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38 篇 会议

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检索条件"任意字段=Conference on Optical Manufacturing and Testing XIV Part of SPIE Optics and Photonics Conference"

共 38 条记录，以下是1-10 订阅

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Absolute Characterization of Gravity Sag for Light-Weighted optics 14

Absolute Characterization of Gravity Sag for Light-Weighted ...

引用

conference on optical manufacturing and testing xiv part of spie optics and photonics conference

作者： Lis, Tomasz Cheney, Stephen Stahl, H. Philip Nasa Marshall Space Flight Ctr Huntsville AL 35812 USA

ISBN: (纸本)9781510654273;9781510654266

Gravity-sag (G-sag) for large space-based telescopes is a critical error budget element that must be taken in consideration. Absolute characterization of gravity sag provides necessary information when testing light weighted optics so that true optical performance can be determined. A method is presented for characterizing G-sag to obtain the 0-G optical surface.

关键词： wavefront error gravity sag space telescopes light-weighted mirror optical test

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Using ISO Environmental Standards in an ISO 10110 Format Drawing 14

Using ISO Environmental Standards in an ISO 10110 Format Dra...

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conference on optical manufacturing and testing xiv part of spie optics and photonics conference

作者： Herman, Eric Aikens, David M. Synopsys Inc 199 S Robles Ave Pasadena CA 91101 USA Savvy Optic Corp 35 Gilbert Hill Rd Chester CT 06412 USA

ISBN: (纸本)9781510654273;9781510654266

The International drawing standard, ISO 10110, is gaining momentum globally, enabling a broader accessibility between designers and fabricators. Additional ISO standards for optics and photonics are available for requirements beyond the basic notation used for specifying optical element properties and dimensions. For example, a designer will also want to specify environmental conditions for optical coatings or conditions for the entire optical system. The notation used for these requirements are not included in the ISO 10110 series, but they follow a similar coded notation. Specifying these tests may be an additional advantage for many companies in the United States who wish to utilize ISO 10110 for their drawings. Understanding how to specify these tests allows a smooth transition in moving from drawings typically specified in the classic ASME/ANSI Y14.18M standard to a single international standard system.

关键词： optical design and fabrication optical engineering optical standards and testing drawings

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Reconstruction of optical wavefronts with parallel registration algorithms 14

Reconstruction of optical wavefronts with parallel registrat...

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conference on optical manufacturing and testing xiv part of spie optics and photonics conference

作者： Berlakovich, Nikolaus Fuerst, Martin Csencsics, Ernst Schitter, Georg TU Wien Automat & Control Inst ACIN Christian Doppler Lab Precis Engn Automate InLin A-1040 Vienna Austria

ISBN: (纸本)9781510654273;9781510654266

This paper presents an evaluation of three developed parallel registration algorithms for the reconstruction of optical wavefronts. Two practical use cases are considered including high-quality optics generating (i) a plane and (ii) a divergent wavefront. The wavefronts are measured segment-by-segment with a scanning Shack-Hartmann sensor measurement system and are reconstructed by the algorithms. As a benchmark for the comparison of the registration performance, the well-established iterative closest point (ICP) algorithm is used. Results show that the developed registration algorithms attain a registration precision up to a factor of 10 better than the registration precision of the ICP algorithm.

关键词： Algorithms optical Metrology Wavefronts testing

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Scanning Shack-Hartmann sensor for wavefront measurements on freeform optics 14

Scanning Shack-Hartmann sensor for wavefront measurements on...

