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Considerations on Pre-Stress in a 3D-Printed Capacitive Force/Pressure Sensor 18

Considerations on Pre-Stress in a 3D-Printed Capacitive Forc...

18th International conference on Thermal, Mechanical and Multi-Physics simulation and Experiments in microelectronics and Microsystems (EuroSimE)

作者： Faller, Lisa-Marie Zangl, Hubert Inst Smart Syst Technol Sensors & Actuators Univ Str 65-67 A-9020 Klagenfurt Austria

ISBN: (纸本)9781509043446

In this work, we inter the influence of pre-stress in the design of a capacitive force/pressure sensor. For this purpose, experimental plans, so-called designs of Experiments (DoEs), are employed. Based on these designs, not only the influence of design parameters can be inferred, but also a prediction model, which uses the design parameters as predictors, can be determined. Rapid prototyping technologies, such as the considered 3D- and inkjet-printing processes, provide major advantages such as flexibility in design. At the same time, such processes lead to inhomogeneous material properties. The presented methodology, consequently, aims at determining the variations in sensor read-out due to pre-stress influence. A combination of Response-Surface-Method DoEs for design variables and randomized DoE of noise variables (i.e. the varying material properties) is employed. We demonstrate the influence of pre-stress on the considered geometry as well as the setup of a suitable prediction model for the read-out.

关键词： Force Robot sensing systems Electrodes Finite element analysis Load modeling Steel

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Impact Rating of Layout Parasitics in Mixed-Signal Circuits: Finding a Needle in a Haystack 15

Impact Rating of Layout Parasitics in Mixed-Signal Circuits:...

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15th International conference on Synthesis, modeling, Analysis and simulation Methods and Applications to Circuit design (SMACD) / 14th conference on PhD Research in microelectronics and Electronics (PRIME)

作者： Glaeser, Georg Grabmann, Martin Nuernbergk, Dirk IMMS Inst Mikroelekt & Mechatron Syst Gemeinntitz Ilmenau Germany Melexis GmbH Erfurt Germany

ISBN: (纸本)9781538651537

Parasitic couplings are the scourge of analog/mixed-signal (AMS) design sign-off. After the circuit has been verified, these layout-induced effects degrade the performance or even stability of the created system. In extreme cases, this may lead to malfunction under certain circumstances as for instance high-frequency electromagnetic interference (EMI). To verify the circuit by simulation, extraction is used to annotate the high number of parasitic elements to the circuit's netlist. Still, this tool does not point to a concrete coupling that causes the main impact on the performance. We propose an automated method to rate parasitic elements using a directed modification of the extracted post-layout netlist. By systematically removing parasitics and evaluating the performance, the designer is supplied with information about the main contributers to performance degradation. We demonstrate our approach by analysing and hardening an industrial voltage regulator layout with respect to EMI related influences.

关键词： Integrated circuit modeling Layout Couplings Capacitors Computational modeling Distortion Voltage control"

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Comparing Apples and Oranges: Evaluating Model-Coverage using Acceptance Regions 14

Comparing Apples and Oranges: Evaluating Model-Coverage usin...

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13th conference on Ph.D. Research in microelectronics and Electronics (PRIME) / 14th International conference on Synthesis, modeling, Analysis and simulation Methods and Application to Circuit design (SMACD)

作者： Grabmann, Martin Glaeser, Georg IMMS Inst Mikroelekt & Mechatron Syst Gemeinnutzi Ilmenau Germany

ISBN: (纸本)9781509050529

Analog/Mixed-Signal (AMS) design and verification is dominated by modelling tasks. Model validity is crucial for the design's correctness but lacks a more formal criterion. We propose a novel model verification strategy to evaluate the coverage with respect to a given circuit. We define model-coverage based on the individual acceptance regions in parameter space. This imposes a measure that can be formally described and efficiently approximated by an industrial simulation environment. We prove the ability of our approach in a case study: A model of a clock-recovery component used in RFID tags is compared to the realized circuit and layout. Using the novel coverage measure, we match the model to the circuit: By systematically adding new constraints to the model code, the coverage is increased to 99% ensuring the correctness of the overall system verification.

