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3rd conference on advances in x-ray/EUV optics and Components

作者： Bezirganyan, Hakob (Akop) P. Bezirganyan, Siranush E. Bezirganyan, Petros H., Jr. Bezirganyan, Hayk H., Jr. Yerevan State Univ 1 Alex Manoogian St Yerevan 0025 Armenia Yerevan State Med Univ Yerevan 0025 Armenia State Engn Univ Armenia Yerevan 0009 Armenia

ISBN: (纸本)9780819472977

We present in this theoretical paper a set-up of grazing-angle incidence hard x-ray nanoscope (GIxN), which is the essential part of ultra-high density digital data read-out device. The GIxN consists of the asymmetrically cut single crystal, which is operating like an image magnifier. The x-ray high-resolution diffractive optical lens (zone plate) and spatially resolving detector (CCD camera) are arranged like in classical schemes of the x-ray imaging microscopy. Proposed nanoscope operates based on grazing-angle incidence x-ray backscattering diffraction (GIxB) technique applied in the specular beam suppression mode. Grazing-angle incident x-ray configuration allows the handling of data from very large surface area of the x-ray optical memory disk (x-ROM) and, consequently, the data read-out speed is much faster than in optical data read-out systems.

关键词： theory x-ray optical memory ultra-high density data storage x-ray optical nanoscopy digital data read-out grazing-angle incidence x-ray backscattering diffraction specular beam suppression Mathieu functions

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Diamond detectors for x-ray spectroscopy

Diamond detectors for x-ray spectroscopy

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3rd conference on advances in x-ray/EUV optics and Components

作者： Allegrini, P. Girolami, M. Calvani, P. Conte, G. Salvatori, S. Spiriti, E. Ralchenko, V. Univ. Roma Tre INFN National Institute for Nuclear Physics (Italy) Natural Science Ctr. of General Physics Institute (Russian Federation)

ISBN: (纸本)9780819472977

Polycrystalline diamond detector prototypes suitable for x-ray spectroscopy were realized and tested. Thick diamond specimens, mechanically polished to reduce the surface roughness, were selected for prototypes development. Noble metal contacts were deposited on both faces, whereas multistrip structures were defined by photolithography on the growth face only with the aim of reducing the coupling capacitances and to allow characterization tests either in planar or sandwich configuration. Leakage currents as low as 20 pA at 500 V were measured on a 270 mu m thick device. The x-ray sensitivity was tested monitoring the photocurrent as a function of the applied voltage under continuous 8.05 keV Cu K alpha irradiation. Studies in pulsed mode were also performed by using a commercial miniature x-ray source. Pulse height distributions were carried out with a system composed of a charge-sensitive preamplifier and a digital pulse processor multi-channel analyzer. Analysis was carried out around Ta L alpha and Cu K alpha characteristic lines. Realized prototypes were able to resolve such two characteristic lines only 90 eV apart. Energy resolutions better than 3% have been evaluated for one of the prototype at 8.14 keV. Such features address very good energy resolving capabilities and the suitability of polished polycrystalline diamond in x-ray spectroscopy.

关键词： x-ray spectroscopy Polycrystalline diamond Pulse mode detectors Diamond based devices Pulse Height Distribution x-ray photocurrent Multistrip detectors Low-capacitance structures

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Fabrication and characterization of a new high density Sc/Si multilayer sliced grating

Fabrication and characterization of a new high density Sc/Si...

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3rd conference on advances in x-ray/EUV optics and Components

作者： Voronov, Dmitriy L. Cambie, Rossana Gullikson, Eric M. Yashchuk, Valeriy V. Padmore, Howard A. Pershin, Yuri P. Ponomarenko, Alexander G. Kondratenko, Valeriy V. Lawrence Berkeley Lab Adv Light Source Berkeley CA 94720 USA Natl Tech Univ KhPI UA-61002 Kharkov Ukraine

