Retinal examination using direct ophthalmoscope is preferred over other techniques for screening purposes because of its portability and high magnification, despite its power sustainability and cost issues. With incre...
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ISBN:
(数字)9781510629028
ISBN:
(纸本)9781510629028
Retinal examination using direct ophthalmoscope is preferred over other techniques for screening purposes because of its portability and high magnification, despite its power sustainability and cost issues. With increasing number of low-cost sustainable devices available in the market, it is important to assess the efficacy of the devices. We compared three devices - Arclight ophthalmoscope, a D-Eye attached to iPhone 6, and conventional ophthalmoscope Heine K180 - in terms of ease of examination, usage, field of view, color rendition, patient comfort, length of examination, and closeness to the eye. Two trained optometrists examined 26 undilated eyes and graded the ease of retinal examination, ease of use and assessed vertical cup:disc ratio (VCDR). Patients reported their comfort level in terms of glare produced by the light source, length of examination and closeness to the eye. The examiners had a good agreement for all assessments. Of 26 eyes, VCDR assessment was not possible in 10/ 26 (38.4%) of the examinations, in (3/26, 11.5%) examinations with Arclight, in 0/26 examinations with D-Eye. Ease of use score was higher for Arclight and D-Eye than Heine. D-Eye had a relatively larger field of view than other 2 devices. Heine ranked first in color rendition. The luminance level of the high-beam setting of Arclight was more than twice that of Heine and D-Eye. Despite that, the patients reported experiencing uncomfortable glare in Heine (14/26, 53.8%), significant glare with Arclight (16/26, 61.5%) and some/no glare with D-Eye. The examination time was shorter when using D-Eye. Overall, D-Eye scored better in most of the evaluation items followed by Arclight.
A multi-band pass filter array was proposed and designed for short wave infrared applications. The central wavelength of the multi-band pass filters are located about 905 nm, 950 nm, 1055 nm and 1550 nm. In the simula...
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ISBN:
(纸本)9781510612082;9781510612075
A multi-band pass filter array was proposed and designed for short wave infrared applications. The central wavelength of the multi-band pass filters are located about 905 nm, 950 nm, 1055 nm and 1550 nm. In the simulation of an optical interference band pass filter, high spectrum performance (high transmittance ratio between the pass band and stop band) relies on (1) the index gap between the selected high/low-index film materials, with a larger gap correlated to higher performance, and (2) sufficient repeated periods of high/low-index thin-film layers. When determining high and low refractive index materials, spectrum performance was improved by increasing repeated periods. Consequently, the total film thickness increases rapidly. In some cases, a thick total film thickness is difficult to process in practice, especially when incorporating photolithography liftoff. Actually the maximal thickness of the photoresist being able to liftoff will bound the total film thickness of the band pass filter. For the application of the short wave infrared with the wavelength range from 900nm to 1700nm, silicone was chosen as a high refractive index material. Different from other dielectric materials used in the visible range, silicone has a higher absorptance in the visible range opposite to higher transmission in the short wave infrared. In other words, designing band pass filters based on silicone as a high refractive index material film could not obtain a better spectrum performance than conventional high index materials like TiO2 or Ta2O5, but also its material cost would reduce about half compared to the total film thickness with the conventional material TiO2. Through the simulation and several experimental trials, the total film thickness below 4 um was practicable and reasonable. The fabrication of the filters was employed a dual electric gun deposition system with ion assisted deposition after the lithography process. Repeating four times of lithography and deposition p
Thermal imaging is an important, though challenging, diagnostic for shockwave experiments. Shock-compressed materials undergo transient temperature changes that cannot be recorded with standard (greater than ins respo...
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ISBN:
(纸本)0819463671
Thermal imaging is an important, though challenging, diagnostic for shockwave experiments. Shock-compressed materials undergo transient temperature changes that cannot be recorded with standard (greater than ins response time) infrared detectors. A farther complication arises when optical elements near the experiment are destroyed. We have designed a thermal-imaging system for studying shock temperatures produced inside a gas gun at Sandia National Laboratories. Inexpensive, diamond-turned, parabolic mirrors relay an image of the shocked target to the exterior of the gas gun chamber through a sapphire vacuum port. The 3000-5000-nm portion of this image is directed to an infrared camera which acquires a snapshot of the target with a minimum exposure time of 150 us. A special mask is inserted at the last intermediate image plane, to provide dynamic thermal background recording during the event. Other wavelength bands of this image are split into high-speed detectors operating at 900-1700 nm and at 1700-3000 nm, for time-resolved pyrometry measurements. This system incorporates 90-degree, off-axis parabolic mirrors, which can collect low f/# light over a broad spectral range, for high-speed imaging. Matched mirror pairs must be used so that aberrations cancel. To eliminate image plane tilt, proper tip-to-tip orientation of the parabolic mirrors is required. If one parabolic mirror is rotated 180 degrees about the optical axis connecting the pair of parabolic mirrors, the resulting image is tilted by 60 degrees. Different focal-length mirrors cannot be used to magnify the image without substantially sacrificing image quality. This paper analyzes performance and aberrations of this imaging diagnostic.
In this paper, we report on currentdevelopments aimed at improving the focusability of the Texas Petawatt Laser. Two major campaigns have been commissioned that address the issue of focusability. First, we implemente...
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ISBN:
(纸本)9780819484505
In this paper, we report on currentdevelopments aimed at improving the focusability of the Texas Petawatt Laser. Two major campaigns have been commissioned that address the issue of focusability. First, we implemented a closed loop, 32 actuator bi-moprh deformable mirror (DFM) to compensate for aberrations in the optical train and second, a color corrector lens assembly was installed that compensates for chromatic errors accumulated in broadband (>15 nm), large aperture (> 20 cm) laser systems. We will present in detail, pre and post correction results with the DFM and describe challenges faced when one activates a single shot, high energy closed loop system. Secondly, we will provide modeling and experimental results of our color correction system. This is a novel approach to a problem only seen in high energy, broadband, large aperture laser pulses. By using color correction optics we have demonstrated a 6X increase in focal intensity. With the installation of the DFM, the rms wavefront error in the system was reduced from 2.4 waves to. 131 waves, further increasing intensities seen at focus by 1 order of magnitude.
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