关键词： Integrated circuit modeling Adaptation models Predictive models Layout Hardware design languages Radio frequency Runtime

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Comparing Code Coverage Metrics for Analog Behavioral Models 14

Comparing Code Coverage Metrics for Analog Behavioral Models

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作者： Fuertig, Andreas Paschke, Moritz Hedrich, Lars Goethe Univ Frankfurt aM Inst Comp Sci Frankfurt Germany

ISBN: (纸本)9781509050529

In current applications Analog/Mixed-Signal (AMS) circuits gets increasingly demanding. To speed up the design process parts of the design were implemented in hardware description languages. Besides positive aspects like simulation processing times these models need to be checked in terms of verification run set completeness, i.e. input stimuli, parameter setting, and test bench circuitry. For this purposes we present a methodology to adopt code coverage metrics on Verilog-A models. A public domain analog circuit simulator automatically instruments and executes the behavioral description. The coverage results are automatically annotated and compared to a coverage metric based on the reachable analog state-space of the circuit. We discuss the methodology on several examples and sketch a path to improve the completeness of a verification run set.

关键词： Measurement Hardware design languages Computational modeling Analog circuits Mathematical model Instruments Software

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An adaptive simulation framework for AMS-RF test quality

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INTEGRATION-THE VLSI JOURNAL 2020年 73卷 10-17页

作者： Gutierrez, Valentin Leger, Gildas Univ Seville Inst Microlectron Sevilla CSIC Av Amer Vespucio 28 Seville 41092 Spain

Ensuring the quality of a circuit implies ensuring the quality of test. Despite the fact that performance-based testing has been the golden standard for Analog, Mixed-Signal and RF test for decades, high-reliability markets like automotive have found that functional test leaves some potential defects undetected that can produce infield failure. There is thus a push towards defect-oriented testing which, in turn, calls for an efficient defect simulation framework. This paper presents a statistical adaptive defect simulation based on likelihood-weighted random sampling to evaluate the quality of AMS-RF tests in terms of defect coverage and fault escape. The adaptive loop takes a decision at each new defect simulation on whether it is more efficient to assess the defect coverage or the fault escape rate of the test under evaluation, as a function of the desired targets for these two metrics. Several decision criteria are proposed and validated by simulation of a complete IC for different tests.

关键词： AMS-RF test Defect simulation Test evaluation Fault escape Defect coverage

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A Novel Multiple Membership Function Generator for Fuzzy Logic Systems 15

A Novel Multiple Membership Function Generator for Fuzzy Log...

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作者： Khayatzadeh, Ramin Yelten, Mustafa Berke Istanbul Tech Univ Dept Elect & Commun Engn TR-34469 Istanbul Turkey

ISBN: (纸本)9781538651537

This paper presents a new multiple membership function generator which is capable of forming Gaussian, trapezoidal, triangular, S-shaped, and Z-shaped membership functions. To the best of authors' knowledge, a single circuit that can concurrently generate Gaussian, trapezoidal, and triangular membership functions has not been reported in the literature yet. Proposed circuit is compatible with many fuzzy logic systems requiring different types of membership functions. The circuit is designed using a commercial 0.18 mu m CMOS technology and consumes a total power of 180 mu W. The shapes of each membership function can be modified by properly chosen values of input and reference voltages. Functionality of all membership functions is validated across process corners with additional Monte Carlo analysis where temperature variations are considered, as well.

关键词： Transistors Fuzzy logic Signal generators Delays simulation Monte Carlo methods Power demand"

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Adaptive simulation with HDL control module for frequency converting circuits 16

Adaptive simulation with HDL control module for frequency co...