ISBN: (纸本)9780819472977

State of the art soft x-ray spectroscopy techniques like Resonant Inelastic x-ray Scattering (RIxS) require diffraction gratings which can provide extremely high spectral resolution of 10(5)-10(6). This problem may be addressed with a sliced multilayer grating with an ultra-high groove density (up to 50,000 mm(-1)) proposed in the recent publication [Voronov, D. L.. Cambie, R., Feshchenko, R. M., Gullikson, E., Padmore, H. A., Vinogradov, A. V., Yashchuk, V. V., Proc. SPIE 6705, 67050E (2007)]. It has been suggested to fabricate such a grating by deposition of a soft x-ray multilayer on a substrate which is a blazed saw-tooth grating (echellette) with low groove density. Subsequent polishing applied to the coated grating removes part of the coating and forms an oblique-cut multiline structure that is a sliced multilayer grating. The resulting grating has a short-scale periodicity of lines (bilayers), which is defined by the multilayer period and the oblique-cut angle. We fabricated and tested a Sc/Si multilayer sliced grating suitable for EUV applications, which is a first prototype based on the suggested technique. In order to fabricate an echellette substrate, we used anisotropic KOH etching of a Si wafer. The etching regime was optimized to obtain smooth and flat echellette facets. A Sc/Si multilayer was deposited by dc-magnetron sputtering, and after that it was mechanically polished using a number of diamond pastes. The resulting sliced grating prototype with similar to 270 nm line period has demonstrated a dispersive ability in the 41-49 nm photon wavelength range with a diffraction efficiency of similar to 7% for the optimized 38th order assigned to the echellette grating of 10 mu m period.

关键词： resonant inelastic x-ray scattering high density grating anisotropically etched silicon gratings soft x-ray multilayers sliced multilayer grating spectral resolution RIxS

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The new ESRF multilayer deposition facility

The new ESRF multilayer deposition facility

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conference on advances in x-ray/EUV optics and Components II

作者： Morawe, Ch. Borel, Ch. Peffen, J-Ch. European Synchrotron Radiat Facil F-38043 Grenoble France

ISBN: (纸本)9780819468536

Recently, the ESRF optics Group installed a new multilayer deposition facility. This upgrade was motivated by increasingly demanding requirements for multilayer based x-ray optics on modern 3rd generation synchrotron beamlines. Improved accuracy, stability, and reproducibility are key issues. The deposition process is based on non-reactive magnetron sputtering. The machine is equipped with four cathodes and one ion source for surface treatment. Conducting, insulating, and ferromagnetic materials can be deposited. A linear substrate motion will enable coatings up to 100 cm long and 15 cm wide. The talk will describe the basic concept of the machine and will give an overview of the operating conditions. Initial coating results will complement the presentation.

关键词： x-ray multilayers sputter deposition x-ray optics

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x-ray microscopy for NDE of micro- and nano-structures

X-ray microscopy for NDE of micro- and nano-structures

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3rd conference on Testing, Reliability, and Application of Micro and Nano-Material Systems

作者： Wang, S Duewer, F Feser, M Scott, D Yun, WB Xradia Inc Concord CA 94520 USA

ISBN: (纸本)0819457477

x-ray imaging offers a number of unique properties that are favorable for NDE applications, including large penetration depth, elemental specificity, and relatively low radiation damage. While direct-projection type x-ray systems with a few um resolution have been widely deployed, recent advances in x-ray optics and imaging methodology have lead to lens-based x-ray microscopes with better than 60-nm resolution, and with integrated 3D imaging and material analysis capabilities. Used independently or in combination with established techniques based on visible light and electron microscopy, these new high-resolution x-ray systems introduces many attractive new capabilities for studying structures at micrometer to tens-of-ran scale.

关键词： Nanostructured materials

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Fundamental parameters line profile fitting in laboratory diffractometers

Fundamental parameters line profile fitting in laboratory di...

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3rd conference on Accuracy in Powder Diffraction

作者： Cheary, RW Coelho, AA Cline, JP Univ Technol Sydney Sydney NSW 2007 Australia Bruker AXS D-76187 Karlsruhe Germany Natl Inst Stand & Technol Gaithersburg MD 20899 USA

The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes. Fundamental parameters profile fitting (FPPF) has been used to synthesize and fit data from both parallel beam and divergent beam diffractometers. The refined parameters are determined by the diffractometer configuration. In a divergent beam diffractometer these include the angular aperture of the divergence slit, the width and axial length of the receiving slit, the angular apertures of the axial Soller slits, the length and projected width of the x-ray source, the absorption coefficient and axial length of the sample. In a parallel beam system the principal parameters are the angular aperture of the equatorial analyser/Soller slits and the angular apertures of the axial Soller slits. The presence of a monochromator in the beam path is normally accommodated by modifying the wavelength spectrum and/or by changing one or more of the axial divergence parameters. Flat analyzer crystals have been incorporated into FPPF as a Lorentzian shaped angular acceptance function. One of the intrinsic benefits of the fundamental parameters approach is its adaptability any laboratory diffractometer. Good fits can normally be obtained over the whole 20 range without refinement using the known properties of the diffractometer, such as the slit sizes and diffractometer radius, and emission profile.

