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检索条件"任意字段=Conference on Design, Modeling, and Simulation in Microelectronics"

共 1418 条记录，以下是121-130 订阅

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modeling and design of 700W Digital Average Current Mode Controlled Multiphase Bidirectional DC-DC Converter

Modeling and Design of 700W Digital Average Current Mode Con...

引用

IEEE Asia Pacific conference on Postgraduate Research in microelectronics and Electronics (PrimeAsia)

作者： Suryanarayana, K. Nagaraja, H. N. NMAM Inst Technol Dept Elect & Elect Nitte 574110 India Noble Grp Inst Junagadh 362310 Gujarat India

ISBN: (纸本)9781509001361

Mathematical modeling and analysis of converters is an essential and critical phase in the design stage of the system. High current switching and inductor ripple causes electromagnetic interference in the system. Paralleling of the converters and smart switching control will reduce the stress on the converter switches. Substantial ripple reduction in the source and load current can be achieved by optimally choosing the transfer ratio. Multiphase technique increases the ripple frequency resulting in lesser filter requirements. A two phase bidirectional converter operating in continuous current conduction mode is modeled and digital average current mode control technique is proposed to regulate the output voltage. A 700 watt system is designed and the simulation and experimental results are presented.

关键词： multiphase converter mathematical modeling average current mode control frequency response feedback system

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Loss Behavioral modeling for Ferrite Inductors 15

Loss Behavioral Modeling for Ferrite Inductors

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15th International conference on Synthesis, modeling, Analysis and simulation Methods and Applications to Circuit design (SMACD) / 14th conference on PhD Research in microelectronics and Electronics (PRIME)

作者： Di Capua, Giulia Femia, Nicola Stoyka, Kateryna Univ Salerno DIEM Fisciano SA Italy

ISBN: (纸本)9781538651537

This paper presents a new behavioral model of AC power loss for Ferrite Power Inductors (FPIs) used in Switch-Mode Power Supply (SMPS) applications, including the effects of saturation. The model has been identified by means of a genetic programming algorithm and a multi-objective optimization technique, given a large sets of power loss experimental measurements. The proposed AC power loss model uses the voltage and switching frequency imposed to the inductor as input variables, while the DC inductor current is used as a parameter expressing the impact of saturation. Experimental results prove the reliability of the power loss predictions for FPIs, also by correctly accounting for the impact of saturation.

关键词： Power Inductors Ferrite Cores Saturation Power Loss modeling Genetic Programming

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Lithography Hotspots Detection Using Deep Learning 15

Lithography Hotspots Detection Using Deep Learning

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作者： Borisov, Vadim Scheible, Juergen Reutlingen Univ Robert Bosch Ctr Power Elect Reutlingen Germany

ISBN: (纸本)9781538651537

The hotspot detection has received much attention in the recent years due to a substantial mismatch between lithography wavelength and semiconductor technology feature size. This mismatch causes diffraction when transferring the layout from design onto a silicon wafer. As a result, open or short circuits (i.e. lithography hotspots) are more likely to be produced. Additionally, increasing numbers of semiconductors devices on a wafer required more time for the lithography hotspot detection analysis. In this work, we propose a fast and accurate solution based on novel artificial neural network (ANN) architecture for precise lithography hotspot detection using a convolution neural network (CNN) adopting a state-of-the-art technique. The experimental results showed that the proposed model gained accuracy improvement over current state-of-the-art approaches. The final code has been made publicly available.

关键词： Lithography Convolution Training Kernel Solid modeling Feature extraction Neurons"

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Efficient Hotspot Thermal simulation via Low-Rank Model Order Reduction 15

Efficient Hotspot Thermal Simulation via Low-Rank Model Orde...

