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检索条件"任意字段=Bipolar/BiCMOS Circuits and Technology Meeting"
1106 条 记 录,以下是641-650 订阅
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Optimization of vertical profiles of SiGe HBT/bicmos by promoting emitter diffusion process
Optimization of vertical profiles of SiGe HBT/BiCMOS by prom...
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bipolar/bicmos circuits and technology meeting
作者: M. Miura H. Shimamoto R. Hayami A. Kodama T. Tominari T. Hashimoto K. Washio Central Research Laboratory Hitachi and Limited Kokubunji Tokyo Japan Renesas Northern Japan Semiconductor Inc. Japan Device Development Center Hitachi and Limited Tokyo Japan
A new concept, promoting emitter diffusion (PED) process, by using high-temperature annealing, is proposed for fabricating high-performance SiGe HBTs. Both the cut-off frequency and maximum oscillation frequency excee... 详细信息
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Differential distributed amplifier and oscillator in SiGe bicmos using close-packed interleaved on-chip transmission lines
Differential distributed amplifier and oscillator in SiGe Bi...
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bipolar/bicmos circuits and technology meeting
作者: D. Guckenberger K.T. Kornegay Cornell Broadband Communications Research Laboratory Cornell University Ithaca NY USA
A monolithic differential distributed amplifier using close-packed, shielded, meandered transmission lines and a delay-matched rotationally symmetric amplifier cell is implemented using a SiGe bicmos process with an f... 详细信息
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Lateral and vertical scaling of a QSA HBT for a 0.13/spl mu/m 200GHz SiGe:C bicmos technology
Lateral and vertical scaling of a QSA HBT for a 0.13/spl mu/...
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bipolar/bicmos circuits and technology meeting
作者: S. Van Huylenbroeck A. Sibaja-Hernandez A. Piontek L.J. Choi M.W. Xu N. Ouassif F. Vleugels K. Van Wichelen L. Witters E. Kunnen P. Leray K. Devriendt X. Shi R. Loo S. Decoutere IMEC Leuven Belgium ESAT K.U. Leuven Leuven Belgium
A 200 GHz F/sub t/ SiGe:C HBT has been integrated into a 0.13 /spl mu/m bicmos technology. A previous generation low complexity quasi self-aligned architecture (QSA) is scaled down both in a lateral and vertical way. ... 详细信息
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An investigation of the RF/analog characteristics of multiple variants SiGe HBTs for optical and wireless applications
An investigation of the RF/analog characteristics of multipl...
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bipolar/bicmos circuits and technology meeting
作者: M.T. Yang D.C.W. Kuo P.P.C. Ho C.W. Kuo T.J. Yeh A.K.L. Chang C.Y. Lee Y.T. Chia G.J. Chern K.L. Young D.D. Tang J.Y.C. Sun Taiwan Semiconductor Manufacturing Company Limited Hsinchu Taiwan
Multiple variants of SiGe HBTs, using selected collector implants, suitable for wired and wireless applications were explored. The RF/analog characteristics of HBTs featured with fT/BV/sub CEO/ values of 130 GHz/2.3 V... 详细信息
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Fully-integrated WCDMA direct conversion SiGeC bicmos receiver
Fully-integrated WCDMA direct conversion SiGeC BiCMOS receiv...
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bipolar/bicmos circuits and technology meeting
作者: P. Garcia B. Pellat J.-P. Blanc P. Persechini V. Knopik L. Baud F. Goussin D. Thevenet S. Majcherczak F. Reaute O. Richard P. Conti B. Szelag D. Belot Analog RF Design Group-CR&D STMicroelectronics Crolles France Advanced System Technology-39 ST Microelectronics N.V. Geneva Switzerland
This paper describes a WCDMA direct conversion receiver which has been integrated in a bicmos SiGe-carbon process featuring 0.25 /spl mu/m/f/sub T/=60 GHz bipolar transistors. This receiver includes an integrated RF-f... 详细信息
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QUBiC4X: An f/sub T//f/sub max/ = 130/140GHz SiGe:C-bicmos manufacturing technology witg elite passives for emerging microwave applications
QUBiC4X: An f/sub T//f/sub max/ = 130/140GHz SiGe:C-BiCMOS m...
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bipolar/bicmos circuits and technology meeting
作者: P. Deixler A. Rodriguez W. De Boer H. Sun R. Colclaser D. Bower N. Bell A. Yao R. Brock Y. Bouttement G.A.M. Hurkx L.F. Tiemeijer J.C.J. Paasschens H.G.A. Huizing D.M.H. Hartskeerl P. Agrarwal P.H.C. Magnee E. Aksen J.W. Slotboom Philips Semiconductors NY USA Philips RF Device Modeling Group San Jose USA Philips RF Modeling Group Caen France Philips Research Leuven Leuven Belgium Philips Natlab Eindhoven The Netherlands Univ. Delft Netherlands
QUBiC4X is a cost-effective ultra-high-speed SiGe:C RF-bicmos technology for emerging microwave applications with NPN f{sub}T/f{sub}(max) up to 130/140GHz, enhanced RF-oriented 2.5V CMOS, SiGe:C Power Amplifiers with ... 详细信息
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Advances in SiGe HBT bicmos technology
Advances in SiGe HBT BiCMOS technology
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Topical meeting on Silicon Monolithic Integrated circuits in RF Systems
作者: A. Joseph L. Lanzerotti X. Liu D. Sheridan J. Johnson Q. Liu J. Dunn J.-S. Rieh D. Harame IBM Microelectronics Division Semiconductor Research and Development Center Essex Junction VT USA IBM Microelectronics Division Semiconductor Research and Development Center Hopewell Junction NY USA
Silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) bicmos technology has established a strong foothold in the communications marketplace by offering a cost competitive solution for a myriad of products. ... 详细信息
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A comparison of Si CMOS, SiGe bicmos, and InP HBT technologies for high-speed and millimeter-wave ICs
A comparison of Si CMOS, SiGe BiCMOS, and InP HBT technologi...
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Topical meeting on Silicon Monolithic Integrated circuits in RF Systems
作者: S.P. Voinigescu T.O. Dickson R. Beerkens I. Khalid P. Westergaard Edward S. Rogers Department of Electrical & Computer Engineering University of Toronto Toronto ONT Canada
The paper presents an overview of Si MOSFET, SiGe HBT, and InP HBT device and circuit performance for broadband and tuned millimeter-wave applications. Implementations of CMOS-only, SiGe-HBT-only, SiGe bicmos, and InP... 详细信息
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Mechanical planar biaxial strain effects in Si/SiGe HBT bicmos technology
Mechanical planar biaxial strain effects in Si/SiGe HBT BiCM...
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Topical meeting on Silicon Monolithic Integrated circuits in RF Systems
作者: M.B. Nayeem B.M. Haugerud R. Krithivasan Yuan Lu Chendong Zhu R.E. Belford J.D. Cressler A.J. Joseph School of Electrical and Computer Engineering Georgia Institute of Technology Atlanta GA USA Belford Research Inc. Hilton Head SC USA IBM Essex Junction VT USA
The first results of the effects of mechanical planar biaxial tensile strain applied, post fabrication, to Si/SiGe HBT bicmos technology are reported in this work. Planar biaxial tensile strain was applied to the samp... 详细信息
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Speed and power performance comparison of state-of-the-art CMOS and SiGe RF transistors
Speed and power performance comparison of state-of-the-art C...
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Topical meeting on Silicon Monolithic Integrated circuits in RF Systems
作者: B. Jagannathan D. Greenberg D.I. Sanderson J.-S. Rieh J. Pekarik J.O. Plouchart G. Freeman SRDC Microelectronics Division IBM USA
DC and RF characteristics of Si nFETs and SiGe HBTs are compared in IBM's leading-edge production RFCMOS and bicmos technologies at 90 and 130 nm nodes respectively. Underlying performance trade-offs to achieve lo... 详细信息
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