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检索条件"任意字段=Conference on Design, Modeling, and Simulation in Microelectronics"
1413 条 记 录,以下是1311-1320 订阅
排序:
Generation of the HDL-A-model of a micromembrane from its finite-element-description  97
Generation of the HDL-A-model of a micromembrane from its fi...
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European design and Test (ED&TC) conference
作者: K. Hofmann M. Glesner N. Sebe A. Manolescu S. Marco J. Samitier J.-M. Karam B. Courtois Institute of Microelectronic Systems Darmstadt University of Technology Darmstadt Germany Polytechnic University of Bucharest Romania University Autònoma de Barcelona Spain INPG TIMA Grenoble France
A CAD tool for the automated generation of behavioral models in HDL-A is presented. This CAD tool has been implemented in the frame of a project for the automatic modeling of microsystem components for the co-simulati... 详细信息
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EDA based digital design on non-residential campuses
EDA based digital design on non-residential campuses
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Frontiers in Education (FIE) conference
作者: R.J. Auletta Electrical Engineering University of Colorado Denver Denver CO USA
The design of multi-million transistor on a chip digital systems has become inseparable from advanced electronic design automation (EDA) software for all aspects of the microelectronic design process. While the use of... 详细信息
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A computationally stable quasi-empirical compact model for the simulation of MOS breakdown in ESD-protection circuit design
A computationally stable quasi-empirical compact model for t...
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International conference on simulation of Semiconductor Processes and Devices (SISPAD)
作者: Shiang Liang Lim Xin Yi Zhang Zhipeng Yu S. Beebe R.W. Dutton TriTech Microelectronics International Private Limited Singapore Cmter for Integrated Systems University of Stanford Stanford CA USA Advanced Micro Devices Inc. Sunnyvale CA USA
This paper presents a simple-to-implement, semi-empirical model for circuit-level simulation of the MOS breakdown region, with application in ESD-protection circuit design. A new formulation for the multiplicative fac... 详细信息
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simulation and computer aided design of large-scale photonic integrated circuits using the beam propagation method (BPM)
Simulation and computer aided design of large-scale photonic...
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IEEE Photonics conference (IPC)
作者: R. Scarmozzino R.M. Osgood Microelectronics Sciences Laboratories Columbia University New York NJ USA
In this paper we briefly review the approach and capabilities of the BPM method, and its applications to photonic devices and largescale PICs such as arrayed-waveguide-grating WDMs. Many numerical and analytical techn... 详细信息
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A new quality estimation methodology for mixed-signal and analogue ICs  97
A new quality estimation methodology for mixed-signal and an...
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European design and Test (ED&TC) conference
作者: T. Olbrich I.A. Grout Y.E. Aimine A.M. Richardson J. Contensou Concept Engineering & Aplplication Austria Mikro Systeme International AG Austria Engineering Department Lancaster University Lancaster UK LE28099ENSEEIHT Toulouse France
IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the microelectronics Industry. This paper presents and demonstrates a quality estimat... 详细信息
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Hierarchical statistical characterization of mixed-signal circuits using behavioral modeling  96
Hierarchical statistical characterization of mixed-signal ci...
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Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
作者: Eric Felt Stefano Zanella Carlo Guardiani Alberto Sangiovanni-Vincentelli Electrical Engineering and Computer Sciences University of California Berkeley Berkeley California Elettronica ed Informatica Università degli Studi di Padova Padova Italy Central R&D D.A.I.S. SGS-Thomson Microelectronics Agrate Brianza Italy
A methodology for hierarchical statistical circuit characterization which does not rely upon circuit-level Monte Carlo simulation is presented. The methodology uses principal component analysis, response surface metho... 详细信息
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Quick generation of temporal power waveforms for RT-level hard macros
Quick generation of temporal power waveforms for RT-level ha...
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IEEE International conference on Innovative Systems in Silicon
作者: L. Benini G. De Micheli E. Macii M. Poncino R. Scarsi Computer Systems Laboratory University of Stanford Stanford CA USA Dip. di Automatica e Informatica Politecnico di Torino Torino Italy
Power characterization of complex macros is essential to enable accurate RT-level power estimation. Existing characterization procedures focus on the average value of power. In this paper, we take a fresh look at this... 详细信息
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Multiple transient effects in SOI transistors: Systematic measurements and simulation
Multiple transient effects in SOI transistors: Systematic me...
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IEEE SOI-3D-Subthreshold microelectronics Technology Unified conference (S3S)
作者: D. Weiser D. Munteanu S. Cristoloveanu O. Faynot J.L. Pelloie J. Fossum Department of Electrical Engineering University of Florida Gainesville FL USA LPCS (UMR CNRS 5531) ENSERG Grenoble France LETI-CEA Grenoble Grenoble France
The use of partially depleted SOI CMOS technology in mainstream ULSI can be limited by transient floating body effects, that make circuit design problematic. Time-dependent V/sub T/ is observed in circuits, leading to... 详细信息
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Overhead intrabay automation and microstocking. A virtual fab case study
Overhead intrabay automation and microstocking. A virtual fa...
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IEEE/SEMI conference and Workshop on Advanced Semiconductor Manufacturing
作者: P.L. Campbell G. Laitinen MicroElectronics Division International Business Machines Corporation NY USA AutoSimulations Inc. Bountiful UT USA
As the need for higher efficiencies in semiconductor manufacturing intensifies, the importance of effective intrabay automation increases. Direct delivery overhead zero foot print intrabay automation, coupled with mic... 详细信息
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Information processing for mechatronic systems
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ROBOTICS AND AUTONOMOUS SYSTEMS 1996年 第2期19卷 117-134页
作者: Isermann, R Institute of Automatic Control Laboratory for Control Engineering and Process Automation Technical University of Darmstadt Landgraf-Georg-Str. 4 D-64283 Darmstadt Germany
The integration of mechanical systems and microelectronics opens many new possibilities for process design and automatic functions. After discussing the mutual interrelations between mechanical and electronic design t... 详细信息
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