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检索条件"任意字段=Conference on Design, Modeling, and Simulation in Microelectronics"
1418 条 记 录,以下是1311-1320 订阅
排序:
Channel noise scan by using simulations of voltage regulator noise to signals
Channel noise scan by using simulations of voltage regulator...
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International Microsystems, Packaging, Assembly and Circuits Technology (IMPACT)
作者: Jimmy Hsu Patt Chang Thonas Su Gong Ouyang Kai Xiao Falconee Lee Y L Li DCG Intel Microelectronics Asia Ltd. Taipei Taiwan DCG Intel Corporation DuPont WA USA
In this paper, channel noise scan approach (CNS) is proposed to efficiently analyze the potential VR-signal coupling issue in the pre-silicon design and the post-silicon debug of the platform development. CNS is based... 详细信息
来源: 评论
Accurate electrical simulation and design optimization for silicon interposer considering the MOS effect and eddy currents in the silicon substrate
Accurate electrical simulation and design optimization for s...
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Electronic Components and Technology conference (ECTC)
作者: Jing Zhou Lixi Wan Fengwei Dai Huijuan Wang Chongshen Song Tianmin Du Yanbiao Chu Maoyun Pan Daniel Guidotti Liqiang Cao Daquan Yu Institute of Microelectronics Chinese Academy of Sciences Beijing China
In this paper, a group of coplanar lines on a silicon dioxide insulating layer on a nominally doped silicon substrate is simulated and measured. Electrical parameters extracted from published data are used and lead to... 详细信息
来源: 评论
Random Dopant Induced Threshold Voltage Fluctuations in Double Gate MOSFET's
Random Dopant Induced Threshold Voltage Fluctuations in Doub...
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2004 7th International conference on Solid-State and Integrated Circuits Technology(ICSICT 2004)
作者: Ling Xia,Xuewen Gan~* Institute of microelectronics,Peking University,Beijing 100871,China
A study by means of analytical modeling and simulation analysis on random dopant induced double gate MOSFET threshold voltage fluctuations is presented. Analytical models describing the standard deviation of threshold... 详细信息
来源: 评论
A modified CMOS nano-power resistorless current reference circuit
A modified CMOS nano-power resistorless current reference ci...
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Ph.D. Research in microelectronics and Electronics (PRIME)
作者: Shailesh Singh Chouhan Kari Halonen SMARAD-II Department of Micro and Nano Sciences Aalto University School Of Electrical Engineering Finland
In this work, all MOS current reference circuit is proposed using a standard 0.18 μm technology and the simulations were performed using the Cadence Spectre simulator. The proposed current reference circuit is based ... 详细信息
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A new parameter extraction method for ultra-thin oxide SOI MOSFET's
A new parameter extraction method for ultra-thin oxide SOI M...
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IEEE SOI-3D-Subthreshold microelectronics Technology Unified conference (S3S)
作者: O. Faynot S. Cristoloveanu P. McLarty C. Raynaud J. Gautier LETI (CEA-Technologies Avancées)-DMEL-CEN/G Grenoble France Laboratoire de Physique des Composants à Semiconducteurs (UA-CNRS) ENSERG Grenoble France Department Electrical and ComputerEngineering State University Raleigh NC USA
Parameter extraction stands as a critical issue for the modeling, simulation and design of CMOS transistors and circuits. Over the years, many methods have been proposed, refined and optimized until they became unable... 详细信息
来源: 评论
A low bandwidth pulse-based neural recording system
A low bandwidth pulse-based neural recording system
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Ph.D. Research in microelectronics and Electronics (PRIME)
作者: Sheng-Feng Yen John G. Harris Department of Electrical and Computer Engineering University of Florida Gainesville FL USA
This research investigates a novel data reduction scheme using adaptive leaky refractory integrate-and-fire (ALRIF) neurons to generate pulses for an implanted neural recording system in wireless transmission applicat... 详细信息
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DAC technologist panel "the IC nanometer race - what will it take to win"
DAC technologist panel "the IC nanometer race - what will it...
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design Automation conference
作者: W.C. Rhines L. Parker G. Singer P. Magarshack D. Buss Fu-Chieh Hsu Ho-Kyu Kang Mentor Graphics Corporation Wilsonville OR USA Intel Corporation Santa Clara CA USA ST Microelectronics S.r.L. Crolles France Texas Instruments Inc. Dallas TX USA Taiwan Semiconductor Manufacturing Company Limited Hsinchu Taiwan Samsung Electronics Company Limited Seoul South Korea
Creating ICs in the nanometer age is a high-stakes race that few companies can afford to compete in - and even fewer can win. Hear how senior technologists from the world's top technology companies are striving to... 详细信息
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A MEMS resonator tank for an RF VCO application
A MEMS resonator tank for an RF VCO application
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IEEE International conference on Electronics, Circuits and Systems (ICECS)
作者: Daniel Zammit Owen Casha Ivan Grech Edward Gatt Joseph Micallef Department of Microelectronics and Nanoelectronics University of Malta Msida Malta
This paper presents the design and study of a MEMS tapped-inductor LC resonator tank, proposed to evaluate the improved performance over that generally achieved in standard CMOS passive component integration. The reso... 详细信息
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Flexible system model and architectural exploration for HIPERLAN 2 DLC wireless LAN protocol
Flexible system model and architectural exploration for HIPE...
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IEEE International conference on Communications (ICC)
作者: V. Nema B.V. Poucke M. Glassee S. Vernalde Interuniversity Microelectronics Center (IMEC) Leuven Belgium Interuniversitair Micro-Elektronica Centrum Leuven Vlaams-Brabant BE IMEC Leuven Belgium
Modern wireless communication protocols like HIPERLAN 2, IEEE 802.11a etc. support high data rates of the order of 54 Mbps and have strict timing requirements. Although protocols define the communication rules, they d... 详细信息
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Pragmatic approaches to implement self-checking mechanism in UVM based TestBench
Pragmatic approaches to implement self-checking mechanism in...
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International conference on Advances in Computer Engineering and Applications (ICACEA)
作者: Raghav Madan Nishant Kumar Sujay Deb ECE IIIT-Delhi Delhi India ST Microelectronics Greater Noida India
Functional Verification of today's highly complex designs cannot rely simply on static verification techniques as these techniques are incapable of verifying modern complex digital designs. However, simulation-Bas... 详细信息
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