检索结果-内蒙古大学图书馆

您好，读者！请登录

内蒙古大学图书馆

首页
概况
党建
资源
服务
科研支持
- 论文收录引用证明
- 科技查新
知识产权
档案馆
帮助

咨询与建议

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

您的常用邮箱：*

您的手机号码：*

问题描述：

当前已输入0个字，您还可以输入200个字

全部搜索
期刊论文
图书
学位论文
标准
纸本馆藏
外文资源发现
数据库导航
超星发现

高级检索

时间限定

出版年份：

文献类型

图书期刊文献学位论文多媒体

馆藏选择

电子馆藏纸本馆藏

核心期刊

全部期刊 SCI 收录期刊 SSCI 收录期刊 EI 收录期刊 CSCD 收录期刊 CSSCI 收录期刊

语言

中文英文

文献类型

期刊文献图书学位论文标准纸本馆藏

帮助

文字说明：

T=题名（书名、题名），A=作者（责任者），K=主题词，P=出版物名称，PU=出版社名称，O=机构（作者单位、学位授予单位、专利申请人），L=中图分类号，C=学科分类号，U=全部字段，Y=年（出版发行年、学位年度、标准发布年）

检索规则说明：

AND代表“并且”；OR代表“或者”；NOT代表“不包含”；(注意必须大写,运算符两边需空一格)

检索范例：

范例一：(K=图书馆学 OR K=情报学) AND A=范并思 AND Y=1982-2016
范例二：P=计算机应用与软件 AND (U=C++ OR U=Basic) NOT K=Visual AND Y=2011-2016

分类表

所选分类

>> <<

限定检索结果

文献类型

1,367 篇 会议
46 篇 期刊文献
6 册 图书

馆藏范围

1,419 篇 电子文献
0 种 纸本馆藏

日期分布

学科分类号

615 篇 工学
- 387 篇 电气工程
- 246 篇 电子科学与技术（可...
- 221 篇 计算机科学与技术...
- 128 篇 材料科学与工程（可...
- 119 篇 软件工程
- 89 篇 机械工程
- 66 篇 动力工程及工程热...
- 59 篇 控制科学与工程
- 42 篇 化学工程与技术
- 35 篇 信息与通信工程
- 31 篇 仪器科学与技术
- 23 篇 力学（可授工学、理...
- 15 篇 冶金工程
- 15 篇 生物医学工程（可授...
- 10 篇 建筑学
- 9 篇 光学工程
- 9 篇 土木工程
- 8 篇 交通运输工程
- 8 篇 安全科学与工程
- 7 篇 生物工程
255 篇 理学
- 146 篇 物理学
- 116 篇 数学
- 45 篇 化学
- 22 篇 系统科学
- 10 篇 生物学
- 10 篇 统计学（可授理学、...
38 篇 管理学
- 37 篇 管理科学与工程(可...
8 篇 医学
- 7 篇 临床医学
- 6 篇 基础医学(可授医学...
- 5 篇 药学(可授医学、理...
4 篇 法学
4 篇 艺术学
2 篇 农学
1 篇 经济学
1 篇 教育学

主题

272 篇 computational mo...
230 篇 integrated circu...
190 篇 circuit simulati...
179 篇 microelectronics
126 篇 semiconductor de...
115 篇 analytical model...
107 篇 solid modeling
96 篇 mathematical mod...
65 篇 simulation
61 篇 silicon
58 篇 predictive model...
53 篇 hardware design ...
53 篇 micromechanical ...
50 篇 load modeling
50 篇 hardware
49 篇 cmos technology
47 篇 spice
45 篇 design automatio...
43 篇 logic gates
42 篇 finite element a...

机构

13 篇 institute of mic...
13 篇 institute of mic...
12 篇 institute of mic...
7 篇 institute of mic...
6 篇 department of mi...
6 篇 institute of mic...
6 篇 department of mi...
6 篇 school of softwa...
5 篇 school of microe...
5 篇 nxp semiconducto...
5 篇 national microel...
5 篇 school of microe...
5 篇 institute of mic...
5 篇 philips applied ...
5 篇 imec leuven
5 篇 institute of mic...
5 篇 amic angewandte ...
5 篇 agilent technol ...
5 篇 delft university...
4 篇 shanghai researc...