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作者： Floros, George Evmorfopoulos, Nestor Stamoulis, George Univ Thessaly Dept Elect & Comp Engn Volos Greece

ISBN: (纸本)9781538651537

Efficient full-chip thermal simulation is among the most challenging problems facing the EDA industry today, due to the need for solution of very large systems of equations that require unreasonably long computational times. However, in most cases, temperature is not required to be computed at every point of the IC but only at certain hotspots, in order to assess the circuits compliance with thermal specifications. This makes the thermal analysis problem amenable to Model Order Reduction (MOR) techniques. System-theoretic techniques like Balanced Truncation (BT) offer very reliable bounds for the approximation error, which can be used to control the order and accuracy of the reduced models during creation, at the expense of greater computational complexity to create them. In this paper, we propose a computationally efficient low-rank BT algorithm that retains all the system-theoretic advantages in the reduction of model order for fast hotspot thermal simulation. Experimental results demonstrate a 39X order reduction and very tight accuracy bounds.

关键词： Mathematical model Computational modeling Integrated circuit modeling Heating systems Thermal analysis Approximation algorithms Equivalent circuits"

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Behavioral modeling of a Sensor Interface Circuit Including Various Non-Idealities 14

Behavioral Modeling of a Sensor Interface Circuit Including ...

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13th conference on Ph.D. Research in microelectronics and Electronics (PRIME) / 14th International conference on Synthesis, modeling, Analysis and simulation Methods and Application to Circuit design (SMACD)

作者： Heinssen, Sascha Taddiken, Maike Hillebrand, Theodor Paul, Steffen Peters-Drolshagen, Dagmar Univ Bremen Inst Electrodynam & Microelect ITEM Me Bremen Germany

ISBN: (纸本)9781509050529

In modern CMOS processes, several non-ideal influences affect the functionality of integrated circuits. In order to analyze and reduce these influences, time intensive circuit simulations are performed at transistor level. Although numerous non-idealities are considered in such simulations, they cannot be analyzed separately since they are inherent parts of the transistor models and cannot be faded out. In this work, a solution to this problem is presented: the use of Verilog-A/MS behavioral models in combination with Response Surface modeling. Since error sources can easily be switched on and off in these models, their influence on circuit parameters can be examined individually. Moreover, the required simulation time is drastically reduced by using these models. A 65nm CMOS sensor interface is selected to demonstrate the advantages of the introduced approach. The interface is transferred from transistor to behavioral level before both circuit representations are compared in various simulations.

关键词： sensor interface behavioral modeling response surface modeling Verilog-A/MS fault analysis

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Electrical modeling and simulation for mixed-signal interconnect and packaging

Electrical modeling and simulation for mixed-signal intercon...

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Proceedings of the 1997 2nd Annual IEEE International conference on Innovative Systems in Silicon

作者： Cangellaris, Andreas C. Univ of Illinois at Urbana-Champaign Urbana United States

The explosive growth of wireless communications, combined with the rapid advances in high-performance portable computing, are driving the microelectronics industry toward the development of a variety of multi-functional, low-cost, compact, mixed-signal electronic products. These new products call for novel, often revolutionary, practices in functional block integration and packaging. Some of the challenges associated with the electrical design and rapid prototyping of these systems are discussed in this paper. Examples are given of existing electromagnetic modeling methodologies and associated CAD tools that can be used today to facilitate the design of these novel packages. The paper concludes with a brief discussion of on-going research activities toward the enhancement of these modeling/simulation methodologies and the eventual establishment of an electromagnetic CAD environment for mixed-signal system electrical design.

关键词： microelectronics

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A Reliable and Fast ANN Based Behavioral modeling Approach for GaN HEMT 16

A Reliable and Fast ANN Based Behavioral Modeling Approach f...

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16th International conference on Synthesis, modeling, Analysis and simulation Methods and Applications to Circuit design (SMACD) / 15th conference on PhD Research in microelectronics and Electronics (PRIME)

作者： Khusro, Ahmad Husain, Saddam Hashmi, Mohammad S. Auyenur, Medet Ansari, Abdul Quaiyum Jamia Millia Islamia Dept Elect Engn New Delhi India Nazarbayev Univ Dept Elect & Comp Engn Astana Kazakhstan

ISBN: (纸本)9781728112015

The paper proposes an accurate, fast and advanced neural network approach to model the small signal behavior of GaN High Electron Mobility Transistor (HEMT). The presented approach makes use of the nonlinear autoregressive series-parallel and parallel architectures to model a 2x200 mu m device for a broad frequency range of 1GHz - 18GHz. A comparison is drawn between the two architectures based on the training algorithm, accuracy, convergence rate and number of epochs. An excellent agreement is found between the measured S-parameters and the proposed model for the complete broad frequency range. The proposed model can be embedded into computer aided design tool for an accurate and expedited design process of RF/microwave circuits and systems.

