missile Defense Organization (BMDO) to characterize their developing and fielded weapon systems. The BMDO has developed an integrated three tiered HWIL testing concept to assess the performance of its acquisition programs. The three tiers are the element level which includes sub-element level testing of critical components, the weapon system level, and the family of systems (FoS) level. The objective of element level testing is to evaluate the performance of each element of the weapon system with emphasis on exercising the processing components of the element under test. Element level testing is focused on testing the internal interactions of each test element in a simulated environment. The objective of weapon system level is to evaluate the data exchange between the elements of the weapon system in an integrated, simulated operational environment. The primary purpose of FoS level testing is assessing the interoperability of ballistic missile defense (BMD) weapon systems, both under development and fielded. This paper examines the test processes and objectives which occur at each of the three HWIL tiers, describes facilities and testbeds BMDO is using to implement this approach, and discusses how data from each of the tiers is used to help address program flight test issues and reduce program risk.

关键词： BMDO HWIL TMDSE TMD NMD ISTC

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Real-time radiometric calculations utilizing SGI symmetric multiprocessing architecture

Real-time radiometric calculations utilizing SGI symmetric m...

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2nd conference on technologies for synthetic environments - hardware-in-the-loop testing

作者： Makar, RJ OToole, BE Rogers, PC Amherst Systems Inc. (United States)

ISBN: (纸本)0819424994

An approach to utilize the symmetric multiprocessing environment of the Silicon Graphics(R) (SGI) Onyx(TM) and Onyx2(TM) has been developed to support the generation of Infrared (IR) scenes in real-time. This development, supported by the Navy, is driven by a desire to maximize use of commercial-off-the-shelf (COTS) hardware and minimize cost and development time. In the past real-time IR scene generators have been developed as custom architectures that are expensive and difficult to maintain. An SGI based Real-time Infrared Scene Simulator (RISS) system was developed to utilize the SGI's fast symmetric multiprocessing hardware to perform real-time IR scene radiance calculations for scene objects. During real-time scene simulation, the SGI symmetric multiprocessors are used to update polygon vertex locations and compute radiometrically accurate floating point radiance values. The output of this process can be utilized to drive a variety of scene rendering engines including the SGI Reality Engine2(TM), the SGI InfiniteReality(TM), and Amherst Systems' custom Scene Rendering System (SRS). This paper will discuss the critical technologies that apply to infrared scene generation and hardware-in-the-loop testing using COTS hardware. Specifically, the application of RISS high-fidelity real time radiance algorithms on the SGI's symmetric multiprocessing hardware will be discussed. Also, issues relating to the integration of the real-time algorithms with various rendering engines and external real-time control will be addressed.

关键词： hardware-in-the-loop simulation infrared scene generator Silicon Graphics(R)

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Rendering energy conservative scenes in real-time

Rendering energy conservative scenes in real-time

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2nd conference on technologies for synthetic environments - hardware-in-the-loop testing

作者： Olson, EM Garbo, DL Crow, DR Coker, CF Science Applications International Corp. (United States) Kinetics Inc. (United States) Air Force Wright Lab. (United States)

ISBN: (纸本)0819424994

Real-time infrared (IR) scene generation for hardware-in-the-loop (HWIL) testing of iii seeker systems is a complex problem due to the required frame rates and Image fidelity. High frame rates are required for current generation seeker systems to perform designation, discrimination, identification, tracking, and aimpoint selection tasks. Computational requirements for IR signature phenomenology and sensor effects have been difficult to perform in real-time to support HWIL testing. Commercial scene generation hardware is rapidly improving and is becoming a viable solution for HWIL testing activities being conducted at the Kinetic Kill Vehicle hardware-in-the-loop Simulator (KHILS) facility at Eglin AFB, Florida. This paper presents computational techniques performed to overcame IR scene rendering errors incurred with commercially available hardware and software for real-time scene generation in support of HWIL testing. These techniques provide an acceptable solution to real-rime IR scene generation that strikes a balance between physical accuracy and image framing rates. The results of these techniques are investigated as they pertain to rendering accuracy and speed for target objects which begin as a point source during acquisition and develop into an extended source representation during aimpoint selection.

关键词： scene generation real-time rendering infrared hardware-in-the-loop antialiasing KHILS

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