作者

10 篇 xiaowu zhang
10 篇 roca e.
9 篇 castro-lopez r.
9 篇 a. napieralski
8 篇 rodriguez r.
8 篇 nafria m.
7 篇 l.j. ernst
7 篇 g.q. zhang
7 篇 martin-martinez ...
7 篇 sven rzepka
7 篇 fernandez f. v.
7 篇 s. selberherr
7 篇 zhang gq
6 篇 andrzej napieral...
6 篇 m.k. iyer
6 篇 ru huang
6 篇 n. ranganathan
6 篇 k.m.b. jansen
5 篇 khaoula mbarek
5 篇 sami ghedira

语言

1,403 篇 英文
10 篇 中文
3 篇 德文
3 篇 其他

检索条件"任意字段=Conference on Design, Modeling, and Simulation in Microelectronics"

共 1419 条记录，以下是341-350 订阅

全选清除本页清除全部题录导出标记到"检索档案"

详细简洁

排序：

LUT-based Stochastic modeling for Non-Normal Performance Distributions 15

LUT-based Stochastic Modeling for Non-Normal Performance Dis...

引用

15th International conference on Synthesis, modeling, Analysis and simulation Methods and Applications to Circuit design (SMACD) / 14th conference on PhD Research in microelectronics and Electronics (PRIME)

作者： Taddiken, Maike Hillebrand, Theodor Paul, Steffen Peters-Drolshagen, Dagmar Univ Bremen Inst Electrodynam & Microelect ITEM Me Bremen Germany

ISBN: (数字)9781538651537

ISBN: (纸本)9781538651537

Process variations have a large influence on the behavior of integrated circuits. Although individual process parameters are mostly considered as normal or uniformly distributed, the resulting performance distribution of a circuit cannot always be assumed to be normally distributed due to non-linearities. In this paper an approach is presented which uses Kernel Density Estimation to calculate the non-normal performance distributions. The resulting probability density function is approximated by curve fitting to reduce complexity. A Look-Up table based stochastic model is build by analyzing the performance distribution at different operating conditions. In order to draw random samples from the distribution, slice sampling is applied. The application of the modeling method is evaluated at the example of an amplifier.

关键词： Kernel Probability density function Gain Integrated circuit modeling Mathematical model Estimation Stochastic processes"

来源：评论

学校读者我要写书评

暂无评论

A Combinatorial Multigrid Preconditioned Iterative Method for Large Scale Circuit simulation on GPUs 15

A Combinatorial Multigrid Preconditioned Iterative Method fo...

引用

作者： Garyfallou, Dimitrios Evmorfopoulos, Nestor Stamoulis, Georgios Univ Thessaly Dept Elect & Comp Engn Volos Greece

ISBN: (纸本)9781538651537

Efficient large scale circuit simulation is among the most challenging problems facing the EDA industry today, since it is the only feasible way to verify a circuit's behaviour prior to manufacturing. In recent years, the emphasis has been placed on preconditioning methods which reduce the number of iterations for solving large Symmetric Diagonally Dominant systems resulting after the Modified Nodal Analysis. This paper presents a GPU-accelerated Preconditioned Conjugate Gradient (PCG) iterative method preconditioned by the Combinatorial Multigrid (CMG) for fast DC and transient analysis of large-scale linear circuits. Experimental results on IBM industrial power grids demonstrate speedups up to 4.69x and 4.50x for the PCG method and the CMG preconditioning algorithm, respectively, over the optimized CPU implementations.

关键词： Iterative methods Integrated circuit modeling RLC circuits Linear systems Graphics processing units Circuit simulation Convergence"

来源：评论

学校读者我要写书评

暂无评论

Tunable Floating-Point for Embedded Machine Learning Algorithms Implementation 15

Tunable Floating-Point for Embedded Machine Learning Algorit...

引用

作者： Franceschi, Marta Nannarelli, Alberto Valle, Maurizio Univ Genoa DITEN Cosm Lab Genoa Italy Tech Univ Denmark DTU Compute Lyngby Denmark

ISBN: (纸本)9781538651537

The development of embedded and real-time systems for Machine Learning data processing is challenging (e.g. IoT). Low latency, low power consumption and reduced hardware complexity should be the characteristics of such systems. Considering prosthetic applications, which are error-tolerant, a technique that tunes the precision of operands and operations has been chosen for a Machine Learning algorithm used for tactile data processing. This paper presents the implementation of a Tunable Floating-Point (TFP) representation into a Singular-Value Decomposition (SVD) algorithm based on the One-Sided Jacobi method. The TFP representations demonstrate high performance and efficiency improvements of the SVD algorithm.

关键词： simulation power efficiency SVD algorithm

来源：评论

学校读者我要写书评

暂无评论

Thermal aging modeling of Molding Compound under High-Temperature Storage and Temperature Cycling Conditions 19

Thermal aging modeling of Molding Compound under High-Temper...

