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European design and Test (ED&TC) conference

作者： K. Hofmann M. Glesner N. Sebe A. Manolescu S. Marco J. Samitier J.-M. Karam B. Courtois Institute of Microelectronic Systems Darmstadt University of Technology Darmstadt Germany Polytechnic University of Bucharest Romania University Autònoma de Barcelona Spain INPG TIMA Grenoble France

ISBN: (纸本)9780818677861

A CAD tool for the automated generation of behavioral models in HDL-A is presented. This CAD tool has been implemented in the frame of a project for the automatic modeling of microsystem components for the co-simulation with VHDLor Spice-models. Starting from the finite-element-description of a microcomponent a nonlinear behavioral HDL-A-model is generated by successively adding or deleting effects to the HDL-A-model according to the observed differences between the two models. Using the example of a micromembrane the practicability of this approach is demonstrated. This CAD tool provides a method for decoupling the generation of behavioral models from the finite-element-simulation process.

关键词： Finite element methods Power system modeling microelectronics Electronic mail Power generation Timing Energy consumption Knowledge engineering Micromechanical devices Parameter extraction

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EDA based digital design on non-residential campuses

EDA based digital design on non-residential campuses

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Frontiers in Education (FIE) conference

作者： R.J. Auletta Electrical Engineering University of Colorado Denver Denver CO USA

The design of multi-million transistor on a chip digital systems has become inseparable from advanced electronic design automation (EDA) software for all aspects of the microelectronic design process. While the use of EDA tools for the specification, synthesis and simulation of microelectronic, digital and computer systems is common at residential universities, at small nonresidential campuses microelectronic systems education and the use of EDA tools may be limited or nonexistent. Many challenges are faced by a small nonresidential program incorporating EDA tools into its curriculum. This paper describes these challenges and presents how the electrical engineering department at the University of Colorado at Denver, USA, is introducing EDA tools into its microelectronic and digital systems program.

关键词： Electronic design automation and methodology microelectronics Digital systems Educational institutions Transistors Process design Computational modeling Computer simulation Computer science education Educational programs

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A computationally stable quasi-empirical compact model for the simulation of MOS breakdown in ESD-protection circuit design

A computationally stable quasi-empirical compact model for t...

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International conference on simulation of Semiconductor Processes and Devices (SISPAD)

作者： Shiang Liang Lim Xin Yi Zhang Zhipeng Yu S. Beebe R.W. Dutton TriTech Microelectronics International Private Limited Singapore Cmter for Integrated Systems University of Stanford Stanford CA USA Advanced Micro Devices Inc. Sunnyvale CA USA

This paper presents a simple-to-implement, semi-empirical model for circuit-level simulation of the MOS breakdown region, with application in ESD-protection circuit design. A new formulation for the multiplicative factor M, used to model avalanche current generation, shows good convergence properties when used in circuit simulators. The effects of source/drain series resistance, substrate resistance, and the parameters of the new M expression are described. We describe how to calibrate the parameters for an NMOS device. Finally, we compare the simulated results with experimental data.

关键词： Computational modeling Electric breakdown Circuit simulation Convergence Intrusion detection Circuit synthesis MOS devices Protection Voltage Bipolar transistors

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simulation and computer aided design of large-scale photonic integrated circuits using the beam propagation method (BPM)

Simulation and computer aided design of large-scale photonic...

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IEEE Photonics conference (IPC)

作者： R. Scarmozzino R.M. Osgood Microelectronics Sciences Laboratories Columbia University New York NJ USA

In this paper we briefly review the approach and capabilities of the BPM method, and its applications to photonic devices and largescale PICs such as arrayed-waveguide-grating WDMs. Many numerical and analytical techniques have been developed for optical waveguide modeling. After briefly surveying these techniques, the talk will focus on the finite-difference BPM and the problems to which it can be applied. The method allows efficient simulation in 2D or 3D, can incorporate polarization via both semi- and full-vectorial approaches, can handle anisotropic media, nonlinear effects, and wide-angle circuits, and can perform mode solving as well as propagation calculations. As a specific example of the difficulties in treating large scale circuits, We give two approaches to the design of the arrayed-waveguide-grating based routers used in WDM sytems.

