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2021 International conference on Synthesis, modeling, Analysis and simulation Methods and Applications to Circuit design, SMACD 2021 and 16th conference on PhD Research in microelectronics and Electronics, PRIME 2021

作者： García-Redondo, Fernando Prabhat, Pranay Bhargava, Mudit Dray, Cyrille Arm Ltd. Cambridge United Kingdom Arm Inc. Austin United States Arm Ltd. La Paros France

ISBN: (纸本)9783800755899

This paper presents a physics-based modeling framework for the analysis and transient simulation of circuits containing Spin-Transfer Torque (STT) Magnetic Tunnel Junction (MTJ) devices. The framework provides the tools to analyze the stochastic behavior of MTJs and to generate Verilog-A compact models for their simulation in large VLSI designs, addressing the need for an industry-ready model accounting for real-world reliability and scalability requirements. Device dynamics are described by the Landau-Lifshitz-Gilbert-Slonczewsky (s-LLGS) stochastic magnetization considering Voltage-Controlled Magnetic Anisotropy (VCMA) and the non-negligible statistical effects caused by thermal noise. Model behavior is validated against the OOMMF magnetic simulator and its performance is characterized on a 1-Mb 28 nm MagnetoresistiveRAM (MRAM) memory product. © VDE VERLAG GMBH.

关键词： Magnetic anisotropy

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Micro coil modeling - benefit and implementation of a permeable layer

Micro coil modeling - benefit and implementation of a permea...

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conference on design, modeling, and simulation in microelectronics

作者： Rehfuss, S Marschner, C Peters, D Bolte, H Laur, R Univ Bremen Inst Electromagnet Theory & Microelect D-28334 Bremen Germany

ISBN: (纸本)0819439002

Rectangular micro coils which are used in a wide range of applications (e.g. medical or automotive area) are the main components of appropriate wireless transmission systems for frequencies up to 20 MHz. As shown in previous works the self-inductance of micro coils has to be maximized to achieve a higher working distance. This can be done by the usage of a permeable layer underneath the micro coil. The existing model of the micro coil is extended by the use of the magnetic image method to include the inductance yield caused by the permeable layer. The underlying permeable layer or substrate is also modeled accurately to include eddy current phenomena and parasitic elements. To do this, the layer and the substrate respectively are divided into segments analog to the structure of the micro coil. Each segment is described by lumped elements, All elements are connected together to build up a network, which will be used to calculate the terminal impedance. The model and first results will be presented. (C) 2002 Elsevier Science Ltd. All rights reserved.

关键词： micro coil modeling telemetry permeable layer simulation

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Optimized 2D positioning of windings in inductive components by genetic algorithm 19

Optimized 2D positioning of windings in inductive components...

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19th International conference on Thermal, Mechanical and Multi-Physics simulation and Experiments in microelectronics and Microsystems (EuroSimE)

作者： Rosskopf, Andreas Knoerzer, Karsten Baer, Eberhard Ehrlich, Stefan Fraunhofer IISB Schottkystr 10 D-90158 Erlangen Germany

ISBN: (纸本)9781538623596

In the design process of inductive power transfer systems the shape of the inductive component is essential for the operation point, the losses and thus the efficiency. Based on a new placement approach, the amount and position of the windings within the inductive component is defined by a parameter set. With the help of a genetic algorithm these parameters are modified and iteratively optimized with regard to the core and winding losses, calculated by a coupling workflow combining FEM and circuit simulations. The results demonstrate a large variety of geometric winding designs and yield a pareto optimum for the balance of the both dominating loss shares in inductive components.

关键词： Windings Finite element analysis Topology Coils Two dimensional displays Integrated circuit modeling Geometry

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On Closing the Gap Between Pre-simulation and Post-simulation Results in Nanometer Analog Layouts 15

On Closing the Gap Between Pre-simulation and Post-simulatio...

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15th International conference on Synthesis, modeling, Analysis and simulation Methods and Applications to Circuit design (SMACD) / 14th conference on PhD Research in microelectronics and Electronics (PRIME)

作者： Pan, Po-Cheng Huang, Hung-Wen Huang, Chien-Chia Patyal, Abhishek Chen, Hung-Ming Yang, Tsun-Yu Natl Chiao Tung Univ Inst Elect Hsinchu 30010 Taiwan Taiwan Semicond Mfg Co Ltd Hsinchu Taiwan

ISBN: (纸本)9781538651537

In order to generate analog layout in advanced technology, it still remains lots of challenges due to the imprecise estimation of critical performance parameters. We propose an upgraded decision making framework, PEDefer, to decompose existing layout into decisive components for performance estimation. In this work, the objective is to synthesize layout solutions based on the performance estimation of user-defined constraints and existing templates. The constraints of the circuit are priorly tackled in the partition and layout enumeration stage. In addition, we attempt to have partial layout pieces as exchangeable blocks to perform pseudo-post-simulation, thus to put simulation factors in the evaluation during layout enumeration strategy. The experiments show that this flow guarantees valid analog layout results whose performances are closer to netlist-level simulation than manual designed or migrated layouts with minimal overhead.

关键词： Layout Estimation Shape Decision making Routing Performance evaluation"

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Inversion Coefficient Optimization Assisted Analog Circuit Sizing Tool 14

Inversion Coefficient Optimization Assisted Analog Circuit S...