关键词： GaN HEMT NARX architecture modeling Machine Learning

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A New Robustness Optimization Methodology for MEMS-IC Systems 14

A New Robustness Optimization Methodology for MEMS-IC System...

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作者： Burcea, Florin Herrmann, Andreas Gupta, Aditya Graeb, Helmut Tech Univ Munich Inst Elect Design Automat Munich Germany

ISBN: (纸本)9781509050529

MEMS based sensor circuits are traditionally designed separately using CAD tools specific to each energy domain (mechanical and electrical). This paper presents a new approach for the robustness optimization of a MEMS-IC system. The new methodology is exemplified for a MEMS microphone with readout circuit. The design parameters of both the MEMS and the IC part are subject to optimization. Advanced methods for robustness analysis and optimization in consideration of operating and process parameters, developed for ICs, are transferred to MEMS based sensor circuits. The optimization succeeds only when considering both mechanical and electrical parameters. To save CPU time, a reduced-order model is used for the MEMS part. To integrate the generation of the simplified model into the optimization flow, a new simulation-in-a-loop flow based on commercial tools is implemented.

关键词： Optimization Solid modeling Micromechanical devices Integrated circuit modeling Microphones Capacitance

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Chirp design in a pulse compression procedure for the identification of non-linear systems 14

Chirp design in a pulse compression procedure for the identi...

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作者： Burrascano, Pietro Laureti, Stefano Senni, Luca Silipigni, Giuseppe Tomasello, Riccardo Ricci, Marco Univ Perugia Dept Engn I-05100 Terni Italy Univ Calabria Dept Informat Modeling Elect & Syst Engn I-87036 Arcavacata Di Rende Italy

ISBN: (纸本)9781509050529

The Hammerstein model of a nonlinear systems can be efficiently identified by means of a technique based on pulse compression. The procedure relies on the properties of the exponential chirps, adopted as excitation signals. The present paper proposes to include the initial phase of the chirp, together with its time duration and frequency extremes, among the parameters to design the excitation signal. Considering this widened set of design parameters, we identify the constraints that the excitation signal must meet to carry out an accurate identification. The paper shows that introducing the initial phase as further degree of freedom, adds flexibility to the design process and allows for the use of much shorted chirp signals, making measurements faster and reliable. The experimental results reported demonstrate the validity of the constraints identified and show that, choosing appropriate combinations of the parameters, very short chirp accomplish the phase constraint needed for an accurate modelling of the non-linear system.

关键词： system modeling and identification nonlinear systems pulse compression methods chirp

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LUT-based Stochastic modeling for Non-Normal Performance Distributions 15

LUT-based Stochastic Modeling for Non-Normal Performance Dis...

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作者： Taddiken, Maike Hillebrand, Theodor Paul, Steffen Peters-Drolshagen, Dagmar Univ Bremen Inst Electrodynam & Microelect ITEM Me Bremen Germany

ISBN: (数字)9781538651537

ISBN: (纸本)9781538651537

Process variations have a large influence on the behavior of integrated circuits. Although individual process parameters are mostly considered as normal or uniformly distributed, the resulting performance distribution of a circuit cannot always be assumed to be normally distributed due to non-linearities. In this paper an approach is presented which uses Kernel Density Estimation to calculate the non-normal performance distributions. The resulting probability density function is approximated by curve fitting to reduce complexity. A Look-Up table based stochastic model is build by analyzing the performance distribution at different operating conditions. In order to draw random samples from the distribution, slice sampling is applied. The application of the modeling method is evaluated at the example of an amplifier.

关键词： Kernel Probability density function Gain Integrated circuit modeling Mathematical model Estimation Stochastic processes"

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