关键词： Computational modeling Computer simulation Optical computing Large-scale systems Wavelength division multiplexing Optical waveguides Circuits Application software Geometrical optics Nonlinear optical devices

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A new quality estimation methodology for mixed-signal and analogue ICs 97

A new quality estimation methodology for mixed-signal and an...

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European design and Test (ED&TC) conference

作者： T. Olbrich I.A. Grout Y.E. Aimine A.M. Richardson J. Contensou Concept Engineering & Aplplication Austria Mikro Systeme International AG Austria Engineering Department Lancaster University Lancaster UK LE28099ENSEEIHT Toulouse France

ISBN: (纸本)9780818677861

IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the quality related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.

关键词： Circuit faults Circuit testing Integrated circuit testing Integrated circuit modeling Production Circuit simulation Circuits and systems System testing Virtual manufacturing Analog integrated circuits

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Hierarchical statistical characterization of mixed-signal circuits using behavioral modeling 96

Hierarchical statistical characterization of mixed-signal ci...

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Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design

作者： Eric Felt Stefano Zanella Carlo Guardiani Alberto Sangiovanni-Vincentelli Electrical Engineering and Computer Sciences University of California Berkeley Berkeley California Elettronica ed Informatica Università degli Studi di Padova Padova Italy Central R&D D.A.I.S. SGS-Thomson Microelectronics Agrate Brianza Italy

ISBN: (纸本)9780818675973

A methodology for hierarchical statistical circuit characterization which does not rely upon circuit-level Monte Carlo simulation is presented. The methodology uses principal component analysis, response surface methodology, and statistics to directly calculate the statistical distributions of higher-level parameters from the distributions of lower-level parameters. We have used the methodology to characterize a folded cascode operational amplifier and a phase-locked loop. This methodology permits the statistical characterization of large analog and mixed-signal systems, many of which are extremely time-consuming or impossible to characterize using existing methods.

关键词： behavioral modeling

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Quick generation of temporal power waveforms for RT-level hard macros

Quick generation of temporal power waveforms for RT-level ha...

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IEEE International conference on Innovative Systems in Silicon

作者： L. Benini G. De Micheli E. Macii M. Poncino R. Scarsi Computer Systems Laboratory University of Stanford Stanford CA USA Dip. di Automatica e Informatica Politecnico di Torino Torino Italy

Power characterization of complex macros is essential to enable accurate RT-level power estimation. Existing characterization procedures focus on the average value of power. In this paper, we take a fresh look at this problem. We propose a fast, yet accurate technique to determine a time-dependent power model, i.e., a temporal power waveform, which is able to fully characterize the power behavior of a hard macro in response to a realistic input stream consisting of typical usage patterns. Our approach is simulation-based, and resorts to a mix of high-level, fast cycle-based simulation with low-level, slow accurate simulation of the long set of input patterns. Results are extremely satisfactory, since the average error between the power waveforms generated by our tool and the exact ones is always within 1%, while the reduction in the execution time ranges between one and two orders of magnitude.

关键词： Power generation Libraries Computational modeling Character generation Energy consumption Hardware design languages Laboratories Circuit simulation microelectronics Silicon

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Multiple transient effects in SOI transistors: Systematic measurements and simulation

Multiple transient effects in SOI transistors: Systematic me...

