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检索条件"任意字段=Bipolar/BiCMOS Circuits and Technology Meeting"
1104 条 记 录,以下是481-490 订阅
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Performance and Modeling of Si and SiGe for Power Amplifiers
Performance and Modeling of Si and SiGe for Power Amplifiers
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Topical meeting on Silicon Monolithic Integrated circuits in RF Systems
作者: Pete Zampardi Skyworks Solutions Inc. Newbury Park CA USA
There have been many demonstrations of Si and SiGe power amplifers (PAs) that have achieved good published performance. However, penetration of these technologies into the mainstream handset power amplifier market has... 详细信息
来源: 评论
Proceedings of the 2004 bipolar/bicmos circuits and technology meeting (IEEE Cat. No.04CH37593)
Proceedings of the 2004 Bipolar/BiCMOS Circuits and Technolo...
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bipolar/bicmos circuits and technology meeting
The following topics are dealt with: power amplifiers; high frequency circuits and techniques; SiGe HBT optimization; advanced device modeling; RF transceivers; RF circuit blocks; passive modeling and substrate effect...
来源: 评论
SiGe bicmos technology with 3.0 ps Gate Delay
SiGe BiCMOS Technology with 3.0 ps Gate Delay
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International Electron Devices meeting (IEDM)
作者: H. Rucker B. Heinemann R. Barth J. Bauer K. Blum D. Bolze J. Drews G. G. Fischer A. Fox O. Fursenko T. Grabolla U. Haak W. Hoppner D. Knoll K. Kopke B. Kuck A. Mai S. Marschmeyer T. Morgenstern H. H. Richter P. Schley D. Schmidt K. Schulz B. Tillack G. Weidner W. Winkler D. Wolansky H.-E. Wulf Y. Yamamototo IHP Frankfurt (Oder) Germany
This work reports on a 130 nm bicmos technology with high-speed SiGe:C HBTs featuring a transit frequency of 255 GHz and a maximum oscillation frequency of 315 GHz at an emitter area of 0.17 x 0.53 mum 2 . A minimum g... 详细信息
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The Impact of Guard Rings on Proton Radiation Effects in SiGe HBTs
The Impact of Guard Rings on Proton Radiation Effects in SiG...
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Topical meeting on Silicon Monolithic Integrated circuits in RF Systems
作者: Ningyue Jiang Zhenqiang Ma Department of Electrical and Computer Engineering University of Wisconsin Madison Madison WI USA
The effects of proton radiation on SiGe HBTs with guard rings are investigated in this work. DC measurements on pre- and post-radiated devices show that different effects on the forward-mode and on the inverse-mode Gu... 详细信息
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Integrated bicmos 10 GHz S-parameter module
Integrated BiCMOS 10 GHz S-parameter module
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2006 bipolar/bicmos circuits and technology meeting
作者: Yoon, Jangsup Fox, Robert M. Eisenstadt, William R. Department of Electrical and Computer Engineering University of Florida Gainesville FL 32611-6130
The paper presents integrated bicmos 10 GHz s-parameter measurement circuits for performing RF/Microwave signal gain and phase detection. Potential applications include embedded IC test and production IC test. © ... 详细信息
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Simultaneous extraction of collector and substrate series resistance by simple DC measurement
Simultaneous extraction of collector and substrate series re...
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2006 bipolar/bicmos circuits and technology meeting
作者: Tianbing, Chen Krakowski, Tracey L. Strachan, Andy Yun, Liu Sadovnikov, Alexei Babcock, Jeff National Semiconductor Corporation 2900 Semiconductor Drive Santa Clara CA 95052-8090 United States
A new forced emitter current method Is proposed for the simultaneous measurement of collector and substrate series resistance in bipolar transistors. Compared with conventional series resistance extraction method, thi... 详细信息
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Demonstration of three-dimensional 35nF/mm2 MIM Capacitor integrated in bicmos circuits
Demonstration of three-dimensional 35nF/mm2 MIM Capacitor in...
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2006 bipolar/bicmos circuits and technology meeting
作者: Giraudin, J.C. Badets, F. Blanc, J.P. Chataigner, E. Bajolet, A. Jagueneau, T. Rossato, C. Delpech, P. STMicroelectronics 850 rue Jean Monnet F-38926 Crolles Cedex France IMEP 3 parvis Louis Neel F-38016 Grenoble Cedex France
This paper summarizes the electrical characterization of MIM capacitor realized in three-dimensional. High density of 35nF/mm2 is obtained with low leakage current. Its integration in bicmos technology is demonstrated... 详细信息
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High RF performances asymmetric spacer NLDMOS integration in a 0.25μm SiGe:C bicmos technology
High RF performances asymmetric spacer NLDMOS integration in...
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2006 bipolar/bicmos circuits and technology meeting
作者: Szelag, Bertrand Muller, Dorothée Mourier, Jocelyne Arnaud, Caroline Bilgen, Halim Judong, Fabienne Giry, Alexandre Pache, Denis Monroy, Agustin STMicroelectronics Centre Commun de Microélectronique de Crolles BP16 F-38921 Crolles France
An asymmetrical spacer LDMOSFET integrated in a 0.25μm bicmos technology is presented. Improved RF performances are obtained with this new architecture: fT close to 35GHz with BVds larger than 15V. Process integratio... 详细信息
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RF switch on standard SiGe-CMOS technology for system-on-a-chip radio transceivers
RF switch on standard SiGe-CMOS technology for system-on-a-c...
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2006 bipolar/bicmos circuits and technology meeting
作者: Zito, Domenico Neri, Bruno University of Pisa 1-56122 Pisa Italy
The design of a fully integrated RF switch on standard SiGe-CMOS technology is presented and discussed. A case study for 5-GHz indoor WLAN applications is reported. It allows on-chip T/R antenna switching operations p... 详细信息
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Influence of the Ge profile on vBE and current gain mismatch in Advanced SiGe bicmos NPN HBT with 200 GHz fT
Influence of the Ge profile on vBE and current gain mismatch...
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2006 bipolar/bicmos circuits and technology meeting
作者: Dahlström, M. Walter, K. Von Bruns, S. Malladi, R.M. Newton, Kim M. Joseph, A.J. IBM Microelectronics Division IBM Bldg. 972D Essex Junction VT 05452
Transistor mismatch is a key parameter for the design and operation of advanced analog circuits. We present for the first time data from several generations of bicmos technology nodes for VBE and current gain (β) mis... 详细信息
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