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2021 International conference on Synthesis, modeling, Analysis and simulation Methods and Applications to Circuit design, SMACD 2021 and 16th conference on PhD Research in microelectronics and Electronics, PRIME 2021

作者： Tibenszky, Zoltán Kreißig, Martin Carta, Corrado Ellinger, Frank Circuit Design and Network Theory Technische Universität Dresden Dresden01069 Germany

ISBN: (纸本)9783800755899

An adaptive simulator-independent method is presented, which reduces the simulation and post-processing time of transient simulations through the use of an intelligent sweep control implemented as a behavioural model. It is capable to effectively reduce the points to be simulated for determining the operation regions, or to find the local extrema of a continuous value performance parameter. It controls the variable sweeps based on real time simulation results, and delivers the circuit’s performance parameters to be determined in a text file. This eliminates the often time consuming additional post-processing steps. The effectiveness of the proposed method is demonstrated for the case of a frequency divider verification, where it has led to a 10 times reduction in the simulation time, and eliminated any additional post-processing steps. © VDE VERLAG GMBH.

关键词： Timing circuits

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Event-driven modeling and simulation of 5G NR-band RF transceiver in SystemVerilog 16

Event-driven modeling and simulation of 5G NR-band RF transc...

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作者： Park, Chan Young Kim, Jaeha Elelctrical and Computer Engineering Department Seoul National University Seoul Korea Republic of

ISBN: (纸本)9783800755899

While baseband-equivalent real-number models (RNMs) are the current state-of-the-art for modeling RF transceivers in SystemVerilog, but their simulation speeds and accuracies are not adequate for predicting performance degradation due to DC offsets or high-order harmonic effects. This paper presents the models for a multi-standard, direct-conversion RF transceiver using XMODEL, for evaluating its system-level performance as well as verifying its digital controllers. The simulation results indicate that the presented models, including the digital configuration/calibration logic for the 5G sub-6GHz-band and mmWave-band transceiver, can deliver 30–1800× higher speeds than the baseband-equivalent RNMs while estimating the quadrature amplitude modulation signal constellation and error vector magnitude in the presence of non-idealities such as non-linearities, DC offsets, and I/Q imbalances. © VDE VERLAG GMBH.

关键词： Timing circuits

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Coupled Electro-mechanical simulation of Capacitive MEMS Accelerometer for Determining Optimal Parameters of Readout Circuit 20

Coupled Electro-mechanical Simulation of Capacitive MEMS Acc...

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20th International conference on Thermal, Mechanical and Multi-Physics simulation and Experiments in microelectronics and Microsystems (EuroSimE)

作者： Zajac, Piotr Szermer, Michal Amrozik, Piotr Maj, Cezary Jablonski, Grzegorz Lodz Univ Technol Dept Microelect & Comp Sci Wolczanska 221-223 PL-90924 Lodz Poland

ISBN: (纸本)9781538680407

During the design of acceleration measuring system, the optimal choice of sensor parameters may only be made by careful analysis of both the MEMS sensor itself and the readout circuit. Therefore, a coupled electromechanical simulation is usually required. In this paper, we use such a simulation to determine the values of modulation voltage and switching frequency which ensure that the relative readout error is within acceptable limits. Three capacitive MEMS accelerometer structures are analyzed and the relative error due to the impact of electrostatic force is quantified. Based on these results, the recommendations about the optimal readout circuit parameters are given.

关键词： Accelerometers Integrated circuit modeling Micromechanical devices Capacitance Electrostatics Force Switching frequency

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A simple and accurate method of modeling spiral inductor up to six times its first self-resonant frequency

A simple and accurate method of modeling spiral inductor up ...

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conference on design, modeling, and simulation in microelectronics

作者： Ng, AC Chua, LH Ng, GI Law, CL Nanyang Technol Univ Sch Elect & Elect Engn Ctr Microelect Singapore 639798 Singapore

ISBN: (纸本)0819439002

A simple, yet accurate method of modeling the spiral inductor up to six times its first self-resonant frequency is presented. The proposed model, which is derived from the measured data with lumped elements, overcomes the limitation in the valid frequency range of the commonly adopted PI-model and the difficulty in the extraction of element values of broadband model consisting of a number of PI-model cascaded together. Its element values are extracted via systematic data fitting, with two element values to be varied at a time. Such systematic approach offers easy extension of its validity to a higher frequency without complicating the extraction methodology.

关键词： MMIC spiral inductor

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