引用

19th International conference on Thermal, Mechanical and Multi-Physics simulation and Experiments in microelectronics and Microsystems (EuroSimE)

作者： Zhang, Bingbing Johlitz, Michael Lion, Alexander Ernst, L. J. Jansen, K. M. B. Vu, Duc-Khoi Weiss, Laurens Univ Bundeswehr Munchen Inst Mech Neubiberg Germany Ernst Consultant Schoonhoven Netherlands Guilin Univ Elect Technol Guilin Peoples R China Delft Univ Technol Dept Design Engn Delft Netherlands Infineon Technol AG Munich Germany

ISBN: (纸本)9781538623596

In microelectronic packages, generally the chip is encapsulated by a molding compound (MC). The MC provides a mechanical support for the chip and isolates it from the environment and as a result protects the encapsulated chip. It is well known that MC's are polymer-based materials. When packages are exposed to a harsh environment such as to high-temperature storage or to thermal cycling, the mechanical properties of the MC's can change significantly. Consequently this could result into reliability issues of these packages. For a long time, there was no simple and efficient model method available to simulate the mechanical behavior of these packages under thermal aging conditions. As a result, it was hard to forecast the package reliability after a period of thermal aging. Since in our previous work [1,2] the thermomechanical properties of MC's before and after thermal aging were systematically characterized, the above problem was merely solved. A simple and efficient modeling method was proposed to simulate the thermal aging effects on MC's [2]. In this paper, a bi-material sample consisting of a MC layer on a Copper substrate is prepared and used to verify the proposed modeling method at two different thermal conditions: High-temperature storage (HTS) and Temperature cycling (TC). Based on the proposed modeling method the mechanical behavior of the bi-material sample after aging under these (different) thermal conditions are established throug FEM simulation. The simulation results match the experiment results quite well.

关键词： Aging High-temperature superconductors Temperature measurement microelectronics Ovens Electronic packaging thermal management Compounds

来源：评论

学校读者我要写书评

暂无评论

On Closing the Gap Between Pre-simulation and Post-simulation Results in Nanometer Analog Layouts 15

On Closing the Gap Between Pre-simulation and Post-simulatio...

引用

作者： Pan, Po-Cheng Huang, Hung-Wen Huang, Chien-Chia Patyal, Abhishek Chen, Hung-Ming Yang, Tsun-Yu Natl Chiao Tung Univ Inst Elect Hsinchu 30010 Taiwan Taiwan Semicond Mfg Co Ltd Hsinchu Taiwan

ISBN: (纸本)9781538651537

In order to generate analog layout in advanced technology, it still remains lots of challenges due to the imprecise estimation of critical performance parameters. We propose an upgraded decision making framework, PEDefer, to decompose existing layout into decisive components for performance estimation. In this work, the objective is to synthesize layout solutions based on the performance estimation of user-defined constraints and existing templates. The constraints of the circuit are priorly tackled in the partition and layout enumeration stage. In addition, we attempt to have partial layout pieces as exchangeable blocks to perform pseudo-post-simulation, thus to put simulation factors in the evaluation during layout enumeration strategy. The experiments show that this flow guarantees valid analog layout results whose performances are closer to netlist-level simulation than manual designed or migrated layouts with minimal overhead.

关键词： Layout Estimation Shape Decision making Routing Performance evaluation"

来源：评论

学校读者我要写书评

暂无评论

design considerations of an SRAM array for the statistical validation of time-dependent variability models 15

Design considerations of an SRAM array for the statistical v...

引用

作者： Saraza-Canflanca, P. Malagon, D. Passos, F. Toro, A. Nunez, J. Diaz-Fortuny, J. Castro-Lopez, R. Roca, E. Martin-Martinez, J. Rodriguez, R. Nafria, M. Fernandez, F. V. Univ Seville CSIC Inst Microelect Sevilla IMSECNM Seville Spain UAB REDEC Grp Elect Engn Dept Barcelona Spain

ISBN: (纸本)9781538651537

modeling and characterization of time-dependent variability phenomena as well as the simulation of their impact on circuit operation have attracted considerable efforts. This paper digs into the validation of compact models and simulation tools in the real operation of circuits. One of the most popular blocks, the 6T SRAM, is proposed for this purpose and a test chip containing an SRAM array is designed. The array allows individual access to each SRAM cell, the application of accelerated aging tests as well as the characterization of common performance metrics.

关键词： Transistors SRAM cells Stress Power supplies Degradation Integrated circuit modeling"

来源：评论

学校读者我要写书评

暂无评论

Lithography Hotspots Detection Using Deep Learning 15

Lithography Hotspots Detection Using Deep Learning

引用

作者： Borisov, Vadim Scheible, Juergen Reutlingen Univ Robert Bosch Ctr Power Elect Reutlingen Germany

ISBN: (纸本)9781538651537

The hotspot detection has received much attention in the recent years due to a substantial mismatch between lithography wavelength and semiconductor technology feature size. This mismatch causes diffraction when transferring the layout from design onto a silicon wafer. As a result, open or short circuits (i.e. lithography hotspots) are more likely to be produced. Additionally, increasing numbers of semiconductors devices on a wafer required more time for the lithography hotspot detection analysis. In this work, we propose a fast and accurate solution based on novel artificial neural network (ANN) architecture for precise lithography hotspot detection using a convolution neural network (CNN) adopting a state-of-the-art technique. The experimental results showed that the proposed model gained accuracy improvement over current state-of-the-art approaches. The final code has been made publicly available.