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conference on optical manufacturing and testing xiv part of spie optics and photonics conference

作者： Fuerst, Martin Berlakovich, Nikolaus Csencsics, Ernst Schitter, Georg TU Wien Automat & Control Inst ACIN Gusshausstr 27-29 Vienna Austria

ISBN: (纸本)9781510654273;9781510654266

The Shack-Hartmann wavefront sensor has the potential to directly characterize the optical performance of a freeform part by measuring the wavefront transmitted or reflected by the part. However, the traditional Shack-Hartmann sensor's small dynamic range and aperture limit its applicability on strongly curved or extended freeform parts. The combination of a Shack-Hartmann sensor with a highly precise positioning system and a suitable registration algorithm can overcome these limitations. This paper presents an integrated and fully automated measurement system that is based on a scanning Shack-Hartmann sensor, demonstrates the enabled dynamic range extension, and presents measurement results obtained from a microscope objective with a numerical aperture of 0.65. The results show the capability of measuring a wavefront with an opening angle of +/- 80 degrees and detecting an rms wavefront error of 0.28 lambda.

关键词： optical metrology wavefront sensing mechatronics Shack-Hartmann sensor

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Measurement of non-uniform AR-coated surfaces using an optical coordinate measurement machine with coating effect error compensation 14

Measurement of non-uniform AR-coated surfaces using an optic...

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conference on optical manufacturing and testing xiv part of spie optics and photonics conference

作者： Henselmans, R. Gouwerok, M. J. Van den Eijkel, G. C. Dutch United Instruments Kleveringweg 4 NL-2616 LZ Delft Netherlands

ISBN: (纸本)9781510654273;9781510654266

Measurement of surface form after coating application is a vital final quality control step, but generally difficult using non-contact optical methods as the signal is distorted or drastically reduced by the coating. The NMF non-contact measurement machine range for freeform optics by Dutch United Instruments (DUI) can be employed for measurements during the entire production process. It can measure ground, polished and coated surfaces. Especially non-uniform coated surfaces may however distort the signal of the probe. A correction technique is described that allows for correcting this influence, enabling accurate non-contact form measurement after application of the coating.

关键词： Freeform metrology coating off-axis non-contact mid-spatial frequencies

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Type 2 longitudinal chromatic aberration from a high-harmonic MODE lens and color corrector 14

Type 2 longitudinal chromatic aberration from a high-harmoni...

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conference on optical manufacturing and testing xiv part of spie optics and photonics conference

作者： Milster, Thomas D. Kim, Youngsik Wang, Zichan Wyant Coll Optic Sci 1630 East Univ Blvd Tucson AZ 85721 USA

ISBN: (纸本)9781510654273;9781510654266

The longitudinal chromatic aberration (LCA) specific to a high-harmonic multi order diffractive engineered (MODE) lens designed for the astronomical R band (589nm to 727nm) is described and demonstrated. This Type 2 LCA is characterized by rapid changes of focal position versus wavelength over a focal range of f(0)/M, where f(0) is the design focal length at 658nm and M=2196 is the harmonic order. Type 2 LCA effects on image performance and correction methods are also discussed and demonstrated.

关键词： Diffractive optical element high-harmonic lens focal dispersion color correction

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Fabrication, Assembly, and testing of a MODE Lens Color Corrector 14

Fabrication, Assembly, and Testing of a MODE Lens Color Corr...

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conference on optical manufacturing and testing xiv part of spie optics and photonics conference

作者： Wang, Zichan Kim, Youngsik Yi, Allen Choi, Hwanjin Kim, Geonhee Milster, Tom D. Wyant Coll Optic Sci 1630 East Univ Blvd Tucson AZ 85721 USA Ohio State Univ Columbus OH USA Korea Basic Sci Inst Daejeon South Korea Hanbat Natl Univ Daejeon South Korea

ISBN: (纸本)9781510654273;9781510654266

The color corrector (CC) system serves as an essential part of the multi-order diffractive engineered (MODE) lens system to provide near diffraction limited performance by correcting residual refractive and diffractive dispersion of MODE primary over the astronomical R-band (589 nm to 727 nm). The CC is designed to collimate and refocus the image from the MODE primary as a unit magnification relay and corrects chromatic aberrations at the same time. As a result, the system including the optomechanics of the CC is specifically designed for compensating errors from both the MODE primary and the CC. Results regarding prototyping, assembly and testing of the color corrector are reported.