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IEEE SOI-3D-Subthreshold microelectronics Technology Unified conference (S3S)

作者： D. Weiser D. Munteanu S. Cristoloveanu O. Faynot J.L. Pelloie J. Fossum Department of Electrical Engineering University of Florida Gainesville FL USA LPCS (UMR CNRS 5531) ENSERG Grenoble France LETI-CEA Grenoble Grenoble France

The use of partially depleted SOI CMOS technology in mainstream ULSI can be limited by transient floating body effects, that make circuit design problematic. Time-dependent V/sub T/ is observed in circuits, leading to unusual behaviours, such as current overshoot and undershoot. In order to properly evaluate the time-dependent floating-body effects on circuit performance, it is necessary to use a model (including both carrier generation and recombination) which predicts the transient responses of single devices to various front and back gate pulses. We present an enhanced version of SOISPICE-4.4 which provides the capabilities needed to correctly simulate floating-body transient effects in partially depleted circuits. The simulations are validated through systematic measurements over a wide range of experimental conditions: carrier generation and recombination-based transients, single and dual gate, back and front gate, various gate geometries. Most experiments were conducted at low V/sub D/ (to avoid impact-ionization and self-heating, i.e., to facilitate accurate calibration of the simulator) on partially depleted NMOS transistors fabricated on UNIBOND and Low-Dose SIMOX wafers. Four families of transients have been recorded, analyzed and simulated.

关键词： CMOS technology Circuit simulation Ultra large scale integration Circuit synthesis Circuit optimization Predictive models Pulse generation Pulse circuits Solid modeling Geometry

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Overhead intrabay automation and microstocking. A virtual fab case study

Overhead intrabay automation and microstocking. A virtual fa...

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IEEE/SEMI conference and Workshop on Advanced Semiconductor Manufacturing

作者： P.L. Campbell G. Laitinen MicroElectronics Division International Business Machines Corporation NY USA AutoSimulations Inc. Bountiful UT USA

As the need for higher efficiencies in semiconductor manufacturing intensifies, the importance of effective intrabay automation increases. Direct delivery overhead zero foot print intrabay automation, coupled with microstocking of WIP will be a means to maximize the throughput of fully automated fabs. Microstocking can be practically implemented in the following four ways. The first instance of microstocking is found on a process tool that has more than one Input/Output (I/O) port. Another form of microstocking is the internal tool buffer commonly found on vertical furnaces and wet processing benches. A third manifestation of microstocking is the OEM supplied small capacity WIP stocker, that is mounted directly to the front of a process tool. Overhead Zero Foot Print microstocking is the fourth choice, which uses ceiling mounted shelves integrated directly below the overhead intrabay vehicle systems. This paper is the result of investigating these automation concepts using discrete event simulation modeling. The fat, process system model is integrated with the automation system to yield insight into the effectiveness of microstocking and overhead automation. The industry generally agrees that 300 mm fabs will be highly automated; this case study explores some of the issues facing those who implement intrabay automation.

关键词： Computer aided software engineering Manufacturing automation Foot design automation Semiconductor device manufacture Throughput Floors Costs Space vehicles Production facilities

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Information processing for mechatronic systems

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ROBOTICS AND AUTONOMOUS SYSTEMS 1996年第2期19卷 117-134页

作者： Isermann, R Institute of Automatic Control Laboratory for Control Engineering and Process Automation Technical University of Darmstadt Landgraf-Georg-Str. 4 D-64283 Darmstadt Germany

The integration of mechanical systems and microelectronics opens many new possibilities for process design and automatic functions. After discussing the mutual interrelations between mechanical and electronic design the different ways of integration within mechatronic systems and the resulting properties are described. The information processing can be organized in multilevels, ranging from low-level control, through supervision to general process management. In connection with knowledge bases and inference mechanisms intelligent control systems result. The design of control systems for mechanical systems is described, from modeling, identification to adaptive control for nonlinear systems. This is followed by solving supervision tasks with fault diagnosis. Then design tools for mechatronic systems are considered and examples of applications are given, like intelligent control of an electromechanical throttle actuator and force and torque reconstruction for a robot.

关键词： mechatronic systems intelligent control nonlinear control adaptive control supervision fault diagnosis hardware-in-the-loop simulation intelligent automobile actuators torque reconstruction robot control

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