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13th conference on Ph.D. Research in microelectronics and Electronics (PRIME) / 14th International conference on Synthesis, modeling, Analysis and simulation Methods and Application to Circuit design (SMACD)

作者： Afacan, Engin Dundar, Gunhan Bogazici Univ Dept Elect & Elect Engn Istanbul Turkey

ISBN: (纸本)9781509050529

Many analog circuit synthesis tools have emerged over the last two decades in order to combat increased design complexity and reduce the design time. However, the efficiency of these tools (time performance) is still a problem, where solving of a highly nonlinear design problem takes relatively long time even if the process is fully automated. Considering conventional analog circuit design, selection the operating point is essential to achieve a better performance, where inversion coefficient (IC) is commonly utilized as a sizing and biasing independent design parameter, which spans the entire range of saturation region (weak, moderate, strong inversion), and provides a valuable guidance to designer during the design process. Currently, analog circuit sizing tools utilize simplified equations to determine the transistor operating region, where all transistors are forced into the saturation region. Even if all transistors are kept in saturation, the inversion type of transistors has not been taken into account. In this study, a novel analog circuit sizing tool is presented, which facilities the sizing process by optimization of IC to enhance the time to converge.

关键词： Transistors Analog circuits Tools Optimization Performance evaluation Integrated circuit modeling

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design and modeling of on-chip electrostatic discharge (ESD) protection structures

Design and modeling of on-chip electrostatic discharge (ESD)...

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Proceedings - 2004 24th International conference on microelectronics, MIEL 2004

作者： Liou, Juin J. Gao, Xiaofang Department of Electrical Engineering University of Central Florida Orlando FL 32816 United States Modeling and Simulation Group Intel Corp. 9750 Goethe Rd. Sacramento CA 95827 United States

Electrostatic discharge (ESD) is a critical reliability concern for microchips. This paper presents a computer-aided design tool for ESD protection design and applications. Specifically, we develop an improved and robust MOS model and implement such a model into the industry standard Cadence SPICE for ESD circuit simulation. Experimental data measured from the transmission line pulsing (TLP) technique and human body model (HBM) tester are included in support of the model.

关键词： Electrostatics

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Importance of IR Drops on the modeling of Laser-Induced Transient Faults 14

Importance of IR Drops on the Modeling of Laser-Induced Tran...

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作者： Viera, Raphael A. Camponogara Maurine, Philippe Dutertre, Jean-Max Bastos, Rodrigo Possamai CNRS LIRMM UMR N5506 Montpellier France Ecole Nat Sup Mines St Etienne Gardanne France Univ Grenoble Alpes CNRS TIMA Grenoble France

ISBN: (纸本)9781509050529

Laser fault injection attacks induce transient faults by locally generating transient currents capable of temporarily flip the outputs of several gates. Many models used to simulate transient faults induced by laser consider several elements to better represent the effects of the laser on ICs. However, a laser-induced current between VDD and GND, which provokes significant IR drops, has been neglected. This paper highlights the importance of the induced IR drops on the modeling of laser-induced transient faults by using IR drop CAD tools. It also shows that laser-induced IR drops can be sufficiently strong to produce alone transient faults. As a result, the number of faults on a case-study circuit is accentuated whether IR drop effects are taken into account.

关键词： Solid modeling Laser beams Laser modes Circuit faults Integrated circuit modeling Transient analysis Semiconductor lasers

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Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells 14

Statistical characterization and modeling of random telegrap...

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作者： Martin-Martinez, J. Rodriguez, R. Nafria, M. Torrens, G. Bota, S. A. Segura, J. Moll, F. Rubio, A. UAB REDEC Grp Elect Engn Dept Barcelona Spain UIB Elect Syst Grp GSE Palma De Mallorca Spain Univ Politecn Cataluna Dept Elect Engn Barcelona Spain

ISBN: (纸本)9781509050529

Random Telegraph Noise (RTN) effects are investigated in 65nm SRAM cells by using a new characterization method that provides a significant measurement time reduction. The variability induced in commercial SRAM cells is derived by applying statistical and physics based Montecarlo modeling to the experimental data. Results show that RTN can have a significant impact on the memory write operations and should therefore be taken into account during the memory design phase.

关键词： Random Telegraph Noise SRAM variability characterization modeling

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An extensible TCAD optimization framework combining gradient based and genetic optimizers

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microelectronics JOURNAL 2002年第1-2期33卷 61-68页

作者： Heitzinger, C Selberherr, S Vienna Univ Technol Inst Microelect A-1040 Vienna Austria

The SIESTA framework is an extensible tool for optimization and inverse modeling of semiconductor devices including dynamic load balancing, for taking advantage of several, loosely connected workstations. Two gradient-based and two evolutionary computation optimizers are currently available through a uniform interface and can be combined at will. At a real world inverse modeling example, we demonstrate that evolutionary computation optimizers provide several advantages over gradient-based optimizers, due to the specific properties of the objective functions in TCAD applications. Furthermore, we shortly discuss some issues arising in inverse modeling and conclude with a comparison of gradient-based and evolutionary computation optimizers from a TCAD point of view. (C) 2002 Elsevier Science Ltd. All rights reserved.

关键词： TCAD optimization evolutionary computation genetic optimization gradient based optimization inverse modeling

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Investigation on the Demodulation of Multi-Tone Interference in Feedback OpAmps 13

Investigation on the Demodulation of Multi-Tone Interference...

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13th conference on Ph.D. Research in microelectronics and Electronics (PRIME) / International conference on Synthesis, modeling, Analysis and simulation Methods and Application to Circuit design (SMACD)

作者： Brignone, Marco Fiori, Franco Politecn Torino Elect & Telecom Dept Turin Italy

ISBN: (纸本)9781509065080

In this paper the effect of multi-tone interference on feedback Operational Amplifiers is explored. An analytical model is derived under the assumption of weak non-linearity. It can be used to predict the output offset induced by the superposition of an arbitrary number of sinusoidal disturbance and to evaluate the intermodulation distortion caused by two-tone interference. The proposed model is validated through comparison with computer simulations.

关键词： Electromagnetic interference Bandwidth Intermodulation distortion Analytical models Integrated circuit modeling Voltage control

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