关键词： fundamental parameters microstructure analysis parafocusing optics profile convolution profile fitting x-ray powder diffraction

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Phase-contrast x-ray imaging with synchrotron radiation for materials science applications

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NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 2003年 199卷 427-435页

作者： Stevenson, AW Gureyev, TE Paganin, D Wilkins, SW Weitkamp, T Snigirev, A Rau, C Snigireva, I Youn, HS Dolbnya, IP Yun, W Lai, B Garrett, RF Cookson, DJ Hyodo, K Ando, M CSIRO Mfg & Infrastruct Technol Clayton Vic 3169 Australia Monash Univ Sch Phys & Mat Engn Clayton Vic 3800 Australia European Synchrotron Radiat Facil F-38043 Grenoble France Pohang Inst Sci & Technol Pohang Accelerator Lab POSTECH Pohang 790600 South Korea Xradia Concord CA 94520 USA Argonne Natl Lab Adv Photon Source Argonne IL 60439 USA Australian Nucl Sci & Technol Org Australian Synchrotron Res Program Menai NSW 2234 Australia Inst Mat Struct Sci Photon Factory High Energy Accelerator Res Org Tsukuba Ibaraki 3050801 Japan

Since Rontgen's discovery of x-rays just over a century ago the vast majority of radiographs have been collected and interpreted on the basis of absorption contrast and geometrical (ray) optics. Recently the possibility of obtaining new and complementary information in x-ray images by utilizing phase-contrast effects has received considerable attention, both in the laboratory context and at synchrotron sources (where much of this activity is a consequence of-the highly coherent x-ray beams which can be produced). Phase-contrast x-ray imaging is capable of providing improved information from weakly absorbing features in a sample, together with improved edge definition. Four different experimental arrangements for achieving phase contrast in the hard x-ray regime, for the purpose of non-destructive characterization of materials, will be described. Two of these, demonstrated at ESRF in France and AR in Japan, are based on parallel-beam geometry;the other two, demonstrated at PLS in Korea and APS in USA, are based on spherical-beam geometry. In each case quite different x-ray optical arrangements were used. Some image simulations will be employed to demonstrate salient features of hard x-ray phase-contrast imaging and examples. of results from each of the experiments will be shown. (C) 2002 Elsevier Science B.V. All rights reserved.

关键词： phase contrast x-ray imaging coherence x-ray optics

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Phase-contrast x-ray imaging with synchrotron radiation for materials science applications

Phase-contrast X-ray imaging with synchrotron radiation for ...

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3rd International conference on Synchrotron Radiation in Materials Science

关键词： phase contrast x-ray imaging coherence x-ray optics

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Innovative x-ray optics for laboratory

Innovative X-ray optics for laboratory

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3rd conference on advances in laboratory-based x-ray sources and optics

作者： Pina, L Inneman, A Hudec, R Ticha, H Arndt, UW Loxley, N Fraser, G Taylor, M Wall, J Reflex SRO Ctr Adv Xray Technol Prague 14200 4 Czech Republic

ISBN: (纸本)0819445487

We report on recent developments of innovative grazing incidence x-ray optics for laboratory applications. These efforts focus on the developments of grazing incidence micromirrors with ellipsoidal and paraboloidal profiles and apertures well below I mm, as well as on the developments of innovative arrangements and approaches such as x-ray collimators based on the Lobster Eye x-ray lenses. The applications of these elements will be indicated and discussed. Moreover, we will discuss the innovative alternative technologies for x-ray optics elements in study and-or under considerations.

关键词： x-rays Mirrors x-ray optics Micromirrors Grazing incidence x-ray technology Sensors Capillaries x-ray sources x-ray imaging

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Molybdenum microfocus source coupling to polycapillary optics for powder diffraction

Molybdenum microfocus source coupling to polycapillary optic...

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3rd conference on advances in laboratory-based x-ray sources and optics

作者： Mail, N Gibson, WM MacDonald, CA SUNY Albany Ctr Xray Opt Albany NY 12222 USA

ISBN: (纸本)0819445487

x rays emitted over a large angular range from conventional, laboratory-based sources can be transformed into a parallel beam or focused onto a small sample area to give efficient utilization of small sources for powder diffraction. For optimal system design, it is important that source parameters be well characterized. Source to window distance, spot size, intensity, and uniformity were measured for an Oxford Ultrabright Molybdenum source. Two polycapillary optics, a weakly focusing, and a collimating, optic were also characterized in detail. Measurements of x-ray diffraction data have been assessed for silicon and organic powders, and agree well with parameters predicted from the source and lens characterization.

关键词： Diffraction Molybdenum Copper Sensors x-ray optics Collimators Geometrical optics Silicon Optical testing Solids

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