关键词： Lithography Convolution Training Kernel Solid modeling Feature extraction Neurons"

来源：评论

学校读者我要写书评

暂无评论

design and simulation of High Performance Dopingless Tunnel Diode

Design and Simulation of High Performance Dopingless Tunnel ...

引用

IEEE SOI-3D-Subthreshold microelectronics Technology Unified conference (S3S)

作者： Faisal Bashir Asim Majeed Farooq A Khanday M. Tariq Banday University of Kashmir Srinagar India College of Science University of Kirkuk Bagdad Iraq

The following topics are dealt with: silicon-on-insulator; semiconductor device models; MOSFET; low-power electronics; CMOS integrated circuits; elemental semiconductors; silicon; tunnel field-effect transistors; inte... 详细信息

ISBN: (数字)9781728135236

ISBN: (纸本)9781728135243

关键词： Schottky diodes Performance evaluation Plasmas Cathodes Anodes Silicon Semiconductor process modeling

来源：评论

学校读者我要写书评

暂无评论

Impact Rating of Layout Parasitics in Mixed-Signal Circuits: Finding a Needle in a Haystack 15

Impact Rating of Layout Parasitics in Mixed-Signal Circuits:...

引用

作者： Glaeser, Georg Grabmann, Martin Nuernbergk, Dirk IMMS Inst Mikroelekt & Mechatron Syst Gemeinntitz Ilmenau Germany Melexis GmbH Erfurt Germany

ISBN: (纸本)9781538651537

Parasitic couplings are the scourge of analog/mixed-signal (AMS) design sign-off. After the circuit has been verified, these layout-induced effects degrade the performance or even stability of the created system. In extreme cases, this may lead to malfunction under certain circumstances as for instance high-frequency electromagnetic interference (EMI). To verify the circuit by simulation, extraction is used to annotate the high number of parasitic elements to the circuit's netlist. Still, this tool does not point to a concrete coupling that causes the main impact on the performance. We propose an automated method to rate parasitic elements using a directed modification of the extracted post-layout netlist. By systematically removing parasitics and evaluating the performance, the designer is supplied with information about the main contributers to performance degradation. We demonstrate our approach by analysing and hardening an industrial voltage regulator layout with respect to EMI related influences.

关键词： Integrated circuit modeling Layout Couplings Capacitors Computational modeling Distortion Voltage control"

来源：评论

学校读者我要写书评

暂无评论

A Novel Multiple Membership Function Generator for Fuzzy Logic Systems 15

A Novel Multiple Membership Function Generator for Fuzzy Log...

引用

作者： Khayatzadeh, Ramin Yelten, Mustafa Berke Istanbul Tech Univ Dept Elect & Commun Engn TR-34469 Istanbul Turkey

ISBN: (纸本)9781538651537

This paper presents a new multiple membership function generator which is capable of forming Gaussian, trapezoidal, triangular, S-shaped, and Z-shaped membership functions. To the best of authors' knowledge, a single circuit that can concurrently generate Gaussian, trapezoidal, and triangular membership functions has not been reported in the literature yet. Proposed circuit is compatible with many fuzzy logic systems requiring different types of membership functions. The circuit is designed using a commercial 0.18 mu m CMOS technology and consumes a total power of 180 mu W. The shapes of each membership function can be modified by properly chosen values of input and reference voltages. Functionality of all membership functions is validated across process corners with additional Monte Carlo analysis where temperature variations are considered, as well.

关键词： Transistors Fuzzy logic Signal generators Delays simulation Monte Carlo methods Power demand"

来源：评论

学校读者我要写书评

暂无评论

没有更多数据了...

全选清除本页清除全部题录导出标记到“检索档案”

共142页 << < 31 32 33 34 35 36 37 38 39 40 > >>

检索报告对象比较合并检索0

隐藏清空

合并搜索

回到顶部

执行限定条件

内容：

评分：

请选择保存的检索档案：

请选择收藏分类：

订阅名称：

通借通还

温馨提示：

图书名称：

借书校区：

取书校区：

手机号码：

邮箱地址：

一卡通帐号：

电话和邮箱必须正确填写，我们会与您联系确认。

联系人：

所在院系：

联系邮箱：

联系电话：

内蒙古自治区呼和浩特市赛罕区大学西街235号邮编: 010021

建议与咨询 留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

请选择保存的检索档案： 新增检索档案 确定 取消

请选择收藏分类： 新增自定义分类 确定 取消

通借通还

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

请选择保存的检索档案：

请选择收藏分类：