关键词： Diffractive optical element color correction error compensation optomechanics

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Stray light analysis and testing of a MODE lens telescope 14

Stray light analysis and testing of a MODE lens telescope

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conference on optical manufacturing and testing xiv part of spie optics and photonics conference

作者： Kim, Youngsik Esparza, Marcos Wang, Zichan Brar, Nicholas Choi, Heejoo Kim, Daewook Apai, Daniel Milster, Tom D. Wyant Coll Optic Sci 1630 E Univ Blvd Tucson AZ 85721 USA Dept Astron & Planetary Sci 933 N Cherry Ave Tucson AZ 85721 USA

ISBN: (纸本)9781510654273;9781510654266

The stray light analysis and testing of multiple-order-diffraction engineered (MODE) lens telescope is an essential step in the evaluation of optical imaging performance of the telescope. The MODE primary lens has a multi-order diffractive (MOD) front surface and single-order (M = 1) diffractive Fresnel lens (DFL) rear surface. Both of MOD and DFL surfaces have four transitions between five annular zones. Stray light can be minimized to prevent unwanted photons from reaching the science instrument detectors. Stray light is evaluated on an optical testbed to test the polychromatic performance with a supercontinuum laser.

关键词： Diffractive optical element stray light focal dispersion polychromatic performance

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Prototyping, replication and metrology of freeform optical (micro-)components 14

Prototyping, replication and metrology of freeform optical (...

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conference on optical manufacturing and testing xiv part of spie optics and photonics conference

作者： Van Erps, Jurgen Vervaekea, Michael Ottevaerea, Heidi Thienponta, Hugo Vrije Univ Brussel & Flanders Make Brussels Photon B PHOT Pleinlaan 2 B-1050 Brussels Belgium

ISBN: (纸本)9781510654273;9781510654266

We present our technology supply chain for the prototyping, replication and metrology of freeform (micro -)optics. We show through recent examples how this technology supply chain is a key-enabler for frontier applied research and demonstrate how it paves the way towards efficient technology take-up and effective industrial innovation.

关键词： ultraprecision diamond tooling micro-injection moulding hot embossing ultraprecision polishing laser-based manufacturing freeform optics micro-optics metrology

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Initial testing of a MODE lens telescope 14

Initial testing of a MODE lens telescope

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conference on optical manufacturing and testing xiv part of spie optics and photonics conference

作者： Kim, Youngsik Esparza, Marcos Wang, Zichan Brar, Nicholas Zhang, Yingying Kim, Daewook Choi, Heejoo Apai, Daniel Fellows, Chuck Yi, Allen Cai, Yuxin Kim, Geonhee Choi, Hwanjin Yeo, Woojong Milster, Tom D. Wyant Coll Optic Sci 1630 E Univ Blvd Tucson AZ 85721 USA Dept Astron & Planetary Sci 933 N Cherry Ave Tucson AZ 85721 USA Ohio State Univ Dept Integrated Syst Engn 1971 Neil Ave Columbus OH 43210 USA Hanbat Natl Univ 125 Dongseo daero Daejeon South Korea Korea Basic Sci Inst 169 148 Gwahak ro Daejeon South Korea

ISBN: (纸本)9781510654273;9781510654266

The initial testing of prototype multiple-order-diffraction engineered (MODE) lens telescope is essential process before the sky test to evaluate the optical imaging performance of a space object. Prototype MODE lens telescope consists of MODE primary lens which is a core component to correct secondary spectrum, a field lens and a double Gauss type color corrector and achieves a diffraction limited performance. The performance is tested on the diffraction efficiency with respect to supercontinuum laser wavelength on an optical testbed and evaluated on the polychromatic performance for prototype molded ring segment.

关键词： Transmission telescope lens diffractive optical element secondary spectrum polychromatic performance

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