Demands for increased interconnection density and higher bandwidth, coupled with stringent cost constrains of advanced wide bandwidth telecommunication switching and high throughput computer architectures, are exhaust...
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ISBN:
(纸本)0780312635
Demands for increased interconnection density and higher bandwidth, coupled with stringent cost constrains of advanced wide bandwidth telecommunication switching and high throughput computer architectures, are exhausting conventional electrical interconnection techniques. The requirement for greater interconnection performance, spawned in part by the advances in integrated circuit technologies and the need for enhanced digital services (such as multi media), dictate that technology advancement must occur in traditional electronic packaging and/or interconnection schemes. Presently, a `bottle-neck' occurs at the board-to-board level of the interconnection hierarchy. Therefore, an opportunity exists for the development of new parallel optical interconnection techniques which can be incorporated into system designs beginning at this interconnection level and beyond.
Transition metal compounds are finding increasing use in decorative coatings, combining intense colour, high wear resistance and good corrosion resistance. From the decorative point of view, colour and gloss are the m...
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Transition metal compounds are finding increasing use in decorative coatings, combining intense colour, high wear resistance and good corrosion resistance. From the decorative point of view, colour and gloss are the most important features. The physiological colour impression is well described by the CIE-L*a*b colour space. Integrating sphere measurement (ISM) and goniospectroscopy (GS) derive colours from a measurement of the spectral reflectance factor R(lambda) relative to a white reference. Spectroscopic ellipsometry (SE) is a reference-free technique for measuring amplitude ratios and phase changes of polarized light upon specular reflectance. ISMs of (Zr,Y)N coatings are presented, which show considerable yellow and red values at intermediate lightnesses. The effect of the surface roughness is discussed for TiN coatings. The angular dependence of L*a*b* and the behaviour of R(lambda) are shown by means of GS for these TiN coatings in off-specular directions. These results of ISM and GS are compared with the SE data. The high sensitivity of SE to changes in stoichiometry as well as the capability of separating additional interference effects are demonstrated for (Zr,Cr)N and (Zr,Al)N coatings. However, it is shown especially in the case of rough surfaces that each technique is helpful in distinguishing features of physical and physiological interest.
The grand challenges of science and industry that are driving computing and communications have created corresponding challenges in information storage and retrieval. An industry-led collaborative project has been org...
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ISBN:
(纸本)0819409642
The grand challenges of science and industry that are driving computing and communications have created corresponding challenges in information storage and retrieval. An industry-led collaborative project has been organized to investigate technology for storage systems that will be the future repositories of national information assets. Industry participants are IBM Federal Systems Company, Ampex Recording Systems Corporation, General Atomics DISCOS Division, IBM ADSTAR, Maximum Strategy Corporation, Network Systems Corporation, and Zitel Corporation. Industry members of the collaborative project are funding their own participation. Lawrence Livermore National Laboratory through its National Energy Research Supercomputer Center (NERSC) will participate in the project as the operational site and provider of applications. The expected result is the creation of a National storage Laboratory to serve as a prototype and demonstration facility. It is expected that this prototype will represent a significant advance in the technology for distributed storage systems capable of handling gigabyte-class files at gigabit-per-second data rates. Specifically, the collaboration expects to make significant advances in hardware, software, and systems technology in four areas of need, (1) network-attached high performance storage;(2) multiple, dynamic, distributed storage hierarchies;(3) layered access to storage system services;and (4) storage system management.
PIPADS is a vertically integrated parallel image processing and display system designed for interactive visualisation and processing of large geosdentific data sets arising from remote sensing or computational modelli...
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The acquisition and digital storage of analog turbulent signals is optimized with respect to minimal data handling. A best anti-aliasing filter and optimum settings of the A/D converter are found by simulating a turbu...
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ISBN:
(纸本)0819413119
The acquisition and digital storage of analog turbulent signals is optimized with respect to minimal data handling. A best anti-aliasing filter and optimum settings of the A/D converter are found by simulating a turbulent signal digitally and calculation of the distortion under different circumstances.
Current models for optical fiber reliability are mostly based upon power law growth kinetics of sharp, stress-free cracks. The physical basis of these models is critically examined and is found to have limitations in ...
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ISBN:
(纸本)0819412198
Current models for optical fiber reliability are mostly based upon power law growth kinetics of sharp, stress-free cracks. The physical basis of these models is critically examined and is found to have limitations in describing the behavior of both high strength `pristine' fiber and weak fiber. In particular, the models do not account for the abrupt strength loss sometimes observed in harsh environments for both types of fiber. Recent advances in understanding the behavior of such fibers are discussed. In particular the addition of colloidal silica particles to the coating material is shown to dramatically improve reliability.
A medical record consists of heterogeneous types of data generated from different diagnostic and monitoring modalities. advances in multimedia technology have made possible the capturing, storage and visualisation of ...
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Charge trapping in thin films of silicon nitride has long been studied for use as a non-volatile semiconductor memory. Recently, this technology has been combined with scanned probe technologies with the sharp probe t...
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ISBN:
(纸本)0819410810
Charge trapping in thin films of silicon nitride has long been studied for use as a non-volatile semiconductor memory. Recently, this technology has been combined with scanned probe technologies with the sharp probe tip serving as the upper electrode in a Si3N4- SiO2Si (NOS) structure. By applying a voltage pulse between the tip and silicon substrate, charge carriers can be made to tunnel through the oxide and be trapped in the nitride. This trapped charge causes a shift in the capacitance-voltage curve along the voltage axis; the voltage at which depletion occurs is increased. It has been proposed that such a system could be used as a high density datastorage device. We have begun to explore some of the issues related to such an application, including data lifetime and data rates. In thermally accelerated life tests, no sign of charge spreading was seen after 100 days at 150 degree(s)C and from the rate of charge decay we would predict room temperature lifetimes in excess of 1 million years. We have also used an air-bearing spindle to conduct high speed measurements on a spinning NOS sample and obtained data rates as high as 500 kHz with carrier-to-noise ratios of approximately 60 dB in a 3 kHz bandwidth.
We consider the implementation of high capacity Ho-Kashyap associative processors on non- ideal optical and analog VLSI systems. Processor non-idealities considered include quantization, non-uniform beam illumination,...
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ISBN:
(纸本)0819412759
We consider the implementation of high capacity Ho-Kashyap associative processors on non- ideal optical and analog VLSI systems. Processor non-idealities considered include quantization, non-uniform beam illumination, and nonlinear device characteristics. New training-out techniques to overcome these non-idealities are advanced. We obtain optimal performance in the presence of stochastic noise by proper selection of the processor parameter (sigma) syn. We derive important results that allow us to a priori determine the optimal value of (sigma) syn and the expected recall accuracy P'c without having to simulate the specific processor. We present a new algorithm that allow us to achieve storage near the theoretical maximum capacity (2N, where N is the dimensionality of the input vector) with excellent recall accuracy. optical laboratory results are included. We achieved storage of 1.5 N with recall accuracy P'c >= 95% with input noise of standard deviation (omega) 1 equals 0.02 present and with optical analog components with 5 bit input accuracy and 8 bit memory matrix accuracy. With higher accuracy analog VLSI components (10 bit input accuracy and 11 bit weight accuracy), we achieve storage of 1.75 N with P'c equals 96.43%.
The in-flight calibration of the EOS Multi-angle Imaging SpectroRadiometer (MISR) will be achieved, in part, by observing deployable Spectralon panels. This material reflects light diffusely, and allows all cameras to...
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ISBN:
(纸本)0819411744
The in-flight calibration of the EOS Multi-angle Imaging SpectroRadiometer (MISR) will be achieved, in part, by observing deployable Spectralon panels. This material reflects light diffusely, and allows all cameras to view a near constant radiance field. This is particularly true when a panel is illuminated near the surface normal. To meet the challenging MISR calibration requirements, however, very accurate knowledge of the panel reflectance must be known for all utilized angles of illumination, and for all camera and monitoring photodiode view angles. It is believed that model predictions of the panels bidirectional reflectance distribution function (BRDF) can be used in conjunction with a measurements program to provide the required characterization. This paper describes the results of a model inversion which was conducted using measured Spectralon BRDF data at several illumination angles. Four physical parameters of the material were retrieved, and are available for use with the model to predict reflectance for any arbitrary illumination or view angle. With these data the root mean square difference between the model and the observations is currently of the order of the noise in the data, at about +/- 1%. With this success the model will now be used in a variety of future studies, including the development of a measurements test plan, the validation of these data, and the prediction of a new BRDF profile, should the